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1
المؤلفون: Andreh Fiterz, Michael Onofre, Mary Sarkisian, Maria Shibatsuji, Dro Amirian, Salma Soltani, Shelley Thai, Brenda Dimaya, Nora Garabedian, Maria Vardapetyan, Roberto A. Hernández, Fabrizio Billi, Andrew Ovakimyan, Emily Burnett, Martin Zakarian, Hassan Abdulla, Ashley Arnell, Luke Butcher, Ania Shirvanian, Allison Garcia, Zade Hikmat, Artin Bazikyan, Matthew Wada, Michelle R. Lum, Cuauhtemoc Ramirez, Nathan Brandt, Thuthiri T. Lwin, Ryan Toan Ngo, Luiza Barseghyan, Firas Hikmat, Aaron Kavanaugh, Jeanine Naegle, Xavier Munoz, Adan Escamilla, Jennifer Ngoc Pham
المصدر: Journal of Bacteriology. 203
مصطلحات موضوعية: Genetics, Regulation of gene expression, Operon, Biofilm, Flagellum, Biology, medicine.disease_cause, biology.organism_classification, Microbiology, Burkholderia, Gene expression, medicine, Molecular Biology, Escherichia coli, Gene
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::5d155938a871afc7b2fc2896f1289630Test
https://doi.org/10.1128/jb.00293-21Test -
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المؤلفون: Olga Grjasnowa, Allison Garcia
المصدر: Transit. 12
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::ba83771d2d08024982460ffc3f02f178Test
https://doi.org/10.5070/t7122047482Test -
3
المؤلفون: Ahmet C. Sabuncu, Allison Garcia
المصدر: SMU Journal of Undergraduate Research. 4
مصطلحات موضوعية: Electric power system, Materials science, Impedance Converter, Acoustics, Bioelectric Impedance
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::13cff68f58c20d4eec9d20efa5bd384aTest
https://doi.org/10.25172/jour.4.1.3Test -
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المؤلفون: Soha Alhelaly, Allison Garcia, Geoff Shofner, Jennifer Dworak, Fanchen Zhang, LeRoy Winemberg, Daphne Hwong, Yi Sun
المصدر: ITC
مصطلحات موضوعية: Engineering, business.industry, Real-time computing, Probabilistic logic, Test compression, Hardware_PERFORMANCEANDRELIABILITY, 02 engineering and technology, Automatic test pattern generation, FLOPS, Fault detection and isolation, 020202 computer hardware & architecture, Test set, Fault coverage, 0202 electrical engineering, electronic engineering, information engineering, Overhead (computing), 020201 artificial intelligence & image processing, business, Algorithm
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::e79dca03e164e6340eb1584daa1adabcTest
https://doi.org/10.1109/test.2016.7805828Test -
5دورية أكاديمية
المؤلفون: Costa, Allison Garcia
العلاقة: Revista Tributária e de Finanças Públicas: RTrib, v. 13, n. 63, p. 82-91, jul./ago. 2005.; http://bdjur.stj.jus.br/dspace/handle/2011/88455Test