المؤلفون: Kuo, Hsi-Yu, Chu, Yu-Lin, Dai, Hung-Da, Wang, Chun-Chi, Lin, Pei-Jung, Guo, Ethan, Su, Yu-Ti, Hsu, Chia-Lin, Chen, Kuan-Hung, Chen, Tsung-Yuan, Lu, Ryan, Liang, Victor, Chen, Kuo-Ji, Xia, Kejun

المصدر: 2023 IEEE International Reliability Physics Symposium (IRPS)

الإتاحة: https://doi.org/10.1109/irps48203.2023.10117947Test
http://xplorestaging.ieee.org/ielx7/10117589/10117581/10117947.pdf?arnumber=10117947Test

المؤلفون: Lin, Rong-Teng, Wu, Bi-Xian, Yang, Yun-Hong, Hsu, Teng-Chin, Chao, Chia-Lien, Chang, Yu-Chiao, Su, Chiao-Jung, Lee, Jam-Wem, Chen, Kuo-Ji, Lin, Wun-Jie, Liu, Chien-Hao, Chang, Tzu-Hsuan

المصدر: 2023 45th Annual EOS/ESD Symposium (EOS/ESD)

الإتاحة: https://doi.org/10.23919/eos/esd58195.2023.10287747Test
http://xplorestaging.ieee.org/ielx7/10287717/10287664/10287747.pdf?arnumber=10287747Test

المؤلفون: Huang, Chien-Yao, Lin, Wun-Jie, Su, Yu-Ti, Lee, Jam-Wem, Chen, Kuo-Ji, Song, Ming-Hsiang

المصدر: 2022 44th Annual EOS/ESD Symposium (EOS/ESD)

الإتاحة: https://doi.org/10.23919/eos/esd54763.2022.9928487Test
http://xplorestaging.ieee.org/ielx7/9928440/9928450/09928487.pdf?arnumber=9928487Test

المؤلفون: Chang, Yi-Feng, Yang, Han-Jen, Chang, Tzu-Heng, Lee, Jam-Wem, Chen, Kuo-Ji

المصدر: 2022 44th Annual EOS/ESD Symposium (EOS/ESD)

الإتاحة: https://doi.org/10.23919/eos/esd54763.2022.9928456Test
http://xplorestaging.ieee.org/ielx7/9928440/9928450/09928456.pdf?arnumber=9928456Test