المؤلفون: Kiekens, Kim, Tan, Ye, Kruth, Jean-Pierre, Voet, André, Dewulf, Wim

مصطلحات موضوعية: X-ray computed tomography, Dimensional metrology, Thresholding

وصف الملف: 204716 bytes; application/pdf

العلاقة: Proceedings of the International Symposium on Digital Industrial Radiology and Computed Tomography; International Symposium on Digital Industrial Radiology and Computed Tomography; https://lirias.kuleuven.be/handle/123456789/314753Test; https://lirias.kuleuven.be/bitstream/123456789/314753/1//Kiekens_Final.pdfTest

الإتاحة: https://lirias.kuleuven.be/handle/123456789/314753Test
https://lirias.kuleuven.be/bitstream/123456789/314753/1//Kiekens_Final.pdfTest

المؤلفون: Tan, Ye, Kiekens, Kim, Welkenhuyzen, Frank, Angel, Jais Andreas Breusch, De Chiffre, Leonardo, Kruth, Jean-Pierre, Dewulf, Wim

المصدر: Tan , Y , Kiekens , K , Welkenhuyzen , F , Angel , J A B , De Chiffre , L , Kruth , J-P & Dewulf , W 2014 , ' Simulation-aided investigation of beam hardening induced errors in CT dimensional metrology ' , Measurement Science and Technology , vol. 25 , no. 6 , pp. 064014 . https://doi.org/10.1088/0957-0233/25/6/064014Test

مصطلحات موضوعية: Dimensional metrology, X-ray computed tomography, Beam hardening, Simulation

العلاقة: https://orbit.dtu.dk/en/publications/18ec47eb-1df7-4828-84e7-1adb9b2f86e7Test

الإتاحة: https://doi.org/10.1088/0957-0233/25/6/064014Test
https://orbit.dtu.dk/en/publications/18ec47eb-1df7-4828-84e7-1adb9b2f86e7Test

المؤلفون: Dewulf, Wim, Kiekens, Kim, Tan, Ye, Welkenhuyzen, Frank, Kruth, Jean-Pierre

مصطلحات موضوعية: Metrology, Uncertainty, X-ray computed tomography

العلاقة: CIRP Annals. Manufacturing Technology vol:62 issue:1 pages:535-538; https://lirias.kuleuven.be/handle/123456789/413769Test

الإتاحة: https://lirias.kuleuven.be/handle/123456789/413769Test

المؤلفون: Kiekens, Kim, Welkenhuyzen, Frank, Tan, Ye, Bleys, Philip, Voet, André, Kruth, Jean-Pierre, Dewulf, Wim

مصطلحات موضوعية: x-ray computed tomography, measurement accuracy, calibration

وصف الملف: 1236355 bytes; application/pdf

العلاقة: Measurement Science & Technology vol:22 pages:1-7; https://lirias.kuleuven.be/handle/123456789/320564Test; https://lirias.kuleuven.be/bitstream/123456789/320564/1//final.pdfTest

الإتاحة: https://lirias.kuleuven.be/handle/123456789/320564Test
https://lirias.kuleuven.be/bitstream/123456789/320564/1//final.pdfTest

المؤلفون: Dewulf, Wim, Tan, Ye, Kiekens, Kim

المصدر: CIRP Annals - Manufacturing Technology; May2012, Vol. 61 Issue 1, p495-498, 4p

مصطلحات موضوعية: METROLOGY, TOMOGRAPHY, ALGORITHMS, LASER beams, IMAGE quality analysis, GREY relational analysis, HARDNESS, UNCERTAINTY (Information theory), MATHEMATICAL models