المؤلفون: Urbánek, M. (Michal), Krátký, S. (Stanislav), Matějka, M. (Milan), Kolařík, V. (Vladimír), Horáček, M. (Miroslav)

مصطلحات موضوعية: scanning probe lithography, local anodic oxidation, nanoscratching, atomic force microscopy

العلاقة: urn:pissn: 0009-2770; urn:eissn: 1213-7103; http://hdl.handle.net/11104/0238098Test

الإتاحة: http://hdl.handle.net/11104/0238098Test

المؤلفون: Wu, Yueqin, Huang, Han, Zou, Jin

مصطلحات موضوعية: Nanoscratching, Deformation, Monocrystalline silicon, Transmission electron microscopy, Phase transformation, Amporphisation, 2210 Mechanical Engineering, 2508 Surfaces, Coatings and Films, 3110 Surfaces and Interfaces

العلاقة: orcid:0000-0003-3511-4270; orcid:0000-0003-3353-2970; orcid:0000-0001-9435-8043

الإتاحة: https://doi.org/10.1504/IJSURFSE.2013.051918Test
https://espace.library.uq.edu.au/view/UQ:289802Test

المؤلفون: Chang, Wen-Yang, Fang, Te-Hua, Weng, Cheng-I., Yang, Jhih-Chin

المساهمون: Department of Mechanical Engineering

مصطلحات موضوعية: Molecular Dynamics, Nanoscratching, Graphene, Interface Dynamics

العلاقة: JOURNAL OF COMPUTATIONAL AND THEORETICAL NANOSCIENCE, Vol. 10, No. 4, pp. 832-837; http://ir.lib.ncku.edu.tw/handle/987654321/147389Test; http://ir.lib.ncku.edu.tw/bitstream/987654321/147389/-1/index.htmlTest

الإتاحة: https://doi.org/10.1166/jctn.2013.2777Test
http://ir.lib.ncku.edu.tw/handle/987654321/147389Test
http://ir.lib.ncku.edu.tw/bitstream/987654321/147389/-1/index.htmlTest

المؤلفون: Dong, Zhuxin

المصدر: Graduate Theses and Dissertations

مصطلحات موضوعية: Applied sciences, Afm, Cnt, Isfet, Mems, Nanoindentation, Nanoscratching, Electro-Mechanical Systems, Nanoscience and Nanotechnology, Polymer and Organic Materials

وصف الملف: application/pdf

العلاقة: https://scholarworks.uark.edu/etd/612Test; https://scholarworks.uark.edu/context/etd/article/1611/viewcontent/Dong_uark_0011A_10613.pdfTest

الإتاحة: https://scholarworks.uark.edu/etd/612Test
https://scholarworks.uark.edu/context/etd/article/1611/viewcontent/Dong_uark_0011A_10613.pdfTest

مرشدي الرسالة: Huang, Jingyi (Author), Ponce, Fernando A (Advisor), Carpenter, Ray W (Committee member), Smith, David J (Committee member), Yu, Hongbin (Committee member), Treacy, Michael Mj (Committee member), Arizona State University (Publisher)

مصطلحات موضوعية: Physics, Materials Science, Nanotechnology, alloy, nanoindentation, nanoscratching, semiconductor, TEM

وصف الملف: 148 pages

الإتاحة: http://hdl.handle.net/2286/R.I.17850Test

المؤلفون: Ge, Xiang, Leng, Yang, Ren, Fuzeng, Lu, Xiong

مصطلحات موضوعية: Electrochemical deposition, Fluoridated hydroxyapatite, Nanothick coating, Nanoscratching test, Dissolution behavior, Zeta potential

العلاقة: http://repository.ust.hk/ir/Record/1783.1-34865Test; Journal of the mechanical behavior of biomedical materials, v. 4, (7), October 2011, p. 1046-1056; https://doi.org/10.1016/j.jmbbm.2011.03.013Test; http://lbdiscover.ust.hk/uresolver?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rfr_id=info:sid/HKUST:SPI&rft.genre=article&rft.issn=1751-6161&rft.volume=4&rft.issue=7&rft.date=2011&rft.spage=1046&rft.aulast=Ge&rft.aufirst=Xiang&rft.atitle=Integrity+and+zeta+potential+of+fluoridated+hydroxyapatite+nanothick+coatings+for+biomedical+applications&rft.title=Journal+of+the+mechanical+behavior+of+biomedical+materialsTest; http://gateway.isiknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=LinksAMR&SrcApp=PARTNER_APP&DestLinkType=FullRecord&DestApp=WOS&KeyUT=000294187500014Test; http://www.scopus.com/record/display.url?eid=2-s2.0-79960563876&origin=inwardTest

