-
1تقرير
المؤلفون: King, Andrew D., Nocera, Alberto, Rams, Marek M., Dziarmaga, Jacek, Wiersema, Roeland, Bernoudy, William, Raymond, Jack, Kaushal, Nitin, Heinsdorf, Niclas, Harris, Richard, Boothby, Kelly, Altomare, Fabio, Berkley, Andrew J., Boschnak, Martin, Chern, Kevin, Christiani, Holly, Cibere, Samantha, Connor, Jake, Dehn, Martin H., Deshpande, Rahul, Ejtemaee, Sara, Farré, Pau, Hamer, Kelsey, Hoskinson, Emile, Huang, Shuiyuan, Johnson, Mark W., Kortas, Samuel, Ladizinsky, Eric, Lai, Tony, Lanting, Trevor, Li, Ryan, MacDonald, Allison J. R., Marsden, Gaelen, McGeoch, Catherine C., Molavi, Reza, Neufeld, Richard, Norouzpour, Mana, Oh, Travis, Pasvolsky, Joel, Poitras, Patrick, Poulin-Lamarre, Gabriel, Prescott, Thomas, Reis, Mauricio, Rich, Chris, Samani, Mohammad, Sheldan, Benjamin, Smirnov, Anatoly, Sterpka, Edward, Clavera, Berta Trullas, Tsai, Nicholas, Volkmann, Mark, Whiticar, Alexander, Whittaker, Jed D., Wilkinson, Warren, Yao, Jason, Yi, T. J., Sandvik, Anders W., Alvarez, Gonzalo, Melko, Roger G., Carrasquilla, Juan, Franz, Marcel, Amin, Mohammad H.
مصطلحات موضوعية: Quantum Physics, Condensed Matter - Disordered Systems and Neural Networks, Condensed Matter - Statistical Mechanics
الوصول الحر: http://arxiv.org/abs/2403.00910Test
-
2تقرير
المؤلفون: Amin, Mohammad H., King, Andrew D., Raymond, Jack, Harris, Richard, Bernoudy, William, Berkley, Andrew J., Boothby, Kelly, Smirnov, Anatoly, Altomare, Fabio, Babcock, Michael, Baron, Catia, Connor, Jake, Dehn, Martin, Enderud, Colin, Hoskinson, Emile, Huang, Shuiyuan, Johnson, Mark W., Ladizinsky, Eric, Lanting, Trevor, MacDonald, Allison J. R., Marsden, Gaelen, Molavi, Reza, Oh, Travis, Poulin-Lamarre, Gabriel, Ramp, Hugh, Rich, Chris, Clavera, Berta Trullas, Tsai, Nicholas, Volkmann, Mark, Whittaker, Jed D., Yao, Jason, Heinsdorf, Niclas, Kaushal, Nitin, Nocera, Alberto, Franz, Marcel
مصطلحات موضوعية: Quantum Physics
الوصول الحر: http://arxiv.org/abs/2311.01306Test
-
3دورية أكاديمية
المساهمون: Stichting voor de Technische Wetenschappen (STW), Dutch Technology Foundation
المصدر: IEEE Journal of Solid-State Circuits ; volume 55, issue 5, page 1139-1150 ; ISSN 0018-9200 1558-173X
الإتاحة: https://doi.org/10.1109/jssc.2019.2959489Test
http://xplorestaging.ieee.org/ielx7/4/9076749/08944060.pdf?arnumber=8944060Test