المؤلفون: Stefan Mönch, Richard Reiner, Michael Basler, Daniel Grieshaber, Fouad Benkhelifa, Patrick Waltereit, Rüdiger Quay

المصدر: Sensors; Volume 23; Issue 14; Pages: 6512

مصطلحات موضوعية: current measurement, power integrated circuits, gallium nitride, HEMTs, AC motor drives, three-phase DC–AC inverters, wide-bandgap semiconductors, current mirrors, brushless motors, equivalent circuits, substrates

وصف الملف: application/pdf

العلاقة: Physical Sensors; https://dx.doi.org/10.3390/s23146512Test

الإتاحة: https://doi.org/10.3390/s23146512Test

المؤلفون: Mönch, Stefan, Reiner, Richard, Basler, Michael, Grieshaber, Daniel, Benkhelifa, Fouad, Waltereit, Patrick, Quay, Rüdiger

مصطلحات موضوعية: current measurement, power integrated circuits, gallium nitride, HEMTs, AC motor drives, three-phase DC-AC inverters, wide-bandgap semiconductors, current mirrors, brushless motors, equivalent circuits, substrates

وصف الملف: application/pdf

العلاقة: Sensors. Online journal; https://publica.fraunhofer.de/handle/publica/450235Test; https://doi.org/10.24406/publica-1854Test

الإتاحة: https://doi.org/10.3390/s23146512Test
https://doi.org/10.24406/publica-1854Test
https://publica.fraunhofer.de/handle/publica/450235Test

المؤلفون: Wang, Zheng¹, Chen, Yi², Patil, Aakash², Jayabalan, Jayasanker², Zhang, Xueyong², Chang, Chip-Hong², Basu, Arindam²

المصدر: IEEE Transactions on Circuits & Systems. Part I: Regular Papers. Apr2018, Vol. 65 Issue 4, p1314-1326. 13p.

مصطلحات موضوعية: *INTEGRATED circuits, CURRENT mirrors, MACHINE learning

المؤلفون: Julien, Mohan¹ julien@lirmm.fr, Bernard, Serge¹, Soulier, Fabien¹, Kerzèrho, Vincent¹, Cathèbras, Guy¹

المصدر: Microelectronics Journal. Jan2019, Vol. 83, p77-85. 9p.

مصطلحات موضوعية: *ANALOG integrated circuits, *CURRENT mirrors, *CURRENT conveyors, *COMPLEMENTARY metal oxide semiconductors, *ENERGY consumption

المؤلفون: Kumar, Shashi^1,2,3 shashiasia1990@gmail.com, Rathore, Pradeep Kumar^1,2,3 rpradeep.tu@gmail.com, Panwar, Brishbhan Singh^1,2,3 bspanwar@care.iitd.ac.in, Akhtar, Jamil^1,2,3 jamil@ceeri.ernet.in

المصدر: Microelectronics International. 2018, Vol. 35 Issue 4, p203-210. 8p.

مصطلحات موضوعية: *MICROELECTROMECHANICAL systems, *CURRENT mirrors, *METAL oxide semiconductor field-effect transistors, *COMPLEMENTARY metal oxide semiconductors, *PIEZORESISTIVE effect

المؤلفون: Santana-Andreo, A., Martin-Lloret, P., Roca, Elisenda, Castro-López, R., Fernández, Francisco V.

المساهمون: Agencia Estatal de Investigación (España), Ministerio de Ciencia e Innovación (España), Junta de Andalucía, Santana-Andreo, A., #NODATA#, Roca, Elisenda, Castro-López, R., Fernández, Francisco V.

مصطلحات موضوعية: Aging, Circuit Reliability, CMOS integrated circuits, Bias Temperature Instability, current mirrors, integrated circuit reliability, Hot Carrier Injection

العلاقة: #PLACEHOLDER_PARENT_METADATA_VALUE#; info:eu-repo/grantAgreement/AEI/Plan Estatal de Investigación Científica y Técnica y de Innovación 2017-2020/PID2019-103869RB-C31/ES/THE VARIABILITY CHALLENGE IN NANO-CMOS: FROM DEVICE MODELING TO IC DESIGN FOR MITIGATION AND EXPLOITATION (VIGILANT-IMSE)/; info:eu-repo/grantAgreement/Junta de Andalucia/Programa Operativo FEDER 2014‐2020/US-1380876/; Proceedings - 2022 18th International Conference on Synthesis, Modeling, Analysis and Simulation Methods, and Applications to Circuit Design, SMACD 2022; Postprint; https://doi.org/10.1109/SMACD55068.2022.9816212Test; Sí; 2022 18th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD); http://hdl.handle.net/10261/306534Test; 2-s2.0-85134762702; https://api.elsevier.com/content/abstract/scopus_id/85134762702Test

الإتاحة: https://doi.org/10.1109/SMACD55068.2022.9816212Test
http://hdl.handle.net/10261/306534Test
https://api.elsevier.com/content/abstract/scopus_id/85134762702Test

المؤلفون: Maity, Ashis¹, Patra, Amit²

المصدر: IEEE Transactions on Power Electronics. Mar2016, Vol. 31 Issue 3, p2324-2336. 13p.

مصطلحات موضوعية: CURRENT mirrors, ELECTRIC current regulators, POWER transistors, ELECTRIC potential, LOGIC circuits

المؤلفون: Maroof, Naeem¹, Sohail, Muhammad¹, Shin, Hyunchul¹

المصدر: International Journal of Electronics. Jul2016, Vol. 103 Issue 7, p1216-1227. 12p.

مصطلحات موضوعية: *MONTE Carlo method, CURRENT mirrors, RADIO wave propagation, ROBUST statistics

المؤلفون: Xie, Haiqing, Wang, Zhenyu, Liu, Gang, Lu, Junlin, Yi, Xinbo

المصدر: Engineering Reports; Feb2022, Vol. 4 Issue 2, p1-8, 8p

مصطلحات موضوعية: CURRENT mirrors, ENERGY dissipation, COMPLEMENTARY metal oxide semiconductors, ELECTRIC potential measurement, ENERGY consumption

المؤلفون: Rangasamy, Gautham, Zhu, Zhongyunshen, Fhager, Lars Ohlsson, Wernersson, Lars Erik

المصدر: IEEE Transactions on Nanotechnology; pp 1-8 (2024) ; ISSN: 1536-125X

مصطلحات موضوعية: Other Electrical Engineering, Electronic Engineering, Information Engineering, Current mirrors, III-V, IoT circuit configuration, Logic gates, low power, MOSFET, Nanowires, Quantum capacitance, sub-threshold analog, TFETs, Transistors, vertical nanowires

العلاقة: https://lup.lub.lu.se/record/3632e21e-0252-473e-8d44-19217514c596Test; http://dx.doi.org/10.1109/TNANO.2024.3407360Test; scopus:85194882417

الإتاحة: https://doi.org/10.1109/TNANO.2024.3407360Test
https://lup.lub.lu.se/record/3632e21e-0252-473e-8d44-19217514c596Test