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1مؤتمر
المؤلفون: Kumari, Kavita, Vij, Ankush, Hashim, Mohd., Chae, K. H., Kumar, Shalendra
المصدر: AIP Conference Proceedings; 2018, Vol. 2006 Issue 1, p1-4, 4p, 2 Graphs
مصطلحات موضوعية: MAGNETIC properties of thin films, CERIUM oxides, PULSED laser deposition, X-ray diffraction, ATOMIC force microscopy, THIN films
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2دورية أكاديمية
المؤلفون: Kumar, Shalendra, Kim, Y. J., Koo, B. H., Sharma, S. K., Vargas, J. M., Knobel, M., Gautam, S., Chae, K. H., Kim, D. K., Kim, Y. K., Lee, C. G.
المصدر: Journal of Applied Physics; Apr2009, Vol. 105 Issue 7, p07C520-07C523, 3p, 3 Graphs
مصطلحات موضوعية: MAGNETIC properties, IRON, HYSTERESIS, WURTZITE, FIELD emission, X-ray absorption near edge structure, TRANSMISSION electron microscopy, X-ray diffraction
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3دورية أكاديمية
المؤلفون: Kumari, Kavita, Vij, Ankush, Chae, K. H., Hashim, Mohd., Aljawfi, Rezq Naji, Alvi, P. A., Kumar, Shalendra
المصدر: Radiation Effects & Defects in Solids: Incorporating Plasma Techniques & Plasma Phenomena; Nov-Dec2017, Vol. 172 Issue 11/12, p985-994, 10p
مصطلحات موضوعية: CERIUM oxides, X-ray absorption near edge structure, MOLECULAR structure, COPRECIPITATION (Chemistry), X-ray diffraction
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4دورية أكاديمية
المؤلفون: Singh, Amanpal, Vij, Ankush, Kumar, Dinesh, Khanna, P. K., Kumar, Mukesh, Gautam, Sanjeev, Chae, K. H.
المصدر: Semiconductor Science & Technology; Feb2013, Vol. 28 Issue 2, p1-8, 8p
مصطلحات موضوعية: ZINC compounds, SOL-gel processes, THIN films, SILICON, SUBSTRATES (Materials science), X-ray diffraction, NANOSTRUCTURES, BAND gaps, ATOMIC force microscopy
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5دورية أكاديمية
المؤلفون: Seo, J. H., Park, D. S., Cho, S. W., Kim, C. Y., Jang, W. C., Whang, C. N., Yoo, K.-H., Chang, G. S., Pedersen, T., Moewes, A., Chae, K. H., Cho, S. J.
المصدر: Applied Physics Letters; 10/16/2006, Vol. 89 Issue 16, p163505, 3p, 3 Graphs
مصطلحات موضوعية: TRANSISTORS, SEMICONDUCTORS, X-ray diffraction, ATOMIC force microscopy, SCANNING probe microscopy, X-ray spectroscopy
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6دورية أكاديمية
المساهمون: Chae, K [Nano Analysis Center, Korea Institute of Science and Technology (KIST), Seoul 136-791 (Korea, Republic of)]
المصدر: Journal of Applied Physics; 110; 8; Other Information: (c) 2011 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA)
وصف الملف: Medium: X; Size: page(s) 083718-083718.5
الوصول الحر: http://www.osti.gov/scitech/biblio/22038742Test
