المؤلفون: N. M. Strickland, A. A. Soman, N. J. Long, P. Kluth, C. Notthoff, M. W. Rupich, S. C. Wimbush

المصدر: IEEE Transactions on Applied Superconductivity. 33:1-5

مصطلحات موضوعية: Electrical and Electronic Engineering, Condensed Matter Physics, Electronic, Optical and Magnetic Materials

الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::afd1d8a50884e3906c548e51e47a029fTest
https://doi.org/10.1109/tasc.2023.3240384Test

المؤلفون: Pablo Mota-Santiago, Patrick Kluth, Mark Grigg, Alexander Kiy, Christina Trautmann, C. Notthoff, A. Hadley, Maria Eugenia Toimil-Molares, Nigel Kirby, Shankar Dutt

المصدر: Physical Chemistry Chemical Physics. 23:14231-14241

مصطلحات موضوعية: Materials science, Analytical chemistry, General Physics and Astronomy, macromolecular substances, 02 engineering and technology, 010402 general chemistry, 01 natural sciences, symbols.namesake, stomatognathic system, Etching (microfabrication), Physical and Theoretical Chemistry, Polycarbonate, Arrhenius equation, chemistry.chemical_classification, Scattering, Small-angle X-ray scattering, Ion track, fungi, technology, industry, and agriculture, Polymer, Orders of magnitude (numbers), 021001 nanoscience & nanotechnology, 0104 chemical sciences, chemistry, visual_art, symbols, visual_art.visual_art_medium, 0210 nano-technology

الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::8bc67aee537634824cac2473852384f7Test
https://doi.org/10.1039/d1cp02063cTest

المؤلفون: C. Notthoff, P. Mota-Santiago, Patrick Kluth, A. Hadley, Nigel Kirby

المصدر: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 465:62-66

مصطلحات موضوعية: Nuclear and High Energy Physics, Materials science, Scanning electron microscope, Ion track, Analytical chemistry, 02 engineering and technology, 010402 general chemistry, 021001 nanoscience & nanotechnology, 01 natural sciences, 0104 chemical sciences, Amorphous solid, Ion, Swift heavy ion, Etching (microfabrication), Grazing-incidence small-angle scattering, Irradiation, 0210 nano-technology, Instrumentation

الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::266f228eabe34b8b7c37bd06d1f15ca6Test
https://doi.org/10.1016/j.nimb.2019.12.006Test

المؤلفون: P. Mota-Santiago, Patrick Kluth, Maria Eugenia Toimil-Molares, Christina Trautmann, A. Hadley, U.H. Hossain, Stephen T. Mudie, C. Notthoff

المصدر: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 435:133-136

مصطلحات موضوعية: Nuclear and High Energy Physics, Materials science, Physics::Instrumentation and Detectors, business.industry, Scattering, Small-angle X-ray scattering, Ion track, 02 engineering and technology, Conical surface, 021001 nanoscience & nanotechnology, 01 natural sciences, Molecular physics, Synchrotron, Computer Science::Other, law.invention, Ion, Optics, law, Etching (microfabrication), 0103 physical sciences, Irradiation, 010306 general physics, 0210 nano-technology, business, Instrumentation

الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::4d3b5409643cb351d81a1fcb963c8ffcTest
https://doi.org/10.1016/j.nimb.2017.10.020Test

المؤلفون: Peter B. Kreider, Christopher Leow, Paul Compston, Antonio Tricoli, C. Notthoff, Patrick Kluth

المصدر: Functional Composite Materials, Vol 2, Iss 1, Pp 1-11 (2021)

مصطلحات موضوعية: Thermoplastic, Materials science, Polymer nanocomposite, Spray-deposition, Composite number, 02 engineering and technology, 010402 general chemistry, 01 natural sciences, Nanomaterials, law.invention, Specific strength, law, lcsh:TA401-492, Peek, Thermoplastics, Thin film, Composite material, chemistry.chemical_classification, Nanocomposite, Graphene, 021001 nanoscience & nanotechnology, 0104 chemical sciences, chemistry, lcsh:Materials of engineering and construction. Mechanics of materials, 0210 nano-technology

الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::e2fe2f4ae9f8d8d57f57837474d9a526Test
https://doi.org/10.1186/s42252-020-00015-9Test

المؤلفون: Tinghe Yun, Elena A. Ostrovskaya, C. Notthoff, Michael S. Fuhrer, Andrew G. Truscott, Semonti Bhattacharyya, Patrick Kluth, Qingdong Ou, Eliezer Estrecho, Chung Kim Nguyen, Matthias Wurdack, Maciej Pieczarka, Torben Daeneke

مصطلحات موضوعية: Condensed Matter - Materials Science, Materials science, Photoluminescence, Physics and Astronomy (miscellaneous), business.industry, Materials Science (cond-mat.mtrl-sci), FOS: Physical sciences, Dielectric, Chemical vapor deposition, Physics - Applied Physics, Applied Physics (physics.app-ph), Sputter deposition, Electron beam physical vapor deposition, Atomic layer deposition, Condensed Matter::Materials Science, Plasma-enhanced chemical vapor deposition, Monolayer, Optoelectronics, business

الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::e59395b4c317cc431b6c001b54dc2178Test

المؤلفون: Patrick Kluth, A. Hadley, C. Notthoff, G. Rizza, Felipe Kremer, V. Khomenkov, Ch. Dufour, P. Mota-Santiago

