المؤلفون: Beaux, Miles F., Hass, Jamie, Bridges, Nathan, Kwon, Nam Hoon, McIlroy, David N.

المصدر: Journal of Applied Physics; Jul2011, Vol. 110 Issue 2, p024313, 4p

مصطلحات موضوعية: NANOWIRES, REYNOLDS number, MICROWAVES, VISCOSITY, NANOSTRUCTURED materials

مستخلص: A process has been developed for post fabrication manipulation of silica nanowire lengths with reproducible mean length target ability by manual grinding in liquid media. The process is based on the relationship between nanowire Reynolds number and the laminar or turbulent motion of nanowires in a media. Mean lengths of nanowires prepared by this process are predicted to be inversely proportional to the density over viscosity of the media used. Experimental results giving the mean length measurements are in very good agreement with the predicted dependence on medium density and viscosity. [ABSTRACT FROM AUTHOR]

: Copyright of Journal of Applied Physics is the property of American Institute of Physics and its content may not be copied or emailed to multiple sites or posted to a listserv without the copyright holder's express written permission. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)

المؤلفون: Chen, Yunxia, Dorgan, Jr., Brian L., McIlroy, David N., Eric Aston, D.

المصدر: Journal of Applied Physics; 11/15/2006, Vol. 100 Issue 10, p104301, 7p, 1 Diagram, 2 Charts, 4 Graphs

مصطلحات موضوعية: NANOWIRES, SILVER, BENDING (Metalwork), ELASTICITY, SILICON, ATOMIC force microscopy, FINITE element method, BOUNDARY value problems

مستخلص: Nanomechanical bending behavior and elastic modulus of silver nanowires (65–140 nm[nullset_(circle_with_slash-through)]) suspended across silicon microchannels were investigated using digital pulsed force mode (DPFM) atomic force microscopy through coincident imaging and force profiling. Deflection profiles analyzed off-line demonstrate the role of bending nanowire shape and symmetry in experimentally determining boundary conditions, eliminating the need to rely on isolated midpoint bending measurements and the usual assumptions for supported-end behavior. Elastic moduli for as-prepared silver nanowires ranged from 80.4±5.3 to 96.4±12.8 GPa, which met or exceeded the literature values for bulk silver. The calculated moduli were based on classic modeling, both with one-dimensional analytical solutions and three-dimensional finite element analysis. Modeling results indicate that the classic models are accurate as long as the boundary conditions are not arbitrarily assumed but directly confirmed by data analysis. DPFM also facilitated the experimental determination of sample gauge lengths from images and bending profiles. [ABSTRACT FROM AUTHOR]

: Copyright of Journal of Applied Physics is the property of American Institute of Physics and its content may not be copied or emailed to multiple sites or posted to a listserv without the copyright holder's express written permission. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)