المؤلفون: Daniel Söderström, Oskari Timonen, Heikki Kettunen, Risto Kronholm, Hicham El Hamzaoui, Bruno Capoen, Youcef Ouerdane, Adriana Morana, Arto Javanainen, Géraud Bouwmans, Mohamed Bouazaoui, Sylvain Girard

المصدر: Sensors, Vol 22, Iss 23, p 9248 (2022)

مصطلحات موضوعية: dosimetry, electron accelerator, optical fiber, point dosimeter, pulsed electron beam, radiation-induced attenuation, Chemical technology, TP1-1185

وصف الملف: electronic resource

العلاقة: https://www.mdpi.com/1424-8220/22/23/9248Test; https://doaj.org/toc/1424-8220Test

الوصول الحر: https://doaj.org/article/083059e13cbf48638aa5a1df961c9fabTest

المؤلفون: Daniel Söderström, Heikki Kettunen, Adriana Morana, Arto Javanainen, Youcef Ouerdane, Hicham El Hamzaoui, Bruno Capoen, Géraud Bouwmans, Mohamed Bouazaoui, Sylvain Girard

المصدر: Sensors, Vol 21, Iss 22, p 7523 (2021)

مصطلحات موضوعية: dosimetry, electron accelerator, optical fiber, point dosimeter, pulsed electron beam, radiation-induced luminescence, Chemical technology, TP1-1185

وصف الملف: electronic resource

العلاقة: https://www.mdpi.com/1424-8220/21/22/7523Test; https://doaj.org/toc/1424-8220Test

الوصول الحر: https://doaj.org/article/5fd020c3eb1748a485871311abf01c29Test

المؤلفون: Kenneth F. Galloway, Arthur F. Witulski, Ronald D. Schrimpf, Andrew L. Sternberg, Dennis R. Ball, Arto Javanainen, Robert A. Reed, Brian D. Sierawski, Jean-Marie Lauenstein

المصدر: Aerospace, Vol 5, Iss 3, p 67 (2018)

مصطلحات موضوعية: single event effects, heavy ions, silicon carbide, single-event burnout, power devices, power MOSFETs, reliability, failure rates, Motor vehicles. Aeronautics. Astronautics, TL1-4050

وصف الملف: electronic resource

العلاقة: http://www.mdpi.com/2226-4310/5/3/67Test; https://doaj.org/toc/2226-4310Test

الوصول الحر: https://doaj.org/article/9fc7fe16c21a4bddb4f813b56c6aa0b8Test

المؤلفون: Sascha Lüdeke, Gabriel Durán Cardenás, Wojtek Hajdas, Jukka Jaatinen, Heikki Kettunen, Christian Poivey, Mikko Rossi, Bendy Tanios, Stergiani Marina Vogiatzi, Arto Javanainen

المصدر: IEEE Transactions on Nuclear Science. 70:667-677

مصطلحات موضوعية: Nuclear and High Energy Physics, Nuclear Energy and Engineering, Electrical and Electronic Engineering

الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::17019ace15a05039b9d83b71ecda1a23Test
https://doi.org/10.1109/tns.2023.3255008Test

المؤلفون: Arto Javanainen

المساهمون: Kettunen, Heikki

مصطلحات موضوعية: Radiation effects, RADEF, JYFL, European Space Agency, Heavy ions, Protons, Electrons

العلاقة: https://zenodo.org/communities/jyuTest; https://zenodo.org/record/3672433Test; https://doi.org/10.5281/zenodo.3672433Test; oai:zenodo.org:3672433

الإتاحة: https://doi.org/10.5281/zenodo.3672433Test
https://doi.org/10.5281/zenodo.3672432Test
https://zenodo.org/record/3672433Test

المؤلفون: Andrea Coronetti, Rubén García Alía, David Lucsanyi, Jialei Wang, Frédéric Saigné, Arto Javanainen, Paul Leroux, Jeffrey Prinzie

مصطلحات موضوعية: Nuclear and High Energy Physics, protonit, protons, ionit, ionisoiva säteily, scattering, neutrons, energiansiirto, Monte-Carlo simulations, neutronit, muistit (tietotekniikka), proton direct ionization, Monte Carlo -menetelmät, Nuclear Energy and Engineering, random access memory, trajectory, delta-rays, Nuclear Physics - Experiment, single event upsets, Electrical and Electronic Engineering, liike-energia

وصف الملف: application/pdf; fulltext

الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::633fb6398c879da3a22458240833b7f1Test
https://lirias.kuleuven.be/handle/20.500.12942/710576Test

المؤلفون: Charalambos M. Andreou, Diego Miguel González-Castaño, Simone Gerardin, Marta Bagatin, Faustino Gómez Rodriguez, Alessandro Paccagnella, Alexander V. Prokofiev, Arto Javanainen, Ari Virtanen, Valentino Liberali, Cristiano Calligaro, Daniel Nahmad, Julius Georgiou