المساهمون: Australian National University (ANU), Department of Electronic Materials Engineering, Research School of Physical Sciences and Engineering, Laboratoire des Solides Irradiés (LSI), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-École polytechnique (X)-Centre National de la Recherche Scientifique (CNRS), LSI - Physique et Chimie des nano-objets (PCN), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-École polytechnique (X)-Centre National de la Recherche Scientifique (CNRS)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-École polytechnique (X)-Centre National de la Recherche Scientifique (CNRS), Centre de recherche sur les Ions, les MAtériaux et la Photonique (CIMAP - UMR 6252), Université de Caen Normandie (UNICAEN), Normandie Université (NU)-Normandie Université (NU)-École Nationale Supérieure d'Ingénieurs de Caen (ENSICAEN), Normandie Université (NU)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Centre National de la Recherche Scientifique (CNRS)-Institut de Recherche sur les Matériaux Avancés (IRMA), Normandie Université (NU)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Université de Rouen Normandie (UNIROUEN), Normandie Université (NU)-Institut national des sciences appliquées Rouen Normandie (INSA Rouen Normandie), Institut National des Sciences Appliquées (INSA)-Normandie Université (NU)-Institut National des Sciences Appliquées (INSA)-Centre National de la Recherche Scientifique (CNRS)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Université de Rouen Normandie (UNIROUEN), Institut National des Sciences Appliquées (INSA)-Normandie Université (NU)-Institut National des Sciences Appliquées (INSA)-Centre National de la Recherche Scientifique (CNRS), Nanomatériaux, Ions et Métamatériaux pour la Photonique (NIMPH), Institut National des Sciences Appliquées (INSA)-Normandie Université (NU)-Institut National des Sciences Appliquées (INSA)-Centre National de la Recherche Scientifique (CNRS)-Université de Caen Normandie (UNICAEN), Institute for Nuclear Research of NAS of Ukraine, National Academy of Sciences of Ukraine (NASU)

المصدر: Physical Review Materials
Physical Review Materials, 2020, 4 (9), pp.096002. ⟨10.1103/PhysRevMaterials.4.096002⟩

مصطلحات موضوعية: [PHYS.PHYS.PHYS-OPTICS]Physics [physics]/Physics [physics]/Optics [physics.optics], Materials science, Physics and Astronomy (miscellaneous), Nanoparticle, Shape transformation, [CHIM.MATE]Chemical Sciences/Material chemistry, [SPI.MAT]Engineering Sciences [physics]/Materials, Amorphous solid, Ion, [PHYS.PHYS.PHYS-COMP-PH]Physics [physics]/Physics [physics]/Computational Physics [physics.comp-ph], [SPI.ELEC]Engineering Sciences [physics]/Electromagnetism, Crystallography, chemistry.chemical_compound, Silicon nitride, chemistry, Amorphous silicon dioxide, [SPI.OPTI]Engineering Sciences [physics]/Optics / Photonic, [PHYS.COND.CM-MS]Physics [physics]/Condensed Matter [cond-mat]/Materials Science [cond-mat.mtrl-sci], General Materials Science, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, Single layer

الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::edcb7d63b9b3e83448375a89997473cfTest
https://doi.org/10.1103/physrevmaterials.4.096002Test

المؤلفون: P Mota-Santiago, A Nadzri, F Kremer, T Bierschenk, C E Canto, M D Rodriguez, C Notthoff, S Mudie, P Kluth

المصدر: Journal of Physics D: Applied Physics. 55:145301

مصطلحات موضوعية: Acoustics and Ultrasonics, Condensed Matter Physics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials

الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::f68852701ad5518716fc7de019e8575dTest
https://doi.org/10.1088/1361-6463/ac45b1Test

المؤلفون: Qi Wen, Pablo Mota-Santiago, Pavel Yu Apel, Patrick Kluth, Christina Trautmann, C. Notthoff, N. E. Lizunov, Nigel Kirby, Shankar Dutt

المصدر: Journal of Membrane Science. 638:119681

مصطلحات موضوعية: chemistry.chemical_classification, Materials science, Small-angle X-ray scattering, Water flow, Filtration and Separation, Polymer, Biochemistry, Fluence, Nanopore, Membrane, chemistry, Etching (microfabrication), visual_art, visual_art.visual_art_medium, General Materials Science, Physical and Theoretical Chemistry, Polycarbonate, Composite material

الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::b3e776174b87839144c5410193656576Test
https://doi.org/10.1016/j.memsci.2021.119681Test

المؤلفون: A Hadley, C Notthoff, P Mota-Santiago, N Kirby, P Kluth

مصطلحات موضوعية: Geochemistry not elsewhere classified, Science & Technology, Technology, Physical Sciences, Instruments & Instrumentation, Nuclear Science & Technology, Physics, Atomic, Molecular & Chemical, Nuclear, Ion track, Etching, Small angle X-ray scattering, GTSAXS, SAXS, NANOPORES, RECTIFICATION, Geochemistry

العلاقة: http://hdl.handle.net/10536/DRO/DU:30134540Test; https://figshare.com/articles/journal_contribution/Grazing-incidence_transmission_SAXS_investigation_of_conical_etched_ion_tracks_in_SiO2/20720896Test

الإتاحة: http://hdl.handle.net/10536/DRO/DU:30134540Test
https://figshare.com/articles/journal_contribution/Grazing-incidence_transmission_SAXS_investigation_of_conical_etched_ion_tracks_in_SiO2/20720896Test