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1
المؤلفون: Yifu Huang, Yuqian Gu, Yao-Feng Chang, Ying-Chen Chen, Deji Akinwande, Jack C. Lee
المصدر: IEEE Transactions on Electron Devices. 70:1676-1681
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::70af3e8583258d985e30394bd70d83e3Test
https://doi.org/10.1109/ted.2023.3249139Test -
2
المؤلفون: Yifu Huang, Reed Hopkins, David Janosky, Ying-Chen Chen, Yao-Feng Chang, Jack C. Lee
المصدر: IEEE Transactions on Electron Devices. 69:6102-6105
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::e5a52e1ce70bc4fd8155c6e269a5f98fTest
https://doi.org/10.1109/ted.2022.3207710Test -
3
المؤلفون: Chih-Yang Lin, Jack C. Lee, Ying-Chen Chen
المصدر: IEEE Transactions on Electron Devices. 68:4363-4367
مصطلحات موضوعية: Resistive touchscreen, Hardware_MEMORYSTRUCTURES, Selection (relational algebra), Computer science, Memristor, Electronic, Optical and Magnetic Materials, law.invention, Resistive random-access memory, Non-volatile memory, Memory management, Neuromorphic engineering, law, Electronic engineering, Electrical and Electronic Engineering, Voltage
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::55c3a6b4c84ef349bc1b3e8fc70b9e05Test
https://doi.org/10.1109/ted.2021.3095438Test -
4
المؤلفون: Yao-Feng Chang, Burt Fowler, Ying-Chen Chen, Earl E. Swartzlander, Lauren Guckert, Fei Zhou, Jack C. Lee, Cheng-Chih Hsieh
المصدر: IEEE Transactions on Electron Devices. 64:2977-2983
مصطلحات موضوعية: Adder, Pass transistor logic, Computer science, Hardware_PERFORMANCEANDRELIABILITY, 02 engineering and technology, Memristor, 01 natural sciences, law.invention, law, 0103 physical sciences, Hardware_INTEGRATEDCIRCUITS, Electronic engineering, Electrical and Electronic Engineering, 010302 applied physics, Hardware_MEMORYSTRUCTURES, business.industry, Electrical engineering, 021001 nanoscience & nanotechnology, Electronic, Optical and Magnetic Materials, Resistive random-access memory, Integrated injection logic, Memistor, CMOS, Logic gate, 0210 nano-technology, business, Hardware_LOGICDESIGN
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::7306bddc3fb4eea13d5595e94c9ce6dfTest
https://doi.org/10.1109/ted.2017.2699679Test -
5
المؤلفون: Fred C. Lee, Xiucheng Huang, Qiang Li, Zhengyang Liu
المصدر: IEEE Transactions on Electron Devices. 62:270-277
مصطلحات موضوعية: Materials science, business.industry, Electrical engineering, Gallium nitride, High voltage, Electronic, Optical and Magnetic Materials, law.invention, Capacitor, chemistry.chemical_compound, chemistry, law, MOSFET, Parasitic element, Boost converter, Hardware_INTEGRATEDCIRCUITS, Cascode, Electrical and Electronic Engineering, business, Voltage
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::1ce19c79ace4370974344a13ee8f1d7eTest
https://doi.org/10.1109/ted.2014.2358534Test -
6
المؤلفون: Fei Zhou, Fei Xue, Yao-Feng Chang, Yanzhen Wang, Aiting Jiang, Jack C. Lee, Yen-Ting Chen
المصدر: IEEE Transactions on Electron Devices. 61:2332-2337
مصطلحات موضوعية: Materials science, business.industry, Transconductance, Nanowire, Short-channel effect, Electronic, Optical and Magnetic Materials, Gallium arsenide, chemistry.chemical_compound, chemistry, MOSFET, Optoelectronics, Field-effect transistor, Electrical and Electronic Engineering, business, Metal gate, High-κ dielectric
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::493120e3a3d1573ce86d54240d3a6c07Test
https://doi.org/10.1109/ted.2014.2320946Test -
7
المؤلفون: Fei Zhou, Fei Xue, Yen-Ting Chen, Yanzhen Wang, Jack C. Lee
المصدر: IEEE Transactions on Electron Devices. 59:139-144
مصطلحات موضوعية: Electron mobility, Materials science, Passivation, business.industry, Electrical engineering, chemistry.chemical_element, Equivalent oxide thickness, Plasma, Electronic, Optical and Magnetic Materials, Gallium arsenide, chemistry.chemical_compound, chemistry, Logic gate, MOSFET, Fluorine, Optoelectronics, Electrical and Electronic Engineering, business
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::c9a3d64d47d70aba9d3b99caf5e46e56Test
https://doi.org/10.1109/ted.2011.2172687Test -
8
المؤلفون: Fei Zhou, Fei Xue, Han Zhao, Yanzhen Wang, Jack C. Lee, Yi Chen
المصدر: IEEE Transactions on Electron Devices. 58:2990-2995
مصطلحات موضوعية: Materials science, business.industry, Equivalent oxide thickness, Nanotechnology, Electronic, Optical and Magnetic Materials, chemistry.chemical_compound, Atomic layer deposition, chemistry, Gate oxide, Logic gate, Tunnel diode, Optoelectronics, Field-effect transistor, Electrical and Electronic Engineering, business, Indium gallium arsenide, Quantum tunnelling
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::f6eb5625e3f3969313056acb658c216dTest
https://doi.org/10.1109/ted.2011.2159385Test -
9
المؤلفون: C. Lee, Grigory Simin, Kanin Chu, Alexey Koudymov, P.C. Chao, A. Balistreri, Jose L. Jimenez, Michael Shur
المصدر: IEEE Transactions on Electron Devices. 55:712-720
مصطلحات موضوعية: Physics, Velocity saturation, Electric field, Electronic engineering, Collapse (topology), Charge (physics), Trapping, High-electron-mobility transistor, Radio frequency, Electrical and Electronic Engineering, Current (fluid), Electronic, Optical and Magnetic Materials, Computational physics
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::0071ca59467db1303e38f5f3ee911da7Test
https://doi.org/10.1109/ted.2007.915092Test -
10
المؤلفون: Chin C. Lee, Moo Whan Shin, Jeong Park
المصدر: IEEE Transactions on Electron Devices. 51:1753-1759
مصطلحات موضوعية: Materials science, business.industry, Thermal resistance, Electrical engineering, Wide-bandgap semiconductor, Gallium nitride, Heterojunction, Substrate (electronics), High-electron-mobility transistor, Temperature measurement, Electronic, Optical and Magnetic Materials, chemistry.chemical_compound, chemistry, Sapphire, Optoelectronics, Electrical and Electronic Engineering, business
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::bb012c2bf10aad386c1441333a595473Test
https://doi.org/10.1109/ted.2004.836540Test