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1دورية أكاديمية
المصدر: Jurnal Elektronika dan Otomasi Industri; Vol. 10 No. 2 (2023): Jurnal Elkolind Vol. 10 No.2 (Juli 2023); 253-263 ; 2356-0533 ; 2355-9195
وصف الملف: application/pdf
العلاقة: https://jurnal.polinema.ac.id/index.php/elkolind/article/view/3720/2680Test; https://jurnal.polinema.ac.id/index.php/elkolind/article/view/3720Test
الإتاحة: https://doi.org/10.33795/elkolind.v10i2.3720Test
https://jurnal.polinema.ac.id/index.php/elkolind/article/view/3720Test -
2دورية أكاديمية
المؤلفون: Peña-Fernández, Manuel, Serrano-Cases, Alejandro, Lindoso, Almudena, Cuenca-Asensi, Sergio, Entrena, Luis, Morilla, Yolanda, Martín-Holgado, Pedro, Martínez-Álvarez, Antonio
المساهمون: Universidad de Alicante. Departamento de Tecnología Informática y Computación, UniCAD: Grupo de investigación en CAD/CAM/CAE de la Universidad de Alicante
مصطلحات موضوعية: Soft errors, Proton irradiation, Dualcore, Lockstep, Multithreading, Fault tolerance, Arquitectura y Tecnología de Computadores
العلاقة: https://doi.org/10.1109/TNS.2022.3149867Test; info:eu-repo/grantAgreement/AEI/Plan Estatal de Investigación Científica y Técnica y de Innovación 2017-2020/PID2019-106455GB-C22; info:eu-repo/grantAgreement/AEI/Plan Estatal de Investigación Científica y Técnica y de Innovación 2017-2020/PID2019-106455GB-C21; IEEE Transactions on Nuclear Science. 2022, 69(7): 1574-1581. https://doi.org/10.1109/TNS.2022.3149867Test; 0018-9499 (Print); 1558-1578 (Online); http://hdl.handle.net/10045/121845Test
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3
المؤلفون: ALMUDENA LINDOSO, Alejandro Serrano Cases, Antonio Martínez-Álvarez, Sergio Cuenca-Asensi, Luis Entrena, Yolanda Morilla, M. Peña-Fernandez, PEDRO MARTÍN-HOLGADO
المساهمون: Universidad de Alicante. Departamento de Tecnología Informática y Computación, UniCAD: Grupo de investigación en CAD/CAM/CAE de la Universidad de Alicante, Ministerio de Ciencia, Innovación y Universidades (España), Agencia Estatal de Investigación (España), Comunidad de Madrid
المصدر: IEEE Transactions on Nuclear Science. 69:1574-1581
مصطلحات موضوعية: Nuclear and High Energy Physics, Nuclear Energy and Engineering, Proton irradiation, Dualcore, Soft errors, Multithreading, Lockstep, Fault tolerance, Electrical and Electronic Engineering, Arquitectura y Tecnología de Computadores
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::87c446ecd820c4110e523ede63849f13Test
https://doi.org/10.1109/tns.2022.3149867Test -
4
المؤلفون: Ertaş, Osman Gökhan
المساهمون: Babaarslan, Osman, Tekstil Mühendisliği Anabilim Dalı, Babaaslan, Osman, Çukurova Üniversitesi, Fen Bilimleri Enstitüsü, Tekstil Mühendisliği Anabilim Dalı
مصطلحات موضوعية: dualcore, Tekstil ve Tekstil Mühendisliği, Multicomponent yarn, Textile and Textile Engineering, elastikiyet, growth, kalıcı uzama, elasticity, stretch denim kumaş, iplik tasarımı, Multicomponent iplik, stretch denim fabric
وصف الملف: application/pdf
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::c73f3fe1cb4cfda08347806f36d3f214Test
https://acikbilim.yok.gov.tr/handle/20.500.12812/124933Test -
5رسالة جامعية
المؤلفون: Ertaş, Osman Gökhan
المساهمون: Babaaslan, Osman, Çukurova Üniversitesi, Fen Bilimleri Enstitüsü, Tekstil Mühendisliği Anabilim Dalı
مصطلحات موضوعية: Multicomponent iplik, iplik tasarımı, stretch denim kumaş, elastikiyet, kalıcı uzama, Multicomponent yarn, elasticity, stretch denim fabric, growth, dualcore
العلاقة: Tez; Ertaş, Osman Gökhan. (2019). Multicomponent core-spun (Dualcore) iplik yapı ve özelliklerinin denim kumaş performansı üzerindeki etkisi . (Yayınlanmamış yüksek lisans tezi). Çukurova Üniversitesi, Fen Bilimleri Enstitüsü, Tekstil Mühendisliği Anabilim Dalı , Adana; http://library.cu.edu.tr/tezler/12353.pdfTest; https://hdl.handle.net/20.500.12605/37711Test
