المؤلفون: Mortet, Vincent, Busby, Y., Reinke, P., Alam, M., Stranak, P., Sung, K.-D., Taylor, A., Pinault-Thaury, M.A., Klesse, W. M.

المساهمون: Quantum Brillance GmbH, Institute of Physics of the Czech Academy of Sciences (FZU / CAS), Czech Academy of Sciences Prague (CAS), Fraunhofer Institute for Applied Solid State Physics, Groupe d'Etude de la Matière Condensée (GEMAC), Université de Versailles Saint-Quentin-en-Yvelines (UVSQ)-Centre National de la Recherche Scientifique (CNRS)

المصدر: Hasselt Diamond Workshop 2023 - SBDD XXVII ; https://hal.science/hal-04270023Test ; Hasselt Diamond Workshop 2023 - SBDD XXVII, Mar 2023, Hässelt, Belgium

مصطلحات موضوعية: [PHYS]Physics [physics]

جغرافية الموضوع: Hässelt, Belgium

العلاقة: hal-04270023; https://hal.science/hal-04270023Test

الإتاحة: https://hal.science/hal-04270023Test

المؤلفون: Agresti A., Pescetelli S., Busby Y., Aernouts T.

المساهمون: Agresti, A, Pescetelli, S, Busby, Y, Aernouts, T

مصطلحات موضوعية: Settore ING-INF/01 - ELETTRONICA

العلاقة: info:eu-repo/semantics/altIdentifier/wos/WOS:000454333500090; volume:66; issue:1; firstpage:678; lastpage:688; numberofpages:11; journal:IEEE TRANSACTIONS ON ELECTRON DEVICES; info:eu-repo/grantAgreement/EC/H2020/785219; http://hdl.handle.net/2108/214274Test; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85057380114

الإتاحة: https://doi.org/10.1109/TED.2018.2880760Test
http://hdl.handle.net/2108/214274Test

المؤلفون: Palma A. L., Cina L., Busby Y., Marsella A., Agresti A., Pescetelli S., Pireaux J. -J., Di Carlo A.

المساهمون: Palma, A. L., Cina, L., Busby, Y., Marsella, A., Agresti, A., Pescetelli, S., Pireaux, J. -J., Di Carlo, A.

مصطلحات موضوعية: perovskite, mesoscopic, light-emitting diode, aging effects, characterization, Raman, XPS, ToF-SIMS

العلاقة: volume:8; issue:40; firstpage:26989; lastpage:26997; numberofpages:9; journal:ACS APPLIED MATERIALS & INTERFACES; http://hdl.handle.net/20.500.12079/52442Test; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-84991712503

الإتاحة: https://doi.org/20.500.12079/52442Test
https://doi.org/10.1021/acsami.6b07750Test
https://hdl.handle.net/20.500.12079/52442Test

المؤلفون: Palma A. L., Cina L., Busby Y., Marsella A., Agresti A., Pescetelli S., Pireaux J. -J., Carlo A. D.

المساهمون: Palma, A. L., Cina, L., Busby, Y., Marsella, A., Agresti, A., Pescetelli, S., Pireaux, J. -J., Carlo, A. D.

مصطلحات موضوعية: critical raw materials, light emitting diodes, meso-superstructure, perovskite

العلاقة: volume:13; issue:10-12; firstpage:958; lastpage:961; numberofpages:4; journal:PHYSICA STATUS SOLIDI. C, CURRENT TOPICS IN SOLID STATE PHYSICS; http://hdl.handle.net/20.500.12079/52440Test; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-84994644968

الإتاحة: https://doi.org/20.500.12079/52440Test
https://doi.org/10.1002/pssc.201600101Test
https://hdl.handle.net/20.500.12079/52440Test

المؤلفون: Ralaiarisoa, M., Busby, Y., Frisch, J., Salzmann, I., Pireaux, J. J., Koch, N.

مصطلحات موضوعية: Solar cells of the next generation

وصف الملف: application/pdf

العلاقة: http://www.helmholtz-berlin.de/pubbin/oai_publication?VT=1&ID=92469Test

الإتاحة: https://doi.org/10.1039/c6cp06347kTest
http://www.helmholtz-berlin.de/pubbin/oai_publication?VT=1&ID=92469Test

المؤلفون: CASULA, GIULIA, COSSEDDU, PIERO, Busby Y, Pireaux J. J, Rosowski M, Tkacz Szczesna B, Soliwoda K, Celichowski G, Grobelny J, Novák J, Banerjee R, F. Schreiber F, BONFIGLIO, ANNALISA

المساهمون: Casula, Giulia, Cosseddu, Piero, Busby, Y, Pireaux J., J, Rosowski, M, Tkacz Szczesna, B, Soliwoda, K, Celichowski, G, Grobelny, J, Novák, J, Banerjee, R, F., Schreiber F, Bonfiglio, Annalisa

مصطلحات موضوعية: Organic memorie, Resistive switching, Metal nanoparticle, Filamentary conduction

