المؤلفون: Abedzadeh, Navid

مرشدي الرسالة: Berggren, Karl K., Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science

وصف الملف: application/pdf

الإتاحة: https://hdl.handle.net/1721.1/144870Test

المؤلفون: Abedzadeh, Navid, Krielaart, M. A. R., Kim, Chung-Soo, Simonaitis, John, Hobbs, Richard, Kruit, Pieter, Berggren, Karl K.

مصطلحات موضوعية: Physics - Applied Physics

الوصول الحر: http://arxiv.org/abs/2012.09902Test

المؤلفون: Abedzadeh, Navid

مرشدي الرسالة: Karl K. Berggren., Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science.

مصطلحات موضوعية: Electrical Engineering and Computer Science.

وصف الملف: 70 pages; application/pdf

الإتاحة: http://hdl.handle.net/1721.1/115627Test

المؤلفون: Burgess, Ian B., Abedzadeh, Navid, Kay, Theresa M., Shneidman, Anna V., Cranshaw, Derek J., Loncar, Marko, Aizenberg, Joanna

مصطلحات موضوعية: Physics - Optics

الوصول الحر: http://arxiv.org/abs/1505.07845Test

المؤلفون: Abedzadeh, Navid, Krielaart, MAR, Kim, Chung-Soo, Simonaitis, John, Hobbs, Richard, Kruit, Pieter, Berggren, Karl K

المساهمون: Massachusetts Institute of Technology. Research Laboratory of Electronics

المصدر: Other Repository

وصف الملف: application/pdf

العلاقة: Ultramicroscopy; https://hdl.handle.net/1721.1/142775Test; Abedzadeh, Navid, Krielaart, MAR, Kim, Chung-Soo, Simonaitis, John, Hobbs, Richard et al. 2021. "Electrostatic electron mirror in SEM for simultaneous imaging of top and bottom surfaces of a sample." Ultramicroscopy, 226.

الإتاحة: https://hdl.handle.net/1721.1/142775Test

المؤلفون: Khodadad, Iman, Abedzadeh, Navid, Lakshminarayan, Vasudevan, Saini, Simarjeet S.

المصدر: SPIE Proceedings ; Education and Training in Optics and Photonics: ETOP 2015 ; ISSN 0277-786X

الإتاحة: https://doi.org/10.1117/12.2223241Test

المؤلفون: Burgess, Ian B., Abedzadeh, Navid, Kay, Theresa M., Shneidman, Anna V., Cranshaw, Derek J., Lončar, Marko, Aizenberg, Joanna

المصدر: Scientific Reports ; volume 6, issue 1 ; ISSN 2045-2322

مصطلحات موضوعية: Multidisciplinary

الإتاحة: https://doi.org/10.1038/srep19542Test
https://www.nature.com/articles/srep19542.pdfTest
https://www.nature.com/articles/srep19542Test

المؤلفون: Abedzadeh, Navid (author), Krielaart, M.A.R. (author), Kim, Chung Soo (author), Simonaitis, John (author), Hobbs, Richard (author), Kruit, P. (author), Berggren, Karl K. (author)

مصطلحات موضوعية: Aberration correction, Electron mirror, In-situ SEM, SEM

العلاقة: http://www.scopus.com/inward/record.url?scp=85105356036&partnerID=8YFLogxKTest; Ultramicroscopy--0304-3991--85229c45-34ca-4b92-9480-f0ec825ae8dd; http://resolver.tudelft.nl/uuid:6c4223c1-10e0-4df2-bd52-b8eb7aefafedTest; https://doi.org/10.1016/j.ultramic.2021.113304Test

الإتاحة: https://doi.org/10.1016/j.ultramic.2021.113304Test
http://resolver.tudelft.nl/uuid:6c4223c1-10e0-4df2-bd52-b8eb7aefafedTest

المؤلفون: Khorasaninejad, Mohammadreza^1,2, Abedzadeh, Navid², Singh Jawanda, Ajayinder³, O, Nixon⁴, Anantram, M. P.⁵, Singh Saini, Simarjeet^1,2

المصدر: Journal of Applied Physics. Feb2012, Vol. 111 Issue 4, p044328. 5p. 5 Black and White Photographs, 2 Graphs.

مصطلحات موضوعية: *NANOWIRES, *SILICON research, *MATHEMATICAL models, *WAVEGUIDES, *DETECTORS

المؤلفون: Toomey, Emily, Colangelo, Marco, Abedzadeh, Navid, Berggren, Karl K.

المصدر: Journal of Vacuum Science & Technology: Part B-Nanotechnology & Microelectronics; Nov2018, Vol. 36 Issue 6, pN.PAG-N.PAG, 6p

مصطلحات موضوعية: SUPERCONDUCTING films, THIN film devices, NANOWIRES, ELECTRON beam lithography, NIOBIUM nitride, SURFACE chemistry, NANOELECTROMECHANICAL systems