المؤلفون: Kappaganthu, Sri Ramakanth, Karmarkar, Aditya, Xu, Xiaopeng, El Sayed, Karim, Avci, Ibrahim, Chawla, Vikas, Mishra, Bikash, Kucherov, Andrey, Zhou, Weixing, Johnson, Mark, Balasingam, Pratheep

المصدر: IEEE International Interconnect Technology Conference

الإتاحة: https://doi.org/10.1109/iitc.2014.6831850Test
http://xplorestaging.ieee.org/ielx7/6826038/6831822/06831850.pdf?arnumber=6831850Test

المؤلفون: Cork, Christopher M., Balasingam, Pratheep, Sandvik, Sonya, Kielhorn, Bill, Rieger, Michael L.

المساهمون: Liebmann, Lars W.

المصدر: SPIE Proceedings ; Design and Process Integration for Microelectronic Manufacturing II ; ISSN 0277-786X

الإتاحة: https://doi.org/10.1117/12.538047Test

المؤلفون: Hung, Meg, Balasingam, Pratheep

المساهمون: Grenon, Brian J., Kimmel, Kurt R.

المصدر: SPIE Proceedings ; 22nd Annual BACUS Symposium on Photomask Technology ; ISSN 0277-786X

الإتاحة: https://doi.org/10.1117/12.468204Test

المؤلفون: Simeonov, Simeon D., Avci, Ibrahim, Balasingam, Pratheep, Johnson, Mark D., Kucherov, Andrey, Lyumkis, Eugeny, von Matt, Urs, El Sayed, Karim, Saha, Arup R., Tan, Zhiqiang, Tian, Shiyang, Villablanca, Luis, Polsky, Boris

المصدر: IEEE Transactions on Electron Devices ; volume 58, issue 4, page 1189-1196 ; ISSN 0018-9383 1557-9646

مصطلحات موضوعية: Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials

الإتاحة: https://doi.org/10.1109/ted.2011.2109003Test
http://xplorestaging.ieee.org/ielx5/16/5737855/05714724.pdf?arnumber=5714724Test

المؤلفون: Wang, Xiaodong, Roychowdhury, Vwani P., Balasingam, Pratheep

المصدر: Parallel Computing ; volume 22, issue 14, page 1931-1963 ; ISSN 0167-8191

مصطلحات موضوعية: Artificial Intelligence, Computer Graphics and Computer-Aided Design, Computer Networks and Communications, Hardware and Architecture, Theoretical Computer Science, Software

الإتاحة: https://doi.org/10.1016/s0167-8191Test(96)00069-5
https://api.elsevier.com/content/article/PII:S0167819196000695?httpAccept=text/xmlTest
https://api.elsevier.com/content/article/PII:S0167819196000695?httpAccept=text/plainTest

المؤلفون: Balasingam, Pratheep, Roychowdhury, Vwani P.

المصدر: Department of Electrical and Computer Engineering Technical Reports

وصف الملف: application/pdf

الوصول الحر: https://explore.openaire.eu/search/publication?articleId=od_______540::f86fb484a9f1d727145c2431e89fb020Test
http://docs.lib.purdue.edu/ecetr/193Test

المؤلفون: Lee, Mankoo, Pramanik, Dipankar, Oh, Yong-Seog, Qin, Zudian, Avci, Ibrahim, Simeonov, Simeon, El Sayed, Karim, Balasingam, Pratheep

المصدر: 2013 IEEE International Reliability Physics Symposium (IRPS); 2013, pEM.4-EM.4-EM.4.7, 0p