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المؤلفون: G. Pavia, Giovanna Scarel, Luca Lamagna, Marco Fanciulli
المصدر: Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 27:443-448
مصطلحات موضوعية: Materials science, Silicon, business.industry, Layer by layer, Analytical chemistry, chemistry.chemical_element, Germanium, Surfaces and Interfaces, Condensed Matter Physics, Surfaces, Coatings and Films, Atomic layer deposition, chemistry, Transmission electron microscopy, Atomic layer epitaxy, Optoelectronics, Microelectronics, business, Layer (electronics)
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::fa61806da813f2b657cc6fc53a5edc33Test
https://doi.org/10.1116/1.3097849Test -
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المؤلفون: F. Cazzaniga, G. Pavia, A. G. Mauri, F. Sammiceli, M. Mariani, M. L. Polignano, G. Spoldi, I. Mica, V. Bontempo
المصدر: Journal of Materials Science: Materials in Electronics. 19:182-188
مصطلحات موضوعية: Materials science, Silicon, business.industry, Annealing (metallurgy), chemistry.chemical_element, Condensed Matter Physics, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials, Ion implantation, chemistry, Shallow trench isolation, Trench, Forensic engineering, Optoelectronics, Wafer, Electrical measurements, Kinetic Monte Carlo, Electrical and Electronic Engineering, business
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::86e8dd24ab0c78002f98f32abd0685cfTest
https://doi.org/10.1007/s10854-008-9630-4Test -
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المؤلفون: Jan Willem Maes, Claudia Scozzari, Mauro Alessandri, Massimo Caniatti, Gabriella Ghidini, Alessandro Sebastiani, S. Grasso, Rossella Piagge, G. Pavia, Enrica Ravizza, Francesca Sammiceli, Annalisa Del Vitto, Christophe F. Pomarede, Simona Spadoni, Claudia Wiemer
المصدر: ECS Transactions. 11:497-508
مصطلحات موضوعية: Flash (photography), Materials science, business.industry, Electronic engineering, Optoelectronics, Dielectric, business
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::bd6da334aab53444e27bd0eeffa58e57Test
https://doi.org/10.1149/1.2779585Test -
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المؤلفون: Sabina Spiga, Giorgia M. Lopez, Alberto Modelli, Marco Fanciulli, Claudia Wiemer, Alessandro Sebastiani, Rossella Piagge, Massimo Caniatti, Vincenzo Fiorentini, Enrica Ravizza, Enrico Bellandi, G. Pavia, Mauro Alessandri, Gabriella Ghidini, Emiliano Cadelano, S. Alberici
المصدر: ECS Transactions. 1:91-105
مصطلحات موضوعية: Flash (photography), Materials science, business.industry, Optoelectronics, business, High-κ dielectric
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::9abd3193f1d7724c56b10e28c8d61d55Test
https://doi.org/10.1149/1.2209258Test -
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المؤلفون: Gian Pietro Carnevale, F. Cazzaniga, I. Mica, G. Pavia, M. Martinelli, P Ghezzi, M. L. Polignano, Emiliano Bonera, M. Brambilla
المساهمون: Mica, I, Polignano, M, Carnevale, G, Ghezzi, P, Brambilla, M, Cazzaniga, F, Martinelli, M, Pavia, G, Bonera, E
المصدر: Journal of Physics: Condensed Matter. 14:13403-13410
مصطلحات موضوعية: Materials science, Fabrication, Silicon, business.industry, Transistor, Recrystallization (metallurgy), Mineralogy, chemistry.chemical_element, Condensed Matter Physics, Crystal defect, junction propertie, Crystallographic defect, ULSI, law.invention, Ion implantation, chemistry, Electron diffraction, law, Transmission electron microscopy, Optoelectronics, General Materials Science, business
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::5ade8d85318b3428324db53c8d1d6540Test
https://doi.org/10.1088/0953-8984/14/48/395Test -
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المؤلفون: G. F. Mastracchio, Roberto Balboni, A. Benedetti, A. G. Cullis, Stefano Frabboni, Aldo Armigliato, G. Pavia
المصدر: Applied surface science 188 (2002): 214–218. doi:10.1016/S0169-4332(01)00750-4