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6دورية أكاديمية
مصطلحات موضوعية: CMOS integrated circuits, LC circuits, MMIC oscillators, field effect MMIC, network analysis, network synthesis, phase noise, RF oscillator, current 39 mA to 59 mA, digital CMOS technology, dualcore LC-tank oscillator, frequency 4.07 GHz to 4.91 GHz, high swing class-C topology, multicore oscillator, phase noise reduction, ultralow phase noise, voltage 2.15 V, Inductance, Inductors, Power demand, Topology, Basestation (BTS), LC-tank, class-C oscillator, coupled oscillators, figure of merit (FoM)
العلاقة: http://resolver.tudelft.nl/uuid:4b221838-d7df-453b-9a91-1772f5989287Test; IEEE Transactions on Circuits and Systems Part 1: Regular Papers--1549-8328--b4d6e34f-0f13-4dac-a6fe-f1a6d8888589; https://doi.org/10.1109/TCSI.2016.2529218Test
الإتاحة: https://doi.org/10.1109/TCSI.2016.2529218Test
http://resolver.tudelft.nl/uuid:4b221838-d7df-453b-9a91-1772f5989287Test -
7مؤتمر
المؤلفون: Terboven, Christian, an Mey, Dieter, Sarholz, Samuel
المصدر: Berlin [u.a.] : Springer, Lecture Notes in Computer Science 4935, 54-64 (2008). doi:10.1007/978-3-540-69303-1_5 ; A practical programming model for multi-core era : International workshop on OpenMP, IWOMP 2007, Beijing, China, June 3-7, 2007 ; proceedings / Barbara Chapman . (eds.) ; proceedings / Barbara Chapman . (eds.) A practical programming model for multi-core era : International workshop on OpenMP, IWOMP 2007, Beijing, Peoples R China, 2007-06-03 - 2007-06-07
مصطلحات موضوعية: OpenMP, SMP systems, application program interfaces, cache architecture, cache storage, dualcore processors, kernel programs, memory architecture, microprocessor chips, multi-threading, multicore architectures, operating system kernels, quadcore processors, shared memory machines
جغرافية الموضوع: DE
العلاقة: info:eu-repo/semantics/altIdentifier/isbn/978-3-540-69302-4; info:eu-repo/semantics/altIdentifier/wos/WOS:000257088300005; info:eu-repo/semantics/altIdentifier/issn/1611-3349; info:eu-repo/semantics/altIdentifier/isbn/978-3-540-69303-1; info:eu-repo/semantics/altIdentifier/issn/0302-9743; https://publications.rwth-aachen.de/record/119482Test; https://publications.rwth-aachen.de/search?p=id:%22RWTH-CONV-190608%22Test
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8دورية
المصدر: Electronics Weekly. 3/8/2006, Issue 2231, p36-36. 1/3p. 1 Color Photograph.
مصطلحات موضوعية: *INDUSTRIAL equipment, *NEW product development, *ELECTRONIC industries, ELECTRONIC controllers
الشركة/الكيان: DUALCORE Semiconductor GmbH
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9مورد إلكتروني
مصطلحات الفهرس: Soft errors, Proton irradiation, Dualcore, Lockstep, Multithreading, Fault tolerance, info:eu-repo/semantics/article
URL:
http://hdl.handle.net/10045/121845Test https://doi.org/10.1109/TNS.2022.3149867Test https://doi.org/10.1109/TNS.2022.3149867Test
info:eu-repo/grantAgreement/AEI/Plan Estatal de Investigación Científica y Técnica y de Innovación 2017-2020/PID2019-106455GB-C22
info:eu-repo/grantAgreement/AEI/Plan Estatal de Investigación Científica y Técnica y de Innovación 2017-2020/PID2019-106455GB-C21 -
10مورد إلكتروني
مصطلحات الفهرس: Soft errors, Proton irradiation, Dualcore, Lockstep, Multithreading, Fault tolerance, info:eu-repo/semantics/article
URL:
http://hdl.handle.net/10045/121845Test https://doi.org/10.1109/TNS.2022.3149867Test https://doi.org/10.1109/TNS.2022.3149867Test
info:eu-repo/grantAgreement/AEI/Plan Estatal de Investigación Científica y Técnica y de Innovación 2017-2020/PID2019-106455GB-C22
info:eu-repo/grantAgreement/AEI/Plan Estatal de Investigación Científica y Técnica y de Innovación 2017-2020/PID2019-106455GB-C21