المؤلفون: Hemant Tiwari, Om Prakash, Bhavin Solanki, Jay K Sheth, Bhavin Joshi, Mina Kadam, Sheetal Vyas, Aparajita Shukla, Sanjay Rathod, Anil Rajput, Toral Trivedi, Vaibhav Ramanuj, Anand Solanki

المصدر: BMJ Open, Vol 11, Iss 1 (2021)

مصطلحات موضوعية: Medicine

وصف الملف: electronic resource

العلاقة: https://bmjopen.bmj.com/content/11/1/e044101.fullTest; https://doaj.org/toc/2044-6055Test

الوصول الحر: https://doaj.org/article/433b4a3d5e654c1391f113b7bc6a1b0bTest

المؤلفون: Akhil Anil Rajput, Ali Mostafavi

المصدر: Scientific Reports, Vol 13, Iss 1, Pp 1-14 (2023)

مصطلحات موضوعية: Medicine, Science

وصف الملف: electronic resource

العلاقة: https://doaj.org/toc/2045-2322Test

الوصول الحر: https://doaj.org/article/5b929ad6e75d4cee8559ae55a7875472Test

المؤلفون: Akhil Anil Rajput, Qingchun Li, Xinyu Gao, Ali Mostafavi

المصدر: Frontiers in Built Environment, Vol 7 (2022)

مصطلحات موضوعية: COVID-19, human mobility, multi-dataset, public transport, New York City, Engineering (General). Civil engineering (General), TA1-2040, City planning, HT165.5-169.9

العلاقة: https://www.frontiersin.org/articles/10.3389/fbuil.2021.654409/fullTest; https://doaj.org/toc/2297-3362Test; https://doaj.org/article/56d06ac86da54377a2f6ea0085a81bbeTest

الإتاحة: https://doi.org/10.3389/fbuil.2021.654409Test
https://doaj.org/article/56d06ac86da54377a2f6ea0085a81bbeTest

المؤلفون: Pramod Kumar Gupta, Anil Rajput, Manshree Mishra, Biswajeet Mukherjee

المصدر: Electromagnetics. 43:163-174

مصطلحات موضوعية: Radiation, Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials

الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::e02b6eb6d723d52babb19eb7d195cd95Test
https://doi.org/10.1080/02726343.2023.2206264Test

المؤلفون: anil rajput (11470996), Manisha Pattanaik (11505087), Gaurav Kaushal (11505085)

مصطلحات موضوعية: Components, Circuits, Devices and Systems, In-Memory Computation, Compute disturbance, SRAM, BCAM, Energy-Efficiency

العلاقة: https://figshare.com/articles/preprint/Local_Bit-Line_Sharing_Robust_Dual-Port_8T_SRAM_With_Virtual_VSS_for_Energy-Efficient_In-Memory_Computing_Architecture/16704805Test

الإتاحة: https://doi.org/10.36227/techrxiv.16704805.v1Test

المؤلفون: Vusa Lakshmi Parvathi, Anil Rajput, Rajesh B. Raut, Biswajeet Mukherjee

المصدر: Microwave and Optical Technology Letters.

مصطلحات موضوعية: Electrical and Electronic Engineering, Condensed Matter Physics, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials

الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::6341dc8846fdc864a0b5cb29a3e2b291Test
https://doi.org/10.1002/mop.33739Test

المؤلفون: null Sanghmitra, Anil Rajput, Biswajeet Mukherjee, Pragati Patel

المصدر: Electromagnetics. 42:157-167

مصطلحات موضوعية: Radiation, Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials

الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::51f12b202bca943cd74d666ccea049c6Test
https://doi.org/10.1080/02726343.2022.2085894Test

المؤلفون: Biswajeet Mukherjee, Anil Rajput

المصدر: IEEE Journal of Radio Frequency Identification. 6:534-539

مصطلحات موضوعية: Computer Networks and Communications, Instrumentation

الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::0c3b7ef14fff375315edeb09288d9a51Test
https://doi.org/10.1109/jrfid.2022.3202364Test

المؤلفون: Manshree Mishra, Anil Rajput, Pramod Kumar Gupta, Biswajeet Mukherjee

المصدر: Progress In Electromagnetics Research C. 126:77-90

مصطلحات موضوعية: Electronic, Optical and Magnetic Materials

الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::d915e9d992b910d1551599a13c4cfa1aTest
https://doi.org/10.2528/pierc22091402Test

المؤلفون: Vusa Lakshmi Parvathi, Anil Rajput, Rajesh B. Raut, Biswajeet Mukherjee

المصدر: Electromagnetics. 41:570-580

مصطلحات موضوعية: Radiation, Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials

الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::e1b15088686e92c25cee8d1c487c5293Test
https://doi.org/10.1080/02726343.2022.2031158Test