المؤلفون: Dufour, Pauline, Abdelsamie, Amr, Fischer, Johanna, Finco, Aurore, Haykal, Angela, Sarott, Martin, Varotto, Sara, Carrétéro, Cécile, Collin, Sophie, Godel, Florian, Jaouen, Nicolas, Viret, Michel, Trassin, Morgan, Bouzehouane, Karim, Jacques, Vincent, Chauleau, Jean-Yves, Fusil, Stéphane, Garcia, Vincent

المساهمون: Laboratoire Albert Fert (ex-UMPhy Unité mixte de physique CNRS/Thales), THALES France -Université Paris-Saclay-Centre National de la Recherche Scientifique (CNRS), Laboratoire Charles Coulomb (L2C), Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM), Eidgenössische Technische Hochschule - Swiss Federal Institute of Technology Zürich (ETH Zürich), Synchrotron SOLEIL (SSOLEIL), Centre National de la Recherche Scientifique (CNRS), Service de physique de l'état condensé (SPEC - UMR3680), Institut Rayonnement Matière de Saclay (DRF) (IRAMIS), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Université Paris-Saclay-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Université Paris-Saclay-Centre National de la Recherche Scientifique (CNRS), ANR-21-CE09-0033,TATOO,Contrôle des états topologiques dans les multiferroïques(2021), European Project: 964931,TSAR, European Project: 866267,EXAFONIS

المصدر: ISSN: 1530-6984.

مصطلحات موضوعية: multiferroic, antiferromagnetic, ferroelectric, anisotropic strain, critical thickness, BiFeO3, [PHYS.COND.CM-MS]Physics [physics]/Condensed Matter [cond-mat]/Materials Science [cond-mat.mtrl-sci]

العلاقة: info:eu-repo/grantAgreement//964931/EU/Topological Solitons in AntifeRroics/TSAR; info:eu-repo/grantAgreement//866267/EU/Exploring antiferromagnetic order at the nanoscale with a single spin microscope/EXAFONIS; hal-04237859; https://hal.science/hal-04237859Test; https://hal.science/hal-04237859/documentTest; https://hal.science/hal-04237859/file/Dufour_Nano_Letters_3.pdfTest

الإتاحة: https://doi.org/10.1021/acs.nanolett.3c02875Test
https://hal.science/hal-04237859Test
https://hal.science/hal-04237859/documentTest
https://hal.science/hal-04237859/file/Dufour_Nano_Letters_3.pdfTest

المؤلفون: Paola Prete, Daniele Calabriso, Emiliano Burresi, Leander Tapfer, Nico Lovergine

المصدر: Materials; Volume 16; Issue 12; Pages: 4254

مصطلحات موضوعية: GaAsP, III-V heterostructures, strain relaxation, critical thickness, metastable heterostructures, metalorganic vapor phase epitaxy, solid-vapor segregation coefficient, high-resolution X-ray diffraction, field emission scanning electron microscopy, III-V based solar cells

وصف الملف: application/pdf

العلاقة: https://dx.doi.org/10.3390/ma16124254Test

الإتاحة: https://doi.org/10.3390/ma16124254Test

المؤلفون: Hao-Yu Hsieh, Ping-Wei Liou, Shaobo Yang, Wei-Cheng Chen, Li-Ping Liang, Yueh-Chi Lee, Chih-Chung (C. C.) Yang

المصدر: Nanomaterials; Volume 13; Issue 10; Pages: 1617

مصطلحات موضوعية: GaN porous structure, strain relaxation, d-spacing crystal lattice analysis, strain-damping, critical thickness

وصف الملف: application/pdf

العلاقة: Nanoelectronics, Nanosensors and Devices; https://dx.doi.org/10.3390/nano13101617Test

الإتاحة: https://doi.org/10.3390/nano13101617Test

المؤلفون: Cheng Huijuan Liu, Giuseppe Lacidogna

المصدر: Applied Sciences; Volume 13; Issue 7; Pages: 4172

مصطلحات موضوعية: pressurized spherical shell, corrosion, non-destructive method, critical load, critical thickness, service life, NDT data

جغرافية الموضوع: agris

وصف الملف: application/pdf

العلاقة: Applied Physics; https://dx.doi.org/10.3390/app13074172Test

الإتاحة: https://doi.org/10.3390/app13074172Test

المؤلفون: Vogel, Alexander, id_orcid:0 000-0002-1938-3529, Ruiz Caridad, Alicia, Nordlander, Johanna, id_orcid:0 000-0002-9899-6795, Sarott, Martin F., id_orcid:0 000-0001-9660-6346, Meier, Quintin N., Erni, Rolf, id_orcid:0 000-0003-2391-5943, Spaldin, Nicola A., Trassin, Morgan, id_orcid:0 000-0002-0240-0257, Rossell, Marta D.

