المؤلفون: Kvon, Z. D., Baturina, T. I., Donaton, R. A., Baklanov, M. R., Maex, K., Olshanetsky, E. B., Plotnikov, A. E., Portal, J. C.

المصدر: Phys. Rev. B 61, 11340 (2000)

مصطلحات موضوعية: Condensed Matter - Superconductivity, Condensed Matter - Mesoscale and Nanoscale Physics

الوصول الحر: http://arxiv.org/abs/cond-mat/9907247Test

المؤلفون: Hens, S, Bender, H, Donaton, R A, Maex, K, Vanhaelemeersch, S, Van Landuyt, J

المصدر: Microscopy of Semiconducting Materials 2001 ; page 415-418 ; ISBN 9781351074629

الإتاحة: https://doi.org/10.1201/9781351074629-88Test

المؤلفون: Krishnan, S., Kwon, U., Moumen, N., Stoker, M.W., Harley, E.C.T., Bedell, S., Nair, D., Greene, B., Henson, W., Chowdhury, M., Prakash, D.P., Wu, E., Ioannou, D., Cartier, E., Na, M.-H., Inumiya, S., Mcstay, K., Edge, L., Iijima, R., Cai, J., Frank, M., Hargrove, M., Guo, D., Kerber, A., Jagannathan, H., Ando, T., Shepard, J., Siddiqui, S., Dai, M., Bu, H., Schaeffer, J., Jaeger, D., Barla, K., Wallner, T., Uchimura, S., Lee, Y., Karve, G., Zafar, S., Schepis, D., Wang, Y., Donaton, R., Saroop, S., Montanini, P., Liang, Y., Stathis, J., Carter, R., Pal, R., Paruchuri, V., Yamasaki, H., Lee, J-H.

المصدر: 2011 International Electron Devices Meeting

الإتاحة: https://doi.org/10.1109/iedm.2011.6131628Test
http://xplorestaging.ieee.org/ielx5/6123666/6131464/06131628.pdf?arnumber=6131628Test

المؤلفون: Hamaguchi, M., Nair, D., Jaeger, D., Nishimura, H., Li, W., Na, M-H., Bernicot, C., Liang, J., Stahrenberg, K., Kim, K., Eller, M., Lee, K-C., Iwamoto, T., Teh, Y-W., Mori, S., Takasu, Y., Park, JH, Song, L., Kim, N-S., Kohler, S., Kothari, H., Han, J-P., Miyake, S., Meer, H.V., Arnaud, F., Barla, K., Sherony, M., Donaton, R., Celik, M., Miyashita, K., Narayanan, V., Wachnik, R., Chudzik, M., Sudijono, J., Ku, J.-H., Kim, J.D., Sekine, M., Johnson, S., Neumueller, W., Sampson, R., Kaste, E., Divakaruni, R., Matsuoka, F.

المصدر: 2011 International Electron Devices Meeting

الإتاحة: https://doi.org/10.1109/iedm.2011.6131614Test
http://xplorestaging.ieee.org/ielx5/6123666/6131464/06131614.pdf?arnumber=6131614Test

المؤلفون: Henson, K., Bu, H., Na, M. H., Liang, Y., Kwon, U., Krishnan, S., Schaeffer, J., Jha, R., Moumen, N., Carter, R., DeWan, C., Donaton, R., Guo, D., Hargrove, M., He, W., Mo, R., Ramachandran, R., Ramani, K., Schonenberg, K., Tsang, Y., Wang, X., Gribelyuk, M., Yan, W., Shepard, J., Cartier, E., Frank, M., Harley, E., Arndt, R., Knarr, R., Bailey, T., Zhang, B., Wong, K., Graves-Abe, T., Luckowski, E., Park, D-G., Narayanan, V., Chudzik, M., Khare, M.

المصدر: 2008 IEEE International Electron Devices Meeting

الإتاحة: https://doi.org/10.1109/iedm.2008.4796774Test
http://xplorestaging.ieee.org/ielx5/4786613/4796592/04796774.pdf?arnumber=4796774Test

المؤلفون: Jenei, Snezana, Decoutere, Stefaan, Winderickx, Gillis, Struyf, Herbert, Tokei, Zsolt, Vervoort, Iwan, Vos, Ingrid, Jaenen, Patrick, Carbonell, Laure, De Jaeger, Brice, Donaton, R. A, Vanhaelemeersch, Serge, Maex, Karen, Nauwelaers, Bart

العلاقة: 2001 IEEE International Interconnect Technology Conference pages:107-109; IEEE International Interconnect Technology Conference location:San Francisco, CA, USA date:4-6 June 2001; https://lirias.kuleuven.be/handle/123456789/57841Test

الإتاحة: https://lirias.kuleuven.be/handle/123456789/57841Test

المؤلفون: Hens, S, Bender, Hugo, Donaton, R. A, Maex, Karen, Vanhaelemeersch, Serge, Van Landuyt, J

العلاقة: pages:415-418; Microscopy of Semiconducting Materials - MSMXII location:Antwerpen Belgium date:25/03/01; https://lirias.kuleuven.be/handle/123456789/67440Test

الإتاحة: https://lirias.kuleuven.be/handle/123456789/67440Test

المؤلفون: Donaton, R. A, Struyf, Herbert, Lepage, Muriel, Coenegrachts, Bart, Stucchi, Michele, De Roest, David, Baklanov, Mikhaïl, Vanhaelemeersch, Serge, Maex, Karen, Gaillard, F, Xia, L. Q, Lim, T. H, Gotuaco, M, Yieh, E, Van Autryve, Luc

العلاقة: Advanced Metallization Conference 2000 (AMC 2000) pages:595-601; Advanced Metallization Conference location:San Diego, CA, USA date:October 2000; https://lirias.kuleuven.be/handle/123456789/68776Test; 1-55899-574-9

الإتاحة: https://lirias.kuleuven.be/handle/123456789/68776Test

المؤلفون: Iacopi, Francesca, Donaton, R, Coenegrachts, Bart, Komiya, Takayuki, Struyf, Herbert, Lepage, Muriel, Van Aelst, Joke, Boullart, Werner, De Roest, David, Vis, I, Baklanov, Mikhaïl, Vereecke, Guy, Van Hove, Marleen, Stucchi, Michele, Tokei, Zsolt, Meynen, Herman, Bremmer, J. N, Vanhaelemeersch, Serge, Maex, Karen

العلاقة: Advanced Metallization Conference 2000 (AMC 2000) pages:287-293; Advanced Metallization Conference (AMC) location:San Diego, CA, USA date:3-5 October 2000; https://lirias.kuleuven.be/handle/123456789/68456Test; 1-55899-574-9

الإتاحة: https://lirias.kuleuven.be/handle/123456789/68456Test

المؤلفون: Waeterloos, Joost, Shaffer, E, Stokich, T, Donaton, R. A, Maex, Karen

العلاقة: Advanced Metallization Conference location:San Diego, CA, USA date:October 2000; https://lirias.kuleuven.be/handle/123456789/67323Test

الإتاحة: https://lirias.kuleuven.be/handle/123456789/67323Test