المؤلفون: Wei, B.J., 呂福興, Cheng, Y.L., Lu, F.H., Chiu, T.J., Shih, H.C.

العلاقة: #PLACEHOLDER_PARENT_METADATA_VALUE#; Journal of Vacuum Science & Technology A; Journal of Vacuum Science & Technology A, Volume 29, Issue 4.; http://dx.doi.org/10.1116/1.3592888Test; http://hdl.handle.net/11455/43407Test

الإتاحة: https://doi.org/10.1116/1.3592888Test
http://hdl.handle.net/11455/43407Test

المؤلفون: Chieh, Y.C., 呂福興, Lu, F.H.

العلاقة: #PLACEHOLDER_PARENT_METADATA_VALUE#; Journal of Nanoscience and Nanotechnology; Journal of Nanoscience and Nanotechnology, Volume 11, Issue 3, Page(s) 2376-2383.; http://dx.doi.org/10.1166/jnn.2011.3151Test; http://hdl.handle.net/11455/43398Test

الإتاحة: https://doi.org/10.1166/jnn.2011.3151Test
http://hdl.handle.net/11455/43398Test

المؤلفون: Chan, M.H., 呂福興, Lu, F.H.

مصطلحات موضوعية: Titanium oxynitride films, Air, Sputtering, X-ray photoelectron, spectroscopy (XPS), thin-films, nitride, coatings

العلاقة: #PLACEHOLDER_PARENT_METADATA_VALUE#; Thin Solid Films; Thin Solid Films, Volume 517, Issue 17, Page(s) 5006-5009.; http://dx.doi.org/10.1016/j.tsf.2009.03.100Test; http://hdl.handle.net/11455/43456Test

الإتاحة: https://doi.org/10.1016/j.tsf.2009.03.100Test
http://hdl.handle.net/11455/43456Test

المؤلفون: Lu, C.D., 呂福興, Chang, L.S., Lu, Y.F., Lu, F.H., 張立信

مصطلحات موضوعية: Joining, Interfaces, Microstructure-final, TiO(2), Bi(2)O(3), ceramics

العلاقة: #PLACEHOLDER_PARENT_METADATA_VALUE#; Ceramics International; Ceramics International, Volume 35, Issue 7, Page(s) 2699-2704.; http://dx.doi.org/10.1016/j.ceramint.2009.03.001Test; http://hdl.handle.net/11455/43458Test

الإتاحة: https://doi.org/10.1016/j.ceramint.2009.03.001Test
http://hdl.handle.net/11455/43458Test

المؤلفون: Chieh, Y.C., 呂福興, Chang, C.C., Lai, Y.L., Lu, F.H.

مصطلحات موضوعية: Chromium nitride, Electrochemical stripping, Cathodic arc deposition, Magnetron sputtering, high-temperature oxidation, chromium nitride coatings, hard coatings, pvd-coatings, reduction, behavior, cr(vi), steels, arc, tin

العلاقة: #PLACEHOLDER_PARENT_METADATA_VALUE#; Surface & Coatings Technology; Surface & Coatings Technology, Volume 203, Issue 12, Page(s) 1709-1714.; http://dx.doi.org/10.1016/j.surfcoat.2009.01.001Test; http://hdl.handle.net/11455/43433Test

الإتاحة: https://doi.org/10.1016/j.surfcoat.2009.01.001Test
http://hdl.handle.net/11455/43433Test

المؤلفون: Lu, F.H., 呂福興, Jiang, B.F., Lo, J.L., Chan, M.H.

مصطلحات موضوعية: atmosphere, gas

العلاقة: #PLACEHOLDER_PARENT_METADATA_VALUE#; Journal of Materials Research; Journal of Materials Research, Volume 24, Issue 7, Page(s) 2400-2408.; http://dx.doi.org/10.1557/jmr.2009.0288Test; http://hdl.handle.net/11455/43394Test

الإتاحة: https://doi.org/10.1557/jmr.2009.0288Test
http://hdl.handle.net/11455/43394Test

المؤلفون: Lu, F.H., 呂福興, Tsai, H.D., Chieh, Y.C.

مصطلحات موضوعية: plasma oxidation, Al thin films, alumina, kinetics, frequency oxygen plasma, thermal-oxidation, aluminum, coatings

العلاقة: #PLACEHOLDER_PARENT_METADATA_VALUE#; Thin Solid Films; Thin Solid Films, Volume 516, Issue 8, Page(s) 1871-1876.; http://dx.doi.org/10.1016/j.tsf.2007.09.049Test; http://hdl.handle.net/11455/43447Test

الإتاحة: https://doi.org/10.1016/j.tsf.2007.09.049Test
http://hdl.handle.net/11455/43447Test

المؤلفون: Wei, B.J., 呂福興, Cheng, Y.L., Wang, Y.L., Lu, F.H., Shih, H.C.

مصطلحات موضوعية: fluorosilicate glass, stability

العلاقة: #PLACEHOLDER_PARENT_METADATA_VALUE#; Journal of Vacuum Science & Technology A; Journal of Vacuum Science & Technology A, Volume 26, Issue 3, Page(s) 481-484.; http://dx.doi.org/10.1116/1.2905251Test; http://hdl.handle.net/11455/43411Test

الإتاحة: https://doi.org/10.1116/1.2905251Test
http://hdl.handle.net/11455/43411Test

المؤلفون: Lin, C.Y., 呂福興, Lu, F.H.

مصطلحات موضوعية: AIN, thin films, oxidation, Al2O3, phase changes, microstructure, aln thin-films, aluminum nitride, kinetics, degradation, substrate

العلاقة: #PLACEHOLDER_PARENT_METADATA_VALUE#; Journal of the European Ceramic Society; Journal of the European Ceramic Society, Volume 28, Issue 3, Page(s) 691-698.; http://dx.doi.org/10.1016/j.jeurceramsoc.2007.07.015Test; http://hdl.handle.net/11455/43403Test

الإتاحة: https://doi.org/10.1016/j.jeurceramsoc.2007.07.015Test
http://hdl.handle.net/11455/43403Test

المؤلفون: Chieh, Y.C., 呂福興, Lu, F.H.

مصطلحات موضوعية: nanostructures, thin films, defects, diffusion, computer-simulation, impurity diffusion, concentrated alloy, tracer, cation diffusion, range order, long-range

العلاقة: #PLACEHOLDER_PARENT_METADATA_VALUE#; Journal of Physics and Chemistry of Solids; Journal of Physics and Chemistry of Solids, Volume 69, Issue 2-3, Page(s) 315-319.; http://dx.doi.org/10.1016/j.jpcs.2007.07.025Test; http://hdl.handle.net/11455/43400Test

الإتاحة: https://doi.org/10.1016/j.jpcs.2007.07.025Test
http://hdl.handle.net/11455/43400Test