المؤلفون: A.I. TITOV, B. KAMPFER, T.I. GULAMOV

المصدر: Soryushiron Kenkyu Electronics. 1997, 95(4):123

المؤلفون: Uwe Zschenderlein, Gudrun Fritsche, Bernd Schultrich, B. Kämpfe

المصدر: Solid State Phenomena. 130:39-42

مصطلحات موضوعية: Diffraction, Materials science, business.industry, Delamination, Elastic energy, Condensed Matter Physics, Titanium nitride, Atomic and Molecular Physics, and Optics, chemistry.chemical_compound, Optics, chemistry, Residual stress, General Materials Science, Energy-dispersive X-ray diffraction, Thin film, Composite material, Chromium nitride, business

الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::3fbf67e0fbe9d4831ac3aa181865c0c0Test
https://doi.org/10.4028/www.scientific.net/ssp.130.39Test

المؤلفون: R. Abou Yassine, J. Adamczewski-Musch, C. Asal, M. Becker, A. Belounnas, A. Blanco, C. Blume, L. Chlad, P. Chudoba, I. Ciepał, M. Cordts, J. Dreyer, W.A. Esmail, L. Fabbietti, H. Floersheimer, P. Fonte, J. Friese, I. Fröhlich, J. Förtsch, T. Galatyuk, T. Gniazdowski, R. Greifenhagen, M. Grunwald, M. Gumberidze, S. Harabasz, T. Heinz, C. Höhne, F. Hojeij, R. Holzmann, H. Huck, M. Idzik, B. Kämpfer, K-H. Kampert, B. Kardan, V. Kedych, I. Koenig, W. Koenig, M. Kohls, J. Kolas, G. Kornakov, R. Kotte, I. Kres, W. Krueger, A. Kugler, R. Lalik, S. Lebedev, S. Linev, F. Linz, L. Lopes, M. Lorenz, A. Malige, J. Markert, T. Matulewicz, S. Maurus, V. Metag, J. Michel, A. Molenda, C. Müntz, M. Nabroth, L. Naumann, K. Nowakowski, J. Orliński, J.-H. Otto, M. Parschau, C. Pauly, V. Pechenov, O. Pechenova, D. Pfeifer, K. Piasecki, J. Pietraszko, T. Povar, A. Prozorov, W. Przygoda, K. Pysz, B. Ramstein, N. Rathod, J. Ritman, P. Rodriguez-Ramos, A. Rost, A. Rustamov, P. Salabura, J. Saraiva, N. Schild, E. Schwab, F. Scozzi, F. Seck, I. Selyuzhenkov, U. Singh, L. Skorpil, J. Smyrski, S. Spies, M.S. Stefaniak, H. Ströbele, J. Stroth, K. Sumara, O. Svoboda, M. Szala, P. Tlusty, M. Traxler, V. Wagner, M. Wasiluk, A.A. Weber, C. Wendisch, J. Wirth, H.P. Zbroszczyk, E. Zherebtsova, M. Zielinski, P. Zumbruch

المصدر: Physics Letters B, Vol 835, Iss , Pp 137506- (2022)

مصطلحات موضوعية: Physics, QC1-999

وصف الملف: electronic resource

العلاقة: http://www.sciencedirect.com/science/article/pii/S0370269322006402Test; https://doaj.org/toc/0370-2693Test

الوصول الحر: https://doaj.org/article/085c8c5cdd434acf80ac7a3ec0295304Test

المؤلفون: B. Michel, B. Kämpfe, R. Arnhold

المساهمون: Publica

المصدر: Particle & Particle Systems Characterization. 22:391-396

مصطلحات موضوعية: Diffraction, Materials science, business.industry, Analytical chemistry, Acousto-optics, General Chemistry, Condensed Matter Physics, Optics, Goniometer, X-ray crystallography, Deposition (phase transition), General Materials Science, Crystallite, Energy-dispersive X-ray diffraction, business, Electron backscatter diffraction

الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a03dea069732d442b1692d2498286fd2Test
https://doi.org/10.1002/ppsc.200501007Test

المؤلفون: B. Kämpfe, M. Brücher, E. Auerswald, R. Krawietz

المصدر: Crystal Research and Technology. 40:143-148

مصطلحات موضوعية: Materials science, Silicon, Diamond-like carbon, Analytical chemistry, chemistry.chemical_element, General Chemistry, Substrate (electronics), Condensed Matter Physics, Stress (mechanics), symbols.namesake, Carbon film, chemistry, X-ray crystallography, symbols, General Materials Science, Crystallite, Raman spectroscopy

الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::258270f289df85c9214255d401cae7beTest
https://doi.org/10.1002/crat.200410317Test

المؤلفون: G. Dlubek, B. Kämpfe, P. Käufler, J. Klöber, C.-E. Richter, B. Simmen, H. Vöhse, F. Werfel, E. Wieser, G. Wolf, H.-J. Hunger

نوع المادة: eBook.

الموضوعات: Materials—Analysis

تصنيفات: TECHNOLOGY & ENGINEERING / Materials Science / General

المؤلفون: A. Schubert, S. Goldenbogen, B. Kämpfe

المساهمون: Publica

المصدر: Textures and Microstructures. 29:53-64

مصطلحات موضوعية: Diffraction, Hardened steel, Optics, Materials science, business.industry, Residual stress, Lattice (order), Detector, Area detector, Cathode ray, X-ray, business

الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::cd06dd7c67abed3eac2b898f899acc62Test
https://doi.org/10.1155/tsm.29.53Test

المؤلفون: E. Auerswald, B. Kämpfe, K. Tränkner, M. Ermrich, A. Schubert

المصدر: Materials Science Forum. :151-156

مصطلحات موضوعية: Stress (mechanics), Materials science, Mechanics of Materials, Mechanical Engineering, X-ray, General Materials Science, Composite material, Condensed Matter Physics

الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::a5786363af27e3aa7ee682ab191e7a17Test
https://doi.org/10.4028/www.scientific.net/msf.166-169.151Test

المؤلفون: B. Kämpfe, F. Krause, L. Skurt

المصدر: Materials Science Forum. :111-116

مصطلحات موضوعية: Stress (mechanics), Materials science, Mechanics of Materials, Mechanical Engineering, X-ray, General Materials Science, Condensed Matter Physics, Computational physics, Interpretation (model theory)

الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::ed8ad66b0712cb0c9d9c229ae534a0d6Test
https://doi.org/10.4028/www.scientific.net/msf.133-136.111Test

المؤلفون: A. Reinecke, B. Kämpfe, S. Benz, B. Altrichter

المصدر: Applied Crystallography.

مصطلحات موضوعية: Materials science, X-ray, Analytical chemistry

الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::7c5bd3f14150a08c7efe4709f383e0d7Test
https://doi.org/10.1142/9789812702913_0039Test