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51دورية أكاديمية
المؤلفون: Chang, Shing I., Zhang, Zheng, Koppel, Siim, Malmir, Behnam, Kong, Xianguang, Tsai, Tzong-Ru, Wang, Donghai
المصدر: Neural Computing & Applications; Nov2019, Vol. 31 Issue 11, p7415-7428, 14p
مصطلحات موضوعية: STATISTICAL process control, INFORMATION measurement, RETROSPECTIVE studies, TIME series analysis, MAGNETIC entropy
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52دورية أكاديمية
المؤلفون: Chiang, Jyun‐You, Lio, Y. L., Tsai, Tzong‐Ru
المساهمون: Ministry of Science and Technology, Taiwan
المصدر: Quality and Reliability Engineering International ; volume 33, issue 5, page 1083-1094 ; ISSN 0748-8017 1099-1638
الإتاحة: https://doi.org/10.1002/qre.2101Test
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53دورية أكاديمية
المؤلفون: Tsai, Tzong-Ru, Sung, Wen-Yun, Lio, Y. L., Chang, Shing I., Lu, Jye-Chyi
المصدر: IEEE Transactions on Reliability ; volume 65, issue 1, page 459-468 ; ISSN 0018-9529 1558-1721
الإتاحة: https://doi.org/10.1109/tr.2015.2435774Test
http://xplorestaging.ieee.org/ielx7/24/7422884/7114339.pdf?arnumber=7114339Test -
54
المؤلفون: Tsai, Tzong-ru
مصطلحات موضوعية: Bayes, Bayesian inference, statistical computing, reliability analysis, survival analysis
العلاقة: Emerging Topics in Statistics and Biostatistics; 全文連結 https://link.springer.com/book/10.1007/978-3-030-88658-5Test; https://tkuir.lib.tku.edu.tw/dspace/handle/987654321/123851Test; https://tkuir.lib.tku.edu.tw/dspace/bitstream/987654321/123851/1/index.htmlTest
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55
المؤلفون: Tsai, Tzong-Ru, Xin, H, Fan, Ya-Yen, Lio, YL
مصطلحات موضوعية: Bias correction, bootstrap methods, Fisher information matrix, inverse Gaussian distribution, maximum likelihood estimation
العلاقة: 27th ISSAT International Conference on Reliability and Quality in Design, p.86-90; 27th ISSAT International Conference on Reliability and Quality in Design; 全文連結 https://www.scopus.com/record/display.uri?eid=2-s2.0-85138276074&origin=resultslist&sort=plf-f&src=s&st1=Bias-corrected+maximum+likelihood+estimation+for+the+process+performance+index+using+inverse+Gaussian+distribution&sid=a29dfac1d659687288604d68dd232b01&sot=b&sdt=b&sl=129&s=TITLE-ABS-KEY%28Bias-corrected+maximum+likelihood+estimation+for+the+process+performance+index+using+inverse+Gaussian+distribution%29&relpos=0&citeCnt=0&searchTermTest= 會議連結 https://www.issatconferences.org/rqd2022_program.htmlTest; https://tkuir.lib.tku.edu.tw/dspace/handle/987654321/123465Test; https://tkuir.lib.tku.edu.tw/dspace/bitstream/987654321/123465/1/index.htmlTest
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56تقرير
المؤلفون: Chiang, J-Y, Lio, YL, Tsai, Tzong-Ru
مصطلحات موضوعية: Autocorrelation, average run length, process capability analysis, profile monitoring
العلاقة: Quality and Reliability Engineering International 33(5), p.1083–1094; http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/116748Test; http://tkuir.lib.tku.edu.tw:8080/dspace/bitstream/987654321/116748/1/index.htmlTest; http://tkuir.lib.tku.edu.tw:8080/dspace/bitstream/987654321/116748/-1/MEWMATest Control Chart and Process Capability Indices for Simple Linear Profiles with Within‐profile Autocorrelation.pdf
الإتاحة: http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/116748Test
http://tkuir.lib.tku.edu.tw:8080/dspace/bitstream/987654321/116748/1/index.htmlTest
http://tkuir.lib.tku.edu.tw:8080/dspace/bitstream/987654321/116748/-1/MEWMATest Control Chart and Process Capability Indices for Simple Linear Profiles with Within‐profile Autocorrelation.pdf -
57
المؤلفون: Chen Ding-Geng, Tsai Tzong-Ru, Lio Y. L.
المصدر: Open Journal of Statistics. :46-57
مصطلحات موضوعية: Moment (mathematics), Mean squared error, Estimation theory, Rayleigh distribution, Expectation–maximization algorithm, Statistics, Estimator, Maximum likelihood sequence estimation, Likelihood function, Mathematics
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::5f2c07f94d5db54aa87aa414aa4f4911Test
https://doi.org/10.4236/ojs.2011.12006Test -
58دورية أكاديمية
المؤلفون: Tsai, Tzong-Ru, Jiang, Nan, Lio, Y.L.
المساهمون: Ministry of Science and Technology
المصدر: Journal of Industrial and Production Engineering ; volume 32, issue 4, page 225-231 ; ISSN 2168-1015 2168-1023
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59دورية أكاديمية
المصدر: IEEE Transactions on Reliability ; volume 64, issue 1, page 144-153 ; ISSN 0018-9529 1558-1721
مصطلحات موضوعية: Electrical and Electronic Engineering, Safety, Risk, Reliability and Quality
الإتاحة: https://doi.org/10.1109/tr.2014.2338251Test
http://xplorestaging.ieee.org/ielx7/24/7051309/06863713.pdf?arnumber=6863713Test -
60دورية أكاديمية
المؤلفون: Chiang, Jyun-You, Tsai, Tzong-Ru, Lio, Y.L., Lu, Wanbo, Shi, Daimin
المصدر: Computers & Industrial Engineering ; volume 87, page 186-192 ; ISSN 0360-8352
مصطلحات موضوعية: General Engineering, General Computer Science
الإتاحة: https://doi.org/10.1016/j.cie.2015.05.003Test
https://api.elsevier.com/content/article/PII:S0360835215002168?httpAccept=text/xmlTest
https://api.elsevier.com/content/article/PII:S0360835215002168?httpAccept=text/plainTest
