المؤلفون: Alessandri, Cristobal, Abusleme, Angel, Guzman, Dani, Passalacqua, Ignacio, Alvarez-Fontecilla, Enrique, Guarini, Marcelo

المصدر: MNRAS (January 11, 2016) Vol. 455 1443-1450

مصطلحات موضوعية: Astrophysics - Instrumentation and Methods for Astrophysics

الوصول الحر: http://arxiv.org/abs/1511.05649Test

المؤلفون: Alvarez-Fontecilla, Enrique, Wilkins, Paul S., Rose, Steven C.

المصدر: IEEE Circuits & Systems Magazine; 2023 Q4, Vol. 23 Issue 4, p34-43, 10p

المؤلفون: Álvarez Fontecilla, Enrique, Avila, D., Campillo Mecklenburg, Hernán, Abusleme Hoffman, Ángel Christian

مصطلحات موضوعية: Capacitors, Noise, CMOS integrated circuits, Voltage measurement, Voltage control, Equivalent circuits, Switches

وصف الملف: application/pdf

العلاقة: IEEE Latin American Symposium on Circuits and Systems (4° : 2013 : Cuzco, Perú); https://doi.org/10.1109/LASCAS.2013.6518987Test; https://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=6518987Test; https://repositorio.uc.cl/handle/11534/63762Test

الإتاحة: https://doi.org/10.1109/LASCAS.2013.6518987Test
https://repositorio.uc.cl/handle/11534/63762Test
https://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=6518987Test

المؤلفون: Alvarez-Fontecilla, Enrique, Venerus, Christian, Galton, Ian

المساهمون: National Science Foundation

المصدر: IEEE Transactions on Circuits and Systems I: Regular Papers ; volume 65, issue 10, page 3125-3137 ; ISSN 1549-8328 1558-0806

الإتاحة: https://doi.org/10.1109/tcsi.2018.2819024Test
https://ieeexplore.ieee.org/ielaam/8919/8453271/8335808-aam.pdfTest
http://xplorestaging.ieee.org/ielx7/8919/8453271/08335808.pdf?arnumber=8335808Test

المؤلفون: Alvarez Fontecilla, Enrique, Ávila Gárate, Diego, Campillo Mecklenburg, Hernan, Dragone, A., Abusleme Hoffman, Ángel Christian

مصطلحات موضوعية: Noise, Transistors, Mathematical model, Equations, Capacitance, Detectors, Physics

العلاقة: https://doi.org/10.1109/TNS.2012.2208270Test; https://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=6265347Test; https://repositorio.uc.cl/handle/11534/64172Test

الإتاحة: https://doi.org/10.1109/TNS.2012.2208270Test
https://repositorio.uc.cl/handle/11534/64172Test
https://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=6265347Test

المؤلفون: Álvarez Fontecilla, Enrique, Abusleme Hoffman, Ángel Christian

وصف الملف: 8 páginas; application/pdf

العلاقة: https://doi.org/10.1016/j.mejo.2015.06.005Test; https://repositorio.uc.cl/handle/11534/52456Test

الإتاحة: https://doi.org/10.1016/j.mejo.2015.06.005Test
https://repositorio.uc.cl/handle/11534/52456Test

المؤلفون: Avila, D., Álvarez Fontecilla, Enrique, Abusleme Hoffman, Ángel Christian

وصف الملف: 7 páginas; application/pdf

العلاقة: https://doi.org/10.1109/TNS.2013.2283242Test; https://repositorio.uc.cl/handle/11534/50414Test

الإتاحة: https://doi.org/10.1109/TNS.2013.2283242Test
https://repositorio.uc.cl/handle/11534/50414Test

المؤلفون: Alvarez-Fontecilla, Enrique, Helal, Eslam, Eissa, Amr I., Galton, Ian

المساهمون: National Science Foundation

المصدر: IEEE Journal of Solid-State Circuits ; volume 56, issue 10, page 3191-3201 ; ISSN 0018-9200 1558-173X

مصطلحات موضوعية: Electrical and Electronic Engineering

الإتاحة: https://doi.org/10.1109/jssc.2021.3074814Test
https://ieeexplore.ieee.org/ielam/4/9546917/9429704-aam.pdfTest
http://xplorestaging.ieee.org/ielx7/4/9546917/09429704.pdf?arnumber=9429704Test

المؤلفون: Alvarez-Fontecilla, Enrique, Eissa, Amr I., Helal, Eslam, Weltin-Wu, Colin, Galton, Ian

المساهمون: National Science Foundation

المصدر: IEEE Transactions on Circuits and Systems I: Regular Papers ; volume 68, issue 3, page 965-974 ; ISSN 1549-8328 1558-0806

مصطلحات موضوعية: Electrical and Electronic Engineering

الإتاحة: https://doi.org/10.1109/tcsi.2020.3040346Test
https://ieeexplore.ieee.org/ielam/8919/9352589/9301362-aam.pdfTest
http://xplorestaging.ieee.org/ielx7/8919/9352589/09301362.pdf?arnumber=9301362Test

المؤلفون: Helal, Eslam, Alvarez-Fontecilla, Enrique, Eissa, Amr I., Galton, Ian

المساهمون: National Science Foundation

المصدر: IEEE Journal of Solid-State Circuits ; volume 56, issue 9, page 2711-2723 ; ISSN 0018-9200 1558-173X

مصطلحات موضوعية: Electrical and Electronic Engineering

الإتاحة: https://doi.org/10.1109/jssc.2020.3048650Test
https://ieeexplore.ieee.org/ielam/4/9523417/9344827-aam.pdfTest
http://xplorestaging.ieee.org/ielx7/4/9523417/09344827.pdf?arnumber=9344827Test