الإتاحة: https://doi.org/10.1016/j.jmbbm.2011.03.013Test
http://repository.ust.hk/ir/Record/1783.1-34865Test
http://lbdiscover.ust.hk/uresolver?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rfr_id=info:sid/HKUST:SPI&rft.genre=article&rft.issn=1751-6161&rft.volume=4&rft.issue=7&rft.date=2011&rft.spage=1046&rft.aulast=Ge&rft.aufirst=Xiang&rft.atitle=Integrity+and+zeta+potential+of+fluoridated+hydroxyapatite+nanothick+coatings+for+biomedical+applications&rft.title=Journal+of+the+mechanical+behavior+of+biomedical+materialsTest
http://gateway.isiknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=LinksAMR&SrcApp=PARTNER_APP&DestLinkType=FullRecord&DestApp=WOS&KeyUT=000294187500014Test
http://www.scopus.com/record/display.url?eid=2-s2.0-79960563876&origin=inwardTest

المؤلفون: Wu, Y. Q., Huang, H., Zou, J.

مصطلحات موضوعية: Compound semiconductor, Nanoscratching, Deformation, Transmission electron microscopy (TEM), 2500 Materials Science, 3104 Condensed Matter Physics

العلاقة: orcid:0000-0003-3511-4270; orcid:0000-0003-3353-2970; orcid:0000-0001-9435-8043

الإتاحة: https://doi.org/10.1016/j.scriptamat.2011.05.008Test
https://espace.library.uq.edu.au/view/UQ:245800Test

المؤلفون: Samad, M.A., Sinha, S.K.

المساهمون: MECHANICAL ENGINEERING, ELECTRICAL & COMPUTER ENGINEERING

المصدر: Scopus

مصطلحات موضوعية: Nanoindentation, Nanoscratching, SWCNTs, UHMWPE coating

العلاقة: Samad, M.A., Sinha, S.K. (2011-11). Mechanical, thermal and tribological characterization of a UHMWPE film reinforced with carbon nanotubes coated on steel. Tribology International 44 (12) : 1932-1941. ScholarBank@NUS Repository. https://doi.org/10.1016/j.triboint.2011.08.001Test; http://scholarbank.nus.edu.sg/handle/10635/50974Test; 000297824800039

الإتاحة: https://doi.org/10.1016/j.triboint.2011.08.001Test
http://scholarbank.nus.edu.sg/handle/10635/50974Test

المؤلفون: Ramiączek-Krasowska, Maria, Szyszka, Adam, Stafiniak, Andrzej, Paszkiewicz, Regina, Paszkiewicz, Bogdan, Tłaczała, Marek

المساهمون: Gaj, Miron. Redakcja, Urbańczyk, Wacław. Redakcja

المصدر: ; http://aleph.bg.pwr.wroc.pl/F/?func=find-b&request=000122307+&find_code=SYS&adjacent=N&local_base=TUR&x=64&y=13&filter_code_1=WLN&filter_request_1=&filter_code_2=WYR&filter_request_2=&filter_code_3=WYR&filter_request_3=&filter_code_4=WFT&filter_request_4=&filter_code_5=WSB&filter_request_5Test= ; http://opticaapplicata.pwr.edu.plTest/

مصطلحات موضوعية: optyka, nanoscratching, nanoscribing, AFM lithography, lift-off technique

وصف الملف: application/pdf

العلاقة: oai:dbc.wroc.pl:publication:95095; Optica Applicata; Optica Applicata, Vol. 41, 2011; Optica Applicata, Vol. 41, 2011, Nr 2; Politechnika Wrocławska. Wydział Podstawowych Problemów Techniki; https://dbc.wroc.pl/dlibra/docmetadata?showContent=true&id=57632Test; oai:dbc.wroc.pl:57632

الإتاحة: https://dbc.wroc.pl/dlibra/docmetadata?showContent=true&id=57632Test

المؤلفون: Ohsone, Wataru, Shimizu, Jun, Zhou, Li Bo, Ojima, Hirotaka, Onuki, Teppei, Yamamoto, Takeyuki, Huang, Han

المساهمون: Yunn-Shiuan Liao, Chao-Chang A. Chen, Choung-Lii Chao, Pei-Lum Tso

مصطلحات موضوعية: Atomic Force Microscope (AFM), Diamond Probe, Mold, Nanoimprint Lithography, Nanoscratching, Silicon Wafer

العلاقة: orcid:0000-0003-3353-2970

الإتاحة: https://doi.org/10.4028/www.scientific.net/AMR.126-128.843Test
https://espace.library.uq.edu.au/view/UQ:222220Test