المؤلفون: Cambie, R. C.

المصدر: Food technology in New Zealand, May 1991; v.26 n.5:p.37-38

المؤلفون: Yashchuk, V.V., Cambie, R., Celestre, R.S., Church, M.N., Heimann, P., Glossinger, J.M., Goldberg, K.A., Gullikson, E.M., Kirschman, J.L., MacDowell, A.A., McKinney, W.R., Morrison, G.Y., Padmore, H.A., Voronov, D.L., Warwick, T.

وصف الملف: application/pdf

الوصول الحر: https://escholarship.org/uc/item/4x28h706Test

المؤلفون: Cambie, R. C.

مرشدي الرسالة: Lowe, G.

الإتاحة: http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.710313Test

المؤلفون: Voronov, D L, Anderson, E H, Cambie, R, Gawlitza, P, Goray, L I, Gullikson, E M, Salmassi, F, Warwick, T, Yashchuk, V V, Padmore, H A

المصدر: Journal of Physics: Conference Series ; volume 425, issue 15, page 152006 ; ISSN 1742-6588 1742-6596

الإتاحة: https://doi.org/10.1088/1742-6596/425/15/152006Test
http://stacks.iop.org/1742-6596/425/i=15/a=152006/pdfTest
http://stacks.iop.org/1742-6596/425/i=15/a=152006?key=crossref.297cf5bb69e2d68dab3407e3903355c1Test

المؤلفون: Voronov, D. L., Anderson, E. H., Cambie, R., Gullikson, E. M., Salmassi, F., Warwick, T., Yashchuk, V. V., Padmore, H. A.

المساهمون: Morawe, Christian, Khounsary, Ali M., Goto, Shunji

المصدر: SPIE Proceedings ; Advances in X-Ray/EUV Optics and Components VI ; ISSN 0277-786X

الإتاحة: https://doi.org/10.1117/12.893774Test

المؤلفون: Voronov, D. L., Cambie, R., Ahn, M., Anderson, E. H., Chang, C. H., Gullikson, E. M., Heilmann, R. K., Salmassi, F., Schattenburg, M. L., Yashchuk, V. V., Padmore, H. A., Garrett, R., Gentle, I., Nugent, K., Wilkins, S.

المصدر: AIP Conference Proceedings ; ISSN 0094-243X

الإتاحة: https://doi.org/10.1063/1.3463360Test

المؤلفون: Black, J.P., Elium, A., White, R.M., Apte, M.G., Gundel, L.A., Cambie, R.

المصدر: 2007 IEEE Ultrasonics Symposium Proceedings ; ISSN 1051-0117

الإتاحة: https://doi.org/10.1109/ultsym.2007.128Test
http://xplorestaging.ieee.org/ielx5/4409572/4409573/04409701.pdf?arnumber=4409701Test

المؤلفون: Cambie, R., Carli, F., Combi, C.

المصدر: International Conference on Microelectronic Test Structures, 2003.

الإتاحة: https://doi.org/10.1109/icmts.2003.1197368Test
http://xplorestaging.ieee.org/ielx5/8531/26945/01197368.pdf?arnumber=1197368Test

المؤلفون: Glaeser, R., Sassolini, S., Cambie, R., Jin, J., Cabrini, S., Schmid, A., Danev, R., Buijsse, B., Csencsits, R., Downing, K., Larson, D., Typke, D., Han, B.

المصدر: ULTRAMICROSCOPY

العلاقة: http://hdl.handle.net/11858/00-001M-0000-0014-D124-ATest

الإتاحة: https://doi.org/10.1016/j.ultramic.2013.05.023Test
http://hdl.handle.net/11858/00-001M-0000-0014-D124-ATest

المؤلفون: Voronov, D.L., Gawlitza, P., Cambie, R., Dhuey, S., Gullikson, E.M., Warwick, T., Braun, S., Yashchuk, V.V., Padmore, H.A.

الوقت: 621, 671, 530

العلاقة: Journal of applied physics; https://publica.fraunhofer.de/handle/publica/229212Test

الإتاحة: https://doi.org/10.1063/1.4710985Test
https://publica.fraunhofer.de/handle/publica/229212Test