المؤلفون: Zakariyah, Shefiu S., Conway, Paul P., Hutt, David A., Selviah, David R., Wang, Kai, Baghsiahi, Hadi, Rygate, Jeremy, Calver, Jonathan, Kandulski, Witold

المصدر: 2009 11th Electronics Packaging Technology Conference

الإتاحة: https://doi.org/10.1109/eptc.2009.5416408Test
http://xplorestaging.ieee.org/ielx5/5398729/5416395/05416408.pdf?arnumber=5416408Test

المؤلفون: Erden, Erdem, Kishore, V. C., Urey, Hakan, Baghsiahi, Hadi, Willman, Eero, Day, Sally E., Selviah, David R., Fernandez, F. Anibal, Surman, Phil

المصدر: 2009 IEEE LEOS Annual Meeting Conference Proceedings

الإتاحة: https://doi.org/10.1109/leos.2009.5343494Test
http://xplorestaging.ieee.org/ielx5/5339380/5343054/05343494.pdf?arnumber=5343494Test

المؤلفون: Papakonstantinou, Ioannis, Selviah, David R., Kai Wang, Pitwon, Richard A., Hopkins, Ken, Milward, Dave

المصدر: 2008 58th Electronic Components and Technology Conference

الإتاحة: https://doi.org/10.1109/ectc.2008.4550220Test
http://xplorestaging.ieee.org/ielx5/4542565/4549927/04550220.pdf?arnumber=4550220Test

المؤلفون: Rashed, Atef M., Selviah, David R.

المساهمون: Armitage, John C., Lessard, Roger A., Lampropoulos, George A.

المصدر: SPIE Proceedings ; Photonics North 2004: Photonic Applications in Telecommunications, Sensors, Software, and Lasers ; ISSN 0277-786X

الإتاحة: https://doi.org/10.1117/12.567127Test

المؤلفون: Coutinho, Ricardo C., Selviah, David R., Griffiths, Hugh D.

المساهمون: Watkins, Wendell R., Clement, Dieter, Reynolds, William R.

المصدر: Targets and Backgrounds X: Characterization and Representation ; SPIE Proceedings ; ISSN 0277-786X

الإتاحة: https://doi.org/10.1117/12.542435Test

المؤلفون: Surman, Phil, Day, Sally, Selviah, David R., Willman, Eero, Miranda, Matheus

المصدر: SID Symposium Digest of Technical Papers ; volume 44, issue S1, page 268-271 ; ISSN 0097-966X 2168-0159

الإتاحة: https://doi.org/10.1002/sdtp.80Test

المؤلفون: Coutinho, Ricardo C., Selviah, David R., Griffiths, Hugh D.

المساهمون: Watkins, Wendell R., Clement, Dieter, Reynolds, William R.

المصدر: Targets and Backgrounds VIII: Characterization and Representation ; SPIE Proceedings ; ISSN 0277-786X

الإتاحة: https://doi.org/10.1117/12.478796Test
http://proceedings.spiedigitallibrary.org/proceeding.aspx?articleid=885864Test

المؤلفون: Gray, Jonathan W., Oulton, Rupert F., Stavrinou, Paul N., Whitehead, Mark, Parry, Gareth, Duggan, Geoff, Coutinho, Ricardo C., Selviah, David R.

المساهمون: Yao, H. Walter, Schubert, E. F.

المصدر: SPIE Proceedings ; Light-Emitting Diodes: Research, Manufacturing, and Applications V ; ISSN 0277-786X

الإتاحة: https://doi.org/10.1117/12.426836Test

المؤلفون: Coutinho, Ricardo C., Selviah, David R., French, Herbert A.

المساهمون: Casasent, David P., Chao, Tien-Hsin

المصدر: SPIE Proceedings ; Optical Pattern Recognition XI ; ISSN 0277-786X

الإتاحة: https://doi.org/10.1117/12.381599Test

المؤلفون: Smith, Patrick J., McCabe, Eithne M., Taylor, Cian M., Selviah, David R., Day, Sally E., Commander, L. G.

المساهمون: Conchello, Jose-Angel, Cogswell, Carol J., Tescher, Andrew G., Wilson, Tony

المصدر: SPIE Proceedings ; Three-Dimensional and Multidimensional Microscopy: Image Acquisition Processing VII ; ISSN 0277-786X

الإتاحة: https://doi.org/10.1117/12.384195Test