المؤلفون: Singh, S. D.^1,2 devsh@rrcat.gov.in, Patra, Nirmalendu^2,3, Singh, M. N.¹, Mukherjee, C.^2,4, Jha, S. N.^2,3, Sinha, A. K.^1,2, Ganguli, Tapas^1,2

المصدر: Journal of Materials Science. Feb2019, Vol. 54 Issue 3, p1992-2000. 9p. 1 Chart, 6 Graphs.

مصطلحات موضوعية: *X-ray diffraction, *X-ray absorption, *CRYSTAL structure, *NICKEL oxide, *EPITAXY

المؤلفون: Singh, S. D.¹, Nandanwar, V.¹, Srivastava, Himanshu¹, Yadav, A. K.², Bhakar, Ashok¹, Sagdeo, P. R.³, Sinha, A. K.¹, Ganguli, Tapas¹

المصدر: Dalton Transactions: An International Journal of Inorganic Chemistry. 9/7/2015, Vol. 44 Issue 33, p14793-14798. 6p.

مصطلحات موضوعية: *X-ray absorption near edge structure, *PHOTODETECTORS, *NICKEL oxides, *SPIN valves, *X-ray fluorescence, *X-ray diffraction

المؤلفون: Baraik, Kiran, Bhakar, Ashok, Sagdeo, Archna, Singh, S. D.

المصدر: AIP Conference Proceedings; 2017, Vol. 1832 Issue 1, p1-3, 3p, 3 Graphs

مصطلحات موضوعية: X-ray diffraction, LIME (Minerals), NICKEL oxide, LATTICE constants, ZINC oxide

المؤلفون: Dixit, V. K., Kumar, Shailendra, Singh, S. D., Khamari, S. K., Kumar, R., Tiwari, Pragya, Phase, D. M., Sharma, T. K., Oak, S. M.

المصدر: Applied Physics Letters; 3/3/2014, Vol. 104 Issue 9, p1-5, 5p, 1 Chart, 4 Graphs

مصطلحات موضوعية: BAND gaps, HETEROSTRUCTURES, GALLIUM phosphide, METAL organic chemical vapor deposition, EPITAXY, X-ray diffraction

المؤلفون: Singh, S. D.¹, Dixit, V. K.¹, Porwal, S.¹, Kumar, Ravi¹, Khamari, Shailesh K.¹, Srivastava, A. K.², Ganguli, Tapas¹, Oak, S. M.¹

المصدر: AIP Conference Proceedings. 12/1/2010, Vol. 1313 Issue 1, p250-252. 3p.

مصطلحات موضوعية: *QUANTUM wells, *STRUCTURAL analysis (Science), *OPTICAL properties of semiconductors, *INDIUM phosphide, *GALLIUM arsenide semiconductors, *METAL organic chemical vapor deposition, *X-ray diffraction, *TRANSMISSION electron microscopy, *PHOTOLUMINESCENCE