المؤلفون: Fontanini, R., Segatto, M., Nair, K. S., Holzer, M., Driussi, F., Häusler, I., Koch, C. T., Dubourdieu, C., Deshpande, V., Esseni, D.

مصطلحات موضوعية: Physics - Applied Physics, Condensed Matter - Materials Science

الوصول الحر: http://arxiv.org/abs/2309.01486Test

المؤلفون: Massarotto, M., Segatto, M., Driussi, F., Affanni, A., Lancaster, S., Slesazeck, S., Mikolajick, T., Esseni, D.

المساهمون: Massarotto, M., Segatto, M., Driussi, F., Affanni, A., Lancaster, S., Slesazeck, S., Mikolajick, T., Esseni, D.

مصطلحات موضوعية: Ferroelectric, Hafnium Zirconium Oxide (HZO), Ferroelectric Tunnel Junction (FTJ), Experimental Characterization, Small Signal Analysis, Polarization Switching

وصف الملف: ELETTRONICO

العلاقة: info:eu-repo/semantics/altIdentifier/isbn/979-8-3503-4653-4; ispartofbook:2023 35th International Conference on Microelectronic Test Structure (ICMTS); 2023 35th International Conference on Microelectronic Test Structure (ICMTS); firstpage:1; lastpage:6; numberofpages:6; info:eu-repo/grantAgreement/EC/H2020/871737; https://hdl.handle.net/11390/1246624Test; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85153569689

الإتاحة: https://doi.org/10.1109/ICMTS55420.2023.10094178Test
https://hdl.handle.net/11390/1246624Test

المؤلفون: Lizzit D., Khakbaz P., Driussi F., Pala M., Esseni D.

المساهمون: Lizzit, D., Khakbaz, P., Driussi, F., Pala, M., Esseni, D.

مصطلحات موضوعية: buffer layer, contact resistance, quantum transport, Schottky barrier, tunneling barrier

وصف الملف: ELETTRONICO

العلاقة: info:eu-repo/semantics/altIdentifier/wos/WOS:000967261100001; volume:6; issue:7; firstpage:5737; lastpage:5746; numberofpages:10; journal:ACS APPLIED NANO MATERIALS; https://hdl.handle.net/11390/1246325Test; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85151847211

الإتاحة: https://doi.org/10.1021/acsanm.3c00166Test
https://hdl.handle.net/11390/1246325Test

المؤلفون: Massarotto M., Driussi F., Affanni A., Lancaster S., Slesazeck S., Mikolajick T., Esseni D.

المساهمون: Massarotto, M., Driussi, F., Affanni, A., Lancaster, S., Slesazeck, S., Mikolajick, T., Esseni, D.

مصطلحات موضوعية: Experimental characterization, Ferroelectric, Ferroelectric Tunnel Junction (FTJ), Hafnium Zirconium Oxide (HZO), Polarization switching, Small signal capacitance

وصف الملف: ELETTRONICO

العلاقة: volume:200; firstpage:108569; numberofpages:8; journal:SOLID-STATE ELECTRONICS; info:eu-repo/grantAgreement/EC/H2020/871737; https://hdl.handle.net/11390/1239285Test; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85144814234

الإتاحة: https://doi.org/10.1016/j.sse.2022.108569Test
https://hdl.handle.net/11390/1239285Test

المؤلفون: Segatto, M., Massarotto, M., Lancaster, S., Duong, Q. T., Affanni, A., Fontanini, R., Driussi, F., Lizzit, D., Mikolajick, T., Slesazeck, S., Esseni, D.

المساهمون: Segatto, M., Massarotto, M., Lancaster, S., Duong, Q. T., Affanni, A., Fontanini, R., Driussi, F., Lizzit, D., Mikolajick, T., Slesazeck, S., Esseni, D.

وصف الملف: ELETTRONICO

العلاقة: info:eu-repo/semantics/altIdentifier/isbn/978-1-6654-8497-8; info:eu-repo/semantics/altIdentifier/wos/WOS:000904209900032; ispartofbook:ESSDERC 2022 - IEEE 52nd European Solid-State Device Research Conference (ESSDERC); IEEE 52nd European Solid-State Device Research Conference (ESSDERC); firstpage:340; lastpage:343; numberofpages:4; info:eu-repo/grantAgreement/EC/H2020/871737; https://hdl.handle.net/11390/1237213Test; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85142713916

الإتاحة: https://doi.org/10.1109/ESSDERC55479.2022.9947185Test
https://hdl.handle.net/11390/1237213Test

المؤلفون: Khakbaz, P., Driussi, F., Giannozzi, P., Gambi, A., Lizzit, D., Esseni, D.

المساهمون: Khakbaz, P., Driussi, F., Giannozzi, P., Gambi, A., Lizzit, D., Esseni, D.

