المؤلفون: Divinyi, Andreas, Nilsson, Torbjörn M.J., Rorsman, Niklas, 1964, Kristensen, Tobias, 1998, Hultin, Harald, Gunnarsson, Sten, 1976, Thorsell, Mattias, 1982

المصدر: IEEE Transactions on Components, Packaging and Manufacturing Technology. 14(5):891-896

مصطلحات موضوعية: Resistors, Electro-thermal effects, MMIC, Semiconductor device packaging, Sensors, Monitoring, Temperature measurement, MODFETs, Temperature sensors, GaN, Thermal sensors, Sensor phenomena and characterization

الوصول الحر: https://research.chalmers.se/publication/540876Test

المؤلفون: Divinyi, Andreas, Rorsman, Niklas, 1964, Billström, Niklas, Thorsell, Mattias, 1982

المصدر: 18th European Microwave Integrated Circuits Conference, EuMIC 2023, Berlin, Germany 2023 18th European Microwave Integrated Circuits Conference, EuMIC 2023. :46-49

مصطلحات موضوعية: MMIC, hemt, Gallium nitride (GaN), switch

الوصول الحر: https://research.chalmers.se/publication/538867Test
https://research.chalmers.se/publication/538529Test

المؤلفون: Kristensen, Tobias, 1998, Divinyi, Andreas, Bremer, Johan, 1991, Nilsson, Torbjörn M.J., Thorsell, Mattias, 1982

المصدر: 18th European Microwave Integrated Circuits Conference, EuMIC 2023, Berlin, Germany 2023 18th European Microwave Integrated Circuits Conference, EuMIC 2023. :293-296

مصطلحات موضوعية: thermal time constants, thermal sensors, electrothermal device modelling, Gallium Nitride (GaN), thermal management

الوصول الحر: https://research.chalmers.se/publication/538532Test
https://research.chalmers.se/publication/538851Test

المؤلفون: Divinyi, Andreas

المساهمون: Chalmers tekniska högskola / Institutionen för mikroteknologi och nanovetenskap (MC2), Fager, Christian, Thorsell, Mattias, Hammar, Peter

وصف الملف: application/pdf

العلاقة: https://hdl.handle.net/20.500.12380/300980Test

الإتاحة: https://doi.org/20.500.12380/300980Test
https://hdl.handle.net/20.500.12380/300980Test