العلاقة: info:eu-repo/semantics/altIdentifier/wos/WOS:000349548400003; volume:18; firstpage:17; lastpage:23; numberofpages:7; journal:ORGANIC ELECTRONICS; http://hdl.handle.net/11584/86367Test; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-84921038533; http://www.sciencedirect.com/science/article/pii/S1566119915000026Test

الإتاحة: https://doi.org/10.1016/j.orgel.2015.01.001Test
http://hdl.handle.net/11584/86367Test
http://www.sciencedirect.com/science/article/pii/S1566119915000026Test

المؤلفون: Pazniak H., Benchakar M., Bilyk T., Liedl A., Busby Y., Noel C., Chartier P., Hurand S., Marteau M., Houssiau L., Larciprete R., Lacovig P., Lizzit D., Tosi E., Lizzit S., Pacaud J., Celerier S., Mauchamp V., David M. -L.

المساهمون: Pazniak, H., Benchakar, M., Bilyk, T., Liedl, A., Busby, Y., Noel, C., Chartier, P., Hurand, S., Marteau, M., Houssiau, L., Larciprete, R., Lacovig, P., Lizzit, D., Tosi, E., Lizzit, S., Pacaud, J., Celerier, S., Mauchamp, V., David, M. -L.

مصطلحات موضوعية: defect, ion implantation, TEM-EELS, Ti, MXene, ToF-SIMS, XPS

الوقت: 3, 2

وصف الملف: ELETTRONICO

العلاقة: info:eu-repo/semantics/altIdentifier/wos/WOS:000634569100045; volume:15; issue:3; firstpage:4245; lastpage:4255; numberofpages:11; journal:ACS NANO; info:eu-repo/grantAgreement/EC/H2020/730872; http://hdl.handle.net/11390/1208504Test; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85101566342

الإتاحة: https://doi.org/10.1021/acsnano.0c06735Test
http://hdl.handle.net/11390/1208504Test

المؤلفون: Pescetelli, S., Agresti, A, Di Carlo, A., Bonaccorso, F., Busby, Y.

المساهمون: Pescetelli, S, Agresti, A, Di Carlo, A, Bonaccorso, F, Busby, Y

مصطلحات موضوعية: Settore ING-INF/01 - ELETTRONICA

العلاقة: info:eu-repo/semantics/altIdentifier/isbn/978-1-5386-6282-3; ispartofbook:2018 IEEE 4th International Forum on Research and Technology for Society and Industry (RTSI); 2018 IEEE 4th International Forum on Research and Technology for Society and Industry (RTSI); firstpage:1; lastpage:4; numberofpages:4; http://hdl.handle.net/2108/214284Test; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85060045650

الإتاحة: https://doi.org/10.1109/RTSI.2018.8548350Test
http://hdl.handle.net/2108/214284Test

المؤلفون: Busby, Y, Franquet, A, Spampinato, V, Casula, G, Bonfiglio, A, Cosseddu, P, Pireaux, JJ, Houssiau, L

المساهمون: List-Kratochvil, Emil J., Busby, Y, Franquet, A, Spampinato, V, Casula, G, Bonfiglio, A, Cosseddu, P, Pireaux, Jj, Houssiau, L

مصطلحات موضوعية: Resistive switching, ToF-SIMS, AFM, hybrid devices, depth profiling

العلاقة: info:eu-repo/semantics/altIdentifier/isbn/9781510620476; info:eu-repo/semantics/altIdentifier/isbn/9781510620483; info:eu-repo/semantics/altIdentifier/wos/WOS:000452433200005; ispartofbook:SPIE Organic Photonics + Electronics, 2018, San Diego, California, United States; SPIE Organic Photonics + Electronics, 2018, San Diego, California, United States; volume:10738; firstpage:40; numberofpages:4; serie:PROCEEDINGS OF SPIE, THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING; alleditors:List-Kratochvil, Emil J.; http://hdl.handle.net/11584/345183Test; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85055797577

الإتاحة: https://doi.org/10.1117/12.2319923Test
http://hdl.handle.net/11584/345183Test

المؤلفون: Agresti A., Pescetelli S., Najafi L., Del Rio Castillo A. E., Oropesa-Nunez R., Busby Y., Bonaccorso F., Di Carlo A.

المساهمون: Agresti, A, Pescetelli, S, Najafi, L, Del Rio Castillo, Ae, Oropesa-Nunez, R, Busby, Y, Bonaccorso, F, Di Carlo, A

مصطلحات موضوعية: Settore ING-INF/01 - ELETTRONICA

العلاقة: info:eu-repo/semantics/altIdentifier/isbn/978-1-5090-3028-6; info:eu-repo/semantics/altIdentifier/wos/WOS:000434647500033; ispartofbook:2017 IEEE 17th International Conference on Nanotechnology (IEEE-NANO); IEEE NANOTECHNOLOGY; firstpage:145; lastpage:150; numberofpages:6; http://hdl.handle.net/2108/200619Test; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85041235653

الإتاحة: https://doi.org/10.1109/NANO.2017.8117278Test
http://hdl.handle.net/2108/200619Test