info:cnr-pdr/source/autori:Benedetti A., Cullis A.G., Armigliato A., Balboni R., Frabboni S., Mastracchio G.F., Pavia G./titolo:Strain induced by Ti salicidation in sub-quarter-micron CMOS devices, as measured by TEM%2FCBED/doi:10.1016%2FS0169-4332(01)00750-4/rivista:Applied surface science/anno:2002/pagina_da:214/pagina_a:218/intervallo_pagine:214–218/volume:188مصطلحات موضوعية: convergent beam electron diffraction, salicidation, Microscope, Materials science, Silicon, General Physics and Astronomy, Mineralogy, chemistry.chemical_element, shallow trenches, law.invention, strain, law, transmission electron microscopy, Ohmic contact, business.industry, Zone axis, Surfaces and Interfaces, General Chemistry, Condensed Matter Physics, Surfaces, Coatings and Films, CMOS, Electron diffraction, chemistry, Transmission electron microscopy, Optoelectronics, business, Tin
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::163548d4f88fae591371c1821da65f8aTest
https://doi.org/10.1016/s0169-4332Test(01)00750-4 -
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المؤلفون: F. Pellizzer, G. Pavia
المصدر: Journal of Non-Crystalline Solids. 280:235-240
مصطلحات موضوعية: Materials science, business.industry, Extraction (chemistry), Electrical Evaluation, Oxide, Nanotechnology, Quantum Hall effect, Condensed Matter Physics, Capacitance, Electronic, Optical and Magnetic Materials, chemistry.chemical_compound, chemistry, Transmission electron microscopy, Materials Chemistry, Ceramics and Composites, Optoelectronics, business, Voltage
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::6b4029f65c40893e2ddd3f38449fdf14Test
https://doi.org/10.1016/s0022-3093Test(00)00391-4 -
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المؤلفون: Maddalena Pedio, Marco Malvestuto, Stefano Nannarone, Federico Boscherini, Giovanna Scarel, Marco Fanciulli, G. Pavia
المساهمون: M. Malvestuto, M. Pedio S. Nannarone, G. Pavia, G. Scarel, M. Fanciulli, F. Boscherini
المصدر: Journal of applied physics 101 (2007).
info:cnr-pdr/source/autori:Malvestuto, M; Pedio, M; Nannarone, S; Pavia, G; Scarel, G; Fanciulli, M; Boscherini, F/titolo:A study of the growth of Lu2O3 on Si(001) by synchrotron radiation photoemission and transmission electron microscopy/doi:/rivista:Journal of applied physics/anno:2007/pagina_da:/pagina_a:/intervallo_pagine:/volume:101مصطلحات موضوعية: Materials science, Silicon, business.industry, Band gap, CORE-LEVEL, Analytical chemistry, General Physics and Astronomy, Synchrotron radiation, chemistry.chemical_element, surface physics, Dielectric, Electronic structure, ATOMIC-LAYER DEPOSITION, Capacitance, chemistry, Transmission electron microscopy, EPITAXIAL-GROWTH, SYNCHROTRON RADIATION, Optoelectronics, MICROELECTRONICS, BAND OFFSETS, PRASEODYMIUM OXIDE, business, INTERFACES, Quantum tunnelling
وصف الملف: STAMPA
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::8f7d2a675003cb2e9d0e60d6b42e22d3Test
https://hdl.handle.net/11380/743060Test -
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المؤلفون: Domenico Caputo, Maria Luisa Polignano, Federica Zanderigo, G. Pavia
المصدر: Solid State Phenomena. :413-420
مصطلحات موضوعية: Materials science, Silicon, chemistry, business.industry, Optoelectronics, chemistry.chemical_element, General Materials Science, Carrier lifetime, Contamination, Condensed Matter Physics, business, Atomic and Molecular Physics, and Optics
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::a81043ce85f621f0a1832fae7e1e8ba9Test
https://doi.org/10.4028/www.scientific.net/ssp.63-64.413Test -
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المؤلفون: A. G. Cullis, Aldo Armigliato, G. Pavia, A. Benedetti, Roberto Balboni, Stefano Frabboni
المصدر: ResearcherID
Microscopy of Semiconducting Materials 2001 ISBN: 9781351074629مصطلحات موضوعية: Materials science, convergent beam electron diffraction, Silicon, chemistry, Strain (chemistry), business.industry, Transmission electron microscopy, transmission electron microscopy, chemistry.chemical_element, Optoelectronics, strain measurements, business
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::6a5ddaec732204487ea03332bc19e4f6Test
https://hdl.handle.net/11380/5819Test