المؤلفون: Alicja Łukaszczyk, Jacek Banaś, Marcin Pisarek, Antoine Seyeux, Philippe Marcus, Jolanta Światowska

المصدر: Electrochem, Vol 2, Iss 4, Pp 546-562 (2021)

مصطلحات موضوعية: iron-chromium alloy, low Cr-alloy steel, oxide layer, XPS, ToF-SIMS, passivation, Industrial electrochemistry, TP250-261

وصف الملف: electronic resource

العلاقة: https://www.mdpi.com/2673-3293/2/4/35Test; https://doaj.org/toc/2673-3293Test

الوصول الحر: https://doaj.org/article/bfb7c7ff347e4b899c76470508f428afTest

المؤلفون: Antoine Seyeux, Marcin Pisarek, Alicja Łukaszczyk, Jacek Banaś, Jolanta Światowska, Philippe Marcus

المساهمون: Institut de Recherche de Chimie Paris (IRCP), Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)-Ecole Nationale Supérieure de Chimie de Paris - Chimie ParisTech-PSL (ENSCP), Université Paris sciences et lettres (PSL)-Université Paris sciences et lettres (PSL)-Ministère de la Culture (MC)

المصدر: Electrochem
Volume 2
Issue 4
Pages 35-562
Electrochem, Vol 2, Iss 35, Pp 546-562 (2021)
Electrochem, MDPI, 2021, 2 (4), pp.546-562. ⟨10.3390/electrochem2040035⟩

مصطلحات موضوعية: Materials science, Passivation, Scanning electron microscope, 020209 energy, Alloy, chemistry.chemical_element, 02 engineering and technology, [CHIM.INOR]Chemical Sciences/Inorganic chemistry, engineering.material, oxide layer, Corrosion, Chromium, [CHIM.ANAL]Chemical Sciences/Analytical chemistry, Ferrite (iron), XPS, 0202 electrical engineering, electronic engineering, information engineering, passivation, Auger electron spectroscopy, technology, industry, and agriculture, low Cr-alloy steel, [CHIM.MATE]Chemical Sciences/Material chemistry, 021001 nanoscience & nanotechnology, TP250-261, Secondary ion mass spectrometry, iron-chromium alloy, Industrