دورية أكاديمية
A technique for measuring the surface temperature of transistors by means of fluorescent phosphor.
| العنوان: | A technique for measuring the surface temperature of transistors by means of fluorescent phosphor. |
|---|---|
| المؤلفون: | Brenner, David J. |
| بيانات النشر: | Washington; for sale by the Supt. of Docs., U.S. Govt. Print. Off. |
| سنة النشر: | 1971 |
| المجموعة: | Hathi Trust Digital Library |
| مصطلحات موضوعية: | Transistors |
| الوصف: | Bibliography: p. 46. ; Mode of access: Internet. |
| نوع الوثيقة: | text |
| وصف الملف: | bib |
| اللغة: | English |
| العلاقة: | Technique for measuring the surface temperature of transistors by means of fluorescent phosphor.; http://hdl.handle.net/2027/uiug.30112105094244Test; http://hdl.handle.net/2027/mdp.39015077288580Test |
| الإتاحة: | http://hdl.handle.net/2027/uiug.30112105094244Test http://hdl.handle.net/2027/mdp.39015077288580Test |
| حقوق: | Items in this record are available as Public Domain, Google-digitized. View access and use profile at http://www.hathitrust.org/access_use#pd-googleTest. Please see individual items for rights and use statements. |
| رقم الانضمام: | edsbas.EBB2DF0F |
| قاعدة البيانات: | BASE |
| الوصف غير متاح. |