المؤلفون: Zhang, Yu, Kodali, Satish, Banghart, Edmund, Mitchell, Travis, Baumann, Frieder

المصدر: Microscopy and Microanalysis ; volume 27, issue S1, page 1548-1549 ; ISSN 1431-9276 1435-8115

مصطلحات موضوعية: Instrumentation

الإتاحة: https://doi.org/10.1017/s1431927621005717Test
https://www.cambridge.org/core/services/aop-cambridge-core/content/view/S1431927621005717Test

المؤلفون: Baumann, Frieder, Pichumani, Pradip Sairam, Torcedo, Christopher

المصدر: Microscopy and Microanalysis ; volume 26, issue S2, page 370-372 ; ISSN 1431-9276 1435-8115

مصطلحات موضوعية: Instrumentation

الإتاحة: https://doi.org/10.1017/s1431927620014415Test
https://www.cambridge.org/core/services/aop-cambridge-core/content/view/S1431927620014415Test

المؤلفون: Baumann, Frieder, Mitchell, Travis, Utess, Dirk, Hobert, Christian

المصدر: Microscopy and Microanalysis ; volume 26, issue S2, page 660-662 ; ISSN 1431-9276 1435-8115

مصطلحات موضوعية: Instrumentation

الإتاحة: https://doi.org/10.1017/s1431927620015433Test
https://www.cambridge.org/core/services/aop-cambridge-core/content/view/S1431927620015433Test

المؤلفون: Zhang, Yu, Popielarski, Brian, Davidson, Kevin, Men, Long, Zhao, Wayne, Baumann, Frieder

المصدر: Microscopy and Microanalysis ; volume 26, issue S2, page 1400-1402 ; ISSN 1431-9276 1435-8115

مصطلحات موضوعية: Instrumentation

الإتاحة: https://doi.org/10.1017/s1431927620017973Test
https://www.cambridge.org/core/services/aop-cambridge-core/content/view/S1431927620017973Test

المؤلفون: Baumann, Frieder H.¹ frieder.baumann@globalfoundries.com, Popielarski, Brian¹, Sweeney, Ryan¹, Beaudoin, Felix¹, Giewont, Ken¹

المصدر: Electronic Device Failure Analysis. Aug2023, Vol. 25 Issue 3, p23-30. 6p.

مصطلحات موضوعية: *FAILURE analysis, *INTEGRATED circuits, *PHOTONIC crystal fibers

المؤلفون: Zhao, Wayne W., Baumann, Frieder

المصدر: Microscopy and Microanalysis ; volume 25, issue S2, page 1784-1785 ; ISSN 1431-9276 1435-8115

مصطلحات موضوعية: Instrumentation

الإتاحة: https://doi.org/10.1017/s1431927619009656Test
https://www.cambridge.org/core/services/aop-cambridge-core/content/view/S1431927619009656Test

المؤلفون: Baumann, Frieder H., Popielarski, Brian, Mitchell, Travis, Lu, Yinggang

المصدر: Microscopy and Microanalysis ; volume 25, issue S2, page 1820-1821 ; ISSN 1431-9276 1435-8115

مصطلحات موضوعية: Instrumentation

الإتاحة: https://doi.org/10.1017/s1431927619009838Test
https://www.cambridge.org/core/services/aop-cambridge-core/content/view/S1431927619009838Test

المؤلفون: Fu, B., Gribelyuk, M., Baumann, Frieder H., Wang, Yun-yu

المصدر: Microscopy and Microanalysis ; volume 23, issue S1, page 1420-1421 ; ISSN 1431-9276 1435-8115

مصطلحات موضوعية: Instrumentation

الإتاحة: https://doi.org/10.1017/s1431927617007760Test
https://www.cambridge.org/core/services/aop-cambridge-core/content/view/S1431927617007760Test

المؤلفون: Baumann, Frieder H., Miller, John, Rhoads, Bryan, Friedman, Anne, Fu, Bianzhu

المصدر: Microscopy and Microanalysis ; volume 22, issue S3, page 280-281 ; ISSN 1431-9276 1435-8115

مصطلحات موضوعية: Instrumentation

الإتاحة: https://doi.org/10.1017/s1431927616002257Test
https://www.cambridge.org/core/services/aop-cambridge-core/content/view/S1431927616002257Test