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11دورية أكاديمية
المؤلفون: Selviah, David R., Walker, Andy C., Hutt, David A., Wang, Kai, McCarthy, Aongus, Anibal Fernández, F., Papakonstantinou, Ioannis, Baghsiahi, Hadi, Suyal, Himanshu, Taghizadeh, Mohammad, Conway, Paul, Chappell, John, Zakariyah, Shefiu S., Milward, Dave, Pitwon, Richard, Hopkins, Ken, Muggeridge, Malcolm, Rygate, Jeremy, Calver, Jonathan, Kandulski, Witold, Deshazer, David J., Hueston, Karen, Ives, David J., Ferguson, Robert, Harris, Subrena, Hinde, Gary, Cole, Martin, White, Henry, Suyal, Navin, ur Rehman, Habib, Bryson, Chris
المصدر: Circuit World, 2010, Vol. 36, Issue 2, pp. 5-19.
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12دورية أكاديمية
المؤلفون: Selviah, David R., Aníbal Fernández, F., Papakonstantinou, Ioannis, Wang, Kai, Bagshiahi, Hadi, Walker, Andy C., McCarthy, Aongus, Suyal, Himanshu, Hutt, David A., Conway, Paul P., Chappell, John, Zakariyah, Shefiu S., Milward, Dave
المصدر: Circuit World, 2008, Vol. 34, Issue 2, pp. 21-26.
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13مؤتمر
المؤلفون: Selviah, David R., Wang, Kai, Richards, Martin
المصدر: Presented at: Security Grand Challenge, Russell Hotel, Russell Square, London. (2007)
وصف الملف: application/pdf
العلاقة: https://discovery.ucl.ac.uk/id/eprint/5012/1/5012.pdfTest; https://discovery.ucl.ac.uk/id/eprint/5012Test/
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14مؤتمر
المؤلفون: Selviah, David R.
المصدر: Presented at: Optical Fibre Measurement Conference (OFMC) 2007, National Physical Laboratory, Teddington, Middlesex, UK. (2007)
وصف الملف: application/pdf
العلاقة: https://discovery.ucl.ac.uk/id/eprint/5013/1/5013.pdfTest; https://discovery.ucl.ac.uk/id/eprint/5013Test/
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15مؤتمر
المؤلفون: Vahabi, Nafiseh, Selviah, David R.
المصدر: 2019 IEEE International Symposium on Signal Processing and Information Technology (ISSPIT)
الإتاحة: https://doi.org/10.1109/isspit47144.2019.9001845Test
http://xplorestaging.ieee.org/ielx7/8979200/9001729/09001845.pdf?arnumber=9001845Test -
16مؤتمر
المؤلفون: Vahabi, Nafiseh, Alabdullah, Mohammed, Selviah, David R.
المصدر: 2019 14th IEEE Conference on Industrial Electronics and Applications (ICIEA)
الإتاحة: https://doi.org/10.1109/iciea.2019.8833893Test
http://xplorestaging.ieee.org/ielx7/8815788/8833628/08833893.pdf?arnumber=8833893Test -
17دورية أكاديمية
المؤلفون: Vahabi, Nafiseh, Willman, Eero, Baghsiahi, Hadi, Selviah, David R.
المساهمون: U.K. Government for funding via the Technology Strategy Board, TSB, Distributed Acoustic FlowMeter, with project partners Chevron, Statoil, Saudi Aramco, Silixa, UCL, and Weatherford, U.K. Government Research Council EPSRC
المصدر: IEEE Sensors Journal ; volume 20, issue 19, page 11499-11507 ; ISSN 1530-437X 1558-1748 2379-9153
الإتاحة: https://doi.org/10.1109/jsen.2020.2996823Test
http://xplorestaging.ieee.org/ielx7/7361/9186214/09098887.pdf?arnumber=9098887Test -
18دورية أكاديمية
المصدر: Journal of Lightwave Technology ; volume 31, issue 16, page 2659-2668 ; ISSN 0733-8724 1558-2213
مصطلحات موضوعية: Atomic and Molecular Physics, and Optics
الإتاحة: https://doi.org/10.1109/jlt.2013.2271952Test
http://ieeexplore.ieee.org/iel7/50/6558496/06552985.pdfTest
http://xplorestaging.ieee.org/ielx7/50/6558496/06552985.pdf?arnumber=6552985Test -
19دورية أكاديمية
المؤلفون: Pitwon, Richard C. A., Wang, Kai, Graham-Jones, Jasper, Papakonstantinou, Ioannis, Baghsiahi, Hadi, Offrein, Bert Jan, Dangel, Roger, Milward, Dave, Selviah, David R.
المصدر: Journal of Lightwave Technology ; volume 30, issue 21, page 3316-3329 ; ISSN 0733-8724 1558-2213
مصطلحات موضوعية: Atomic and Molecular Physics, and Optics
الإتاحة: https://doi.org/10.1109/jlt.2012.2214764Test
http://xplorestaging.ieee.org/ielx5/50/6329950/06279449.pdf?arnumber=6279449Test -
20دورية أكاديمية
المساهمون: Innovative electronics Manufacturing Research Centre, Engineering and Physical Sciences Research Council
المصدر: Optics and Lasers in Engineering ; volume 50, issue 12, page 1752-1756 ; ISSN 0143-8166
مصطلحات موضوعية: Electrical and Electronic Engineering, Mechanical Engineering, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials
الإتاحة: https://doi.org/10.1016/j.optlaseng.2012.07.005Test
https://api.elsevier.com/content/article/PII:S0143816612002011?httpAccept=text/xmlTest
https://api.elsevier.com/content/article/PII:S0143816612002011?httpAccept=text/plainTest