المؤلفون: D’Alessandro, V., Erenchun, L., D’Agostino, G., Rentería, F.

المصدر: Journal of Cystic Fibrosis ; volume 19, page S109 ; ISSN 1569-1993

مصطلحات موضوعية: Pulmonary and Respiratory Medicine, Pediatrics, Perinatology and Child Health

الإتاحة: https://doi.org/10.1016/s1569-1993Test(20)30523-3
https://api.elsevier.com/content/article/PII:S1569199320305233?httpAccept=text/xmlTest
https://api.elsevier.com/content/article/PII:S1569199320305233?httpAccept=text/plainTest

المؤلفون: Sahin Solmaz, Nergiz, Grisi, Marco, Matheoud, Alessandro V., Gualco, Gabriele, Boero, Giovanni

المساهمون: Schweizerischer Nationalfonds zur F?rderung der Wissenschaftlichen Forschung

المصدر: Analytical Chemistry ; volume 92, issue 14, page 9782-9789 ; ISSN 0003-2700 1520-6882

مصطلحات موضوعية: Analytical Chemistry

الإتاحة: https://doi.org/10.1021/acs.analchem.0c01221Test

المؤلفون: Oliveira, Alessandro V. M.

مصطلحات موضوعية: 387.71, HE Transportation and Communications, TL Motor vehicles. Aeronautics. Astronautics

الوصول الحر: https://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.415252Test

المؤلفون: Václav Struhár, Silviu S. Craciunas, Mohammad Ashjaei, Moris Behnam, Alessandro V. Papadopoulos

المصدر: ACM Transactions on Embedded Computing Systems.

مصطلحات موضوعية: Hardware and Architecture, Software

الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::1c620e220f3348cbcc7e7ad8973e01f3Test
https://doi.org/10.1145/3592856Test

المؤلفون: Bini, Enrico, Papadopoulos, Alessandro V., Higgins, Jacob, Bezzo, Nicola

المساهمون: Bini, Enrico, Papadopoulos, Alessandro V., Higgins, Jacob, Bezzo, Nicola

العلاقة: info:eu-repo/semantics/altIdentifier/isbn/978-1-6654-6761-2; ispartofbook:Proceedings of the IEEE 61st Conference on Decision and Control (CDC); IEEE 61st Conference on Decision and Control (CDC); firstpage:7141; lastpage:7148; numberofpages:8; https://hdl.handle.net/2318/1887418Test

الإتاحة: https://doi.org/10.1109/CDC51059.2022.9992462Test
https://hdl.handle.net/2318/1887418Test

المؤلفون: Amouyal S. A. T., Shkatrut M., Margolin A., D'alessandro V., Falone M.

المساهمون: Amouyal, S. A. T., Shkatrut, M., Margolin, A., D'Alessandro, V., Falone, M.

وصف الملف: ELETTRONICO

العلاقة: info:eu-repo/semantics/altIdentifier/isbn/978-1-62410-631-6; ispartofbook:AIAA Science and Technology Forum and Exposition, AIAA SciTech Forum 2022; AIAA Science and Technology Forum and Exposition, AIAA SciTech Forum 2022; firstpage:1; lastpage:9; numberofpages:9; http://hdl.handle.net/11566/298501Test; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85122684518

الإتاحة: https://doi.org/10.2514/6.2022-0170Test
http://hdl.handle.net/11566/298501Test

المؤلفون: Rogie B., Codecasa L., Monier-Vinard E., Bissuel V., Laraqi N., Daniel O., D'Amore D., Magnani A., d'Alessandro V., Rinaldi N.

المساهمون: Rogie, B., Codecasa, L., Monier-Vinard, E., Bissuel, V., Laraqi, N., Daniel, O., D'Amore, D., Magnani, A., D'Alessandro, V., Rinaldi, N.

العلاقة: info:eu-repo/semantics/altIdentifier/wos/WOS:000441856500025; volume:87; firstpage:222; lastpage:231; numberofpages:10; journal:MICROELECTRONICS RELIABILITY; http://hdl.handle.net/11311/1120927Test; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85049357096

الإتاحة: https://doi.org/10.1016/j.microrel.2018.06.009Test
http://hdl.handle.net/11311/1120927Test

المؤلفون: Riccio, M., d'Alessandro, V., Romano, G., Maresca, L., Breglio, G., Irace, A., Castellazzi, A.

العلاقة: https://nottingham-repository.worktribe.com/output/1069984Test; Pagination 443-446; https://nottingham-repository.worktribe.com/file/1069984/1/High-Temperature%20Validated%20SiC%20Power%20MOSFET%20Model%20For%20Flexible%20Robustness%20Analysis%20Of%20Multi-chip%20StructuresTest

الإتاحة: https://doi.org/10.1109/ISPSD.2018.8393698Test
https://nottingham-repository.worktribe.com/file/1069984/1/High-Temperature%20Validated%20SiC%20Power%20MOSFET%20Model%20For%20Flexible%20Robustness%20Analysis%20Of%20Multi-chip%20StructuresTest
https://nottingham-repository.worktribe.com/output/1069984Test

المؤلفون: Riccio, M., Borghese, A., Romano, G., D 'alessandro, V., Fayyaz, A., Castellazzi, A., Maresca, L., Breglio, G., Irace, A.

العلاقة: https://nottingham-repository.worktribe.com/output/1567038Test; https://nottingham-repository.worktribe.com/file/1567038/1/Analysis%20Of%20Device%20And%20Circuit%20Parameters%20Variability%20In%20SiC%20MOSFETs-Based%20Multichip%20Power%20ModuleTest

الإتاحة: https://nottingham-repository.worktribe.com/file/1567038/1/Analysis%20Of%20Device%20And%20Circuit%20Parameters%20Variability%20In%20SiC%20MOSFETs-Based%20Multichip%20Power%20ModuleTest
https://nottingham-repository.worktribe.com/output/1567038Test

المؤلفون: Paolo Romano, Ferdinando Quattrocchi, Giovanni Patti, Filippo Papale, Dario Nocita, Antonio Mongioì, Stefano Mirulla, Carmelo Maimone, Andrea Libra, Alfio Gulizzi, Alfio Distefano, Alessandro V. Aruta, Stefano Arcifa, Guido Li Volsi

المصدر: Bullettin of the Gioenia Academy of Natural Sciences of Catania. 55:FP16-FP73

مصطلحات موضوعية: General Earth and Planetary Sciences, General Environmental Science

الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::1041e7c5bf3b8ecc6c8ea5c30f2fba6fTest
https://doi.org/10.35352/gioenia.v55i385.99Test