المصدر: ACS Applied Materials & Interfaces, 15 (14)

مصطلحات موضوعية: YMnO3, Improper ferroelectricity, Critical thickness, Interfaces, Oxygen vacancies, Transmission electron microscopy, Electron energy loss spectroscopy

وصف الملف: application/application/pdf

العلاقة: info:eu-repo/grantAgreement/SNF/Projekte MINT/188414; info:eu-repo/grantAgreement/EC/H2020/810451; http://hdl.handle.net/20.500.11850/606258Test

الإتاحة: https://doi.org/20.500.11850/606258Test
https://doi.org/10.3929/ethz-b-000606258Test
https://hdl.handle.net/20.500.11850/606258Test

المؤلفون: Prete P., Calabriso D., Burresi E., Tapfer L., Lovergine N.

المساهمون: Prete, P., Calabriso, D., Burresi, E., Tapfer, L., Lovergine, N.

مصطلحات موضوعية: critical thickness, field emission scanning electron microscopy, GaAsP, high-resolution X-ray diffraction, III-V based solar cells, III-V heterostructures, metalorganic vapor phase epitaxy, metastable heterostructures, solid-vapor segregation coefficient, strain relaxation

العلاقة: volume:16; issue:12; numberofpages:11; journal:MATERIALS; https://hdl.handle.net/20.500.12079/74789Test

الإتاحة: https://doi.org/20.500.12079/74789Test
https://doi.org/10.3390/ma16124254Test
https://hdl.handle.net/20.500.12079/74789Test

المساهمون: Noh, Tae [Institute for Basic Science (IBS), Seoul, (Republic of Korea); Seoul National Univ., Seoul (Republic of Korea)]

المصدر: Advanced Materials; 29; 19

وصف الملف: Medium: ED; Size: Article No. 1602795

الوصول الحر: http://www.osti.gov/scitech/servlets/purl/1377858Test

المؤلفون: Wang, Yan, Cao, Jiahe, Liao, Yimin, Zhang, Chuang, Xie, Zhigao, Song, Hanzhao, Xue, Jierui, Qu, Andeng, Wong, Yew Hoong, Mei, Zengxia, Tan, Chee Keong

مصطلحات موضوعية: Boron, Critical thickness, High electron mobility transistor, Nanometer-thick film, Piezoelectric, Polarization, Two-dimensional electron gas (2DEG), ϵ-Ga 2 O 3

العلاقة: http://repository.hkust.edu.hk/ir/Record/1783.1-137903Test; ACS Applied Nano Materials, v. 7, (8), April 2024, p. 9337-9344; https://doi.org/10.1021/acsanm.4c00717Test; http://lbdiscover.ust.hk/uresolver?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rfr_id=info:sid/HKUST:SPI&rft.genre=article&rft.issn=2574-0970&rft.volume=7&rft.issue=8&rft.date=2024&rft.spage=9337&rft.aulast=Wang&rft.aufirst=Yan&rft.atitle=Density+Functional+Theory+Study+of+Polarization-Induced+Electron+Confinement+by+Dilute+Boron+Alloying+in+%CF%B5-Ga2O3+Nanometer-Thick+Film+for+High+Electron+Mobility+Transistor&rft.title=ACS+Applied+Nano+MaterialsTest; http://www.scopus.com/record/display.url?eid=2-s2.0-85189963488&origin=inwardTest

الإتاحة: https://doi.org/10.1021/acsanm.4c00717Test
http://repository.hkust.edu.hk/ir/Record/1783.1-137903Test
http://lbdiscover.ust.hk/uresolver?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rfr_id=info:sid/HKUST:SPI&rft.genre=article&rft.issn=2574-0970&rft.volume=7&rft.issue=8&rft.date=2024&rft.spage=9337&rft.aulast=Wang&rft.aufirst=Yan&rft.atitle=Density+Functional+Theory+Study+of+Polarization-Induced+Electron+Confinement+by+Dilute+Boron+Alloying+in+%CF%B5-Ga2O3+Nanometer-Thick+Film+for+High+Electron+Mobility+Transistor&rft.title=ACS+Applied+Nano+MaterialsTest
http://www.scopus.com/record/display.url?eid=2-s2.0-85189963488&origin=inwardTest

المساهمون: Guthrey, Harvey [National Renewable Energy Lab. (NREL), Golden, CO (United States)]

المصدر: Applied Physics Letters; 107; 15

وصف الملف: Medium: ED; Size: Article No. 151903

الوصول الحر: http://www.osti.gov/scitech/servlets/purl/1225924Test

المؤلفون: Adele Moatti, Ritesh Sachan, Jagdish Narayan

المصدر: Materials Research Letters, Vol 8, Iss 1, Pp 16-22 (2020)

مصطلحات موضوعية: relaxation mechanism, critical thickness, vo2, dislocation core, strain analysis, Materials of engineering and construction. Mechanics of materials, TA401-492

وصف الملف: electronic resource

العلاقة: https://doaj.org/toc/2166-3831Test

الوصول الحر: https://doaj.org/article/907aa9d062cf4fc0a75b799fd669eef5Test