مصطلحات موضوعية: MoS2, 2D materials, Density functional theory, Contacts, Buffer Layer, Fermi level pinning, Schottky barrier height

وصف الملف: ELETTRONICO

العلاقة: info:eu-repo/semantics/altIdentifier/wos/WOS:000800388900009; volume:194; firstpage:108378; numberofpages:7; journal:SOLID-STATE ELECTRONICS; info:eu-repo/grantAgreement/EC/H2020/824143; http://hdl.handle.net/11390/1224870Test; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85129564500

الإتاحة: https://doi.org/10.1016/j.sse.2022.108378Test
http://hdl.handle.net/11390/1224870Test

المؤلفون: Pilotto, A., Antonelli, M., Arfelli, F., Biasiol, G., Cautero, G., Cautero, M., Colja, M., Driussi, F., Esseni, D., Menk, R. H., Nichetti, C., Rosset, F., Selmi, L., Steinhartova, T., Palestri, P.

المساهمون: Pilotto, A., Antonelli, M., Arfelli, F., Biasiol, G., Cautero, G., Cautero, M., Colja, M., Driussi, F., Esseni, D., Menk, R. H., Nichetti, C., Rosset, F., Selmi, L., Steinhartova, T., Palestri, P.

مصطلحات موضوعية: avalanche photodiodes, X-rays, modeling, Monte Carlo method, noise

وصف الملف: ELETTRONICO

العلاقة: info:eu-repo/semantics/altIdentifier/wos/WOS:000854954100001; volume:10; firstpage:944206; numberofpages:13; journal:FRONTIERS IN PHYSICS; https://hdl.handle.net/11390/1231124Test; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85138171161; https://www.frontiersin.org/articles/10.3389/fphy.2022.944206/full?&utm_source=Email_to_authors_&utm_medium=Email&utm_content=T1_11.5e1_author&utm_campaign=Email_publication&field=&journalName=Frontiers_in_Physics&id=944206Test

الإتاحة: https://doi.org/10.3389/fphy.2022.944206Test
https://hdl.handle.net/11390/1231124Test

المؤلفون: Fontanini R., Barbot J., Segatto M., Lancaster S., Duong Q., Driussi F., Grenouillet L., Triozon L., Coignus J., Mikolajick T., Slesazeck S., Esseni D.

المساهمون: Fontanini, R., Barbot, J., Segatto, M., Lancaster, S., Duong, Q., Driussi, F., Grenouillet, L., Triozon, L., Coignus, J., Mikolajick, T., Slesazeck, S., Esseni, D.

مصطلحات موضوعية: Ferroelectric tunnel junction, FTJ, HZO, synaptic memristor, charge trapping, interfacial charge, polarization switching, neuromoprhic computing, artificial intelligence.

العلاقة: info:eu-repo/semantics/altIdentifier/wos/WOS:000836630300005; volume:10; firstpage:593; lastpage:599; numberofpages:7; journal:IEEE JOURNAL OF THE ELECTRON DEVICES SOCIETY; info:eu-repo/grantAgreement/EC/H2020/871737; https://hdl.handle.net/11390/1229766Test; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85129606970

الإتاحة: https://doi.org/10.1109/JEDS.2022.3171217Test
https://hdl.handle.net/11390/1229766Test

المؤلفون: Segatto M., Fontanini R., Driussi F., Lizzit D., Esseni D.

المساهمون: Segatto, M., Fontanini, R., Driussi, F., Lizzit, D., Esseni, D.

مصطلحات موضوعية: HZO, ferroelectric, MFDM, dielectric, PUND, depolarization

العلاقة: info:eu-repo/semantics/altIdentifier/wos/WOS:000784185600003; volume:10; firstpage:324; lastpage:333; numberofpages:10; journal:IEEE JOURNAL OF THE ELECTRON DEVICES SOCIETY; info:eu-repo/grantAgreement/EC/H2020/871737; http://hdl.handle.net/11390/1229764Test; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85128280526

الإتاحة: https://doi.org/10.1109/JEDS.2022.3164652Test
http://hdl.handle.net/11390/1229764Test

المؤلفون: Colja, M, Cautero, M, Menk, RH, Palestri, P, Gianoncelli, A, Antonelli, M, Biasiol, G, Zilio, SD, Steinhartova, T, Nichetti, C, Arfelli, F, De Angelis, D, Driussi, F, Bonanni, V, Pilotto, A, Gariani, G, Carrato, S, Cautero, G

المساهمون: Colja, M, Cautero, M, Menk, Rh, Palestri, P, Gianoncelli, A, Antonelli, M, Biasiol, G, Zilio, Sd, Steinhartova, T, Nichetti, C, Arfelli, F, De Angelis, D, Driussi, F, Bonanni, V, Pilotto, A, Gariani, G, Carrato, S, Cautero, G

مصطلحات موضوعية: Solid state detector, X-ray detector, Detector modelling and simulations II (electric fields,charge transport,multiplication and induction,pulse formation,electron emission,etc)

وصف الملف: ELETTRONICO

العلاقة: info:eu-repo/semantics/altIdentifier/wos/WOS:000933385700003; volume:17; issue:12; firstpage:"-"; lastpage:"-"; numberofpages:8; journal:JOURNAL OF INSTRUMENTATION; https://hdl.handle.net/11368/3053061Test; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85151064330; https://iopscience.iop.org/article/10.1088/1748-0221/17/12/C12020Test

الإتاحة: https://doi.org/10.1088/1748-0221/17/12/C12020Test
https://hdl.handle.net/11368/3053061Test