المصدر: Electronics; Volume 8; Issue 5; Pages: 562

مصطلحات موضوعية: analog single-event transient (ASET), bandgap voltage reference (BGR), CMOS analog integrated circuits, gamma-rays, heavy-ions, ionization, protons, radiation hardening by design (RHBD), reference circuits, single-event effects (SEE), space electronics, total ionization dose (TID), voltage reference, X-rays

وصف الملف: application/pdf

العلاقة: Microelectronics; https://dx.doi.org/10.3390/electronics8050562Test

الإتاحة: https://doi.org/10.3390/electronics8050562Test

المؤلفون: Corinna Martinella, Marianne Etzelmüller Bathen, Arto Javanainen, Ulrike Grossner

مصطلحات موضوعية: säteilyfysiikka, Mechanics of Materials, puolijohteet, Mechanical Engineering, ionisoiva säteily, transistorit, General Materials Science, Condensed Matter Physics, elektroniikkakomponentit

وصف الملف: application/pdf; fulltext

الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::50e4e0a8044746e6fd66cf139f91d4c9Test
http://urn.fi/URN:NBN:fi:jyu-202307064411Test

المؤلفون: Lucas Matana Luza, Arto Javanainen, Wilfrid Farabolini, Antonio Gilardi, Christian Poivey, Luigi Dilillo, Daniel Soderstrom, Heikki Kettunen, Andrea Coronetti

المساهمون: University of Jyväskylä (JYU), TEST (TEST), Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier (LIRMM), Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM), European Organization for Nuclear Research (CERN), Dipartimento di Ingegneria Elettrica e delle Tecnologie dell'Informazione [Napoli] (DIETI), Università degli studi di Napoli Federico II, European Space Agency (ESA), European Project: 721624,RADSAGA, Department of Physics [Jyväskylä Univ] (JYU), CERN [Genève], Dilillo, Luigi, Test and dEpendability of microelectronic integrated SysTems (TEST), Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS), University of Naples Federico II = Università degli studi di Napoli Federico II, Agence Spatiale Européenne = European Space Agency (ESA)

المصدر: IEEE Transactions on Nuclear Science
IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2021, 68 (5), pp.716-723. ⟨10.1109/TNS.2021.3068186⟩
IEEE Nuclear and Space Radiation Effects Conference (NSREC 2020)
IEEE Nuclear and Space Radiation Effects Conference (NSREC 2020), Nov 2020, Santa Fe (virtual), United States
IEEE Transactions on Nuclear Science, 2021, 68 (5), pp.716-723. ⟨10.1109/TNS.2021.3068186⟩

مصطلحات موضوعية: Nuclear and High Energy Physics, [SPI.NANO] Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, käyttömuistit, Hardware_PERFORMANCEANDRELIABILITY, Electron, Radiation, elektronit, 01 natural sciences, Jovian, elektroniikkakomponentit, Electron radiation, Jupiter, electron radiation, 0103 physical sciences, Radiative transfer, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, Electrical and Electronic Engineering, avaruustekniikka, Physics, Hardware_MEMORYSTRUCTURES, Large Hadron Collider, 010308 nuclear & particles physics, ionisoiva säteily, stuck bits, [SPI.TRON] Engineering Sciences [physics]/Electronics, [INFO.INFO-ES] Computer Science [cs]/Embedded Systems, total ionizing dose, [SPI.TRON]Engineering Sciences [physics]/Electronics, Computational physics, säteilyfysiikka, Nuclear Energy and Engineering, radiation effects, single event upsets, [INFO.INFO-ES]Computer Science [cs]/Embedded Systems, Node (circuits), Random access

وصف الملف: application/pdf; fulltext

الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::7e4c57ed03fc27531c154016b10f17daTest
https://doi.org/10.1109/tns.2021.3068186Test

المؤلفون: Arto Javanainen, C. Martinella, R. Gaillard, Roger Stark, Yacine Kadi, Maria Kastriotou, Carlo Cazzaniga, Andrea Coronetti, Ruben Garcia Alia, Ulrike Grossner

المصدر: IEEE Transactions on Nuclear Science, 68 (5)
IEEE Transactions on Nuclear Science

مصطلحات موضوعية: Nuclear and High Energy Physics, Materials science, power MOSFETs, 01 natural sciences, 7. Clean energy, elektroniikkakomponentit, Stress (mechanics), chemistry.chemical_compound, Reliability (semiconductor), silicon carbide, puolijohteet, 0103 physical sciences, MOSFET, Silicon carbide, Electrical and Electronic Engineering, Power MOSFET, Silicon Carbide, Power MOSFETs, neutrons, Single Event Effects, Single Event Burnout, gate damage, single event burnout, Leakage (electronics), 010308 nuclear & particles physics, business.industry, neutronit, single event effects, säteilyfysiikka, Nuclear Energy and Engineering, chemistry, Logic gate, Trench, transistorit, Optoelectronics, Other, business

وصف الملف: application/application/pdf; application/pdf; fulltext

الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::3ee1e2df61ae728c8447cb3d13e32e93Test
https://doi.org/10.1109/tns.2021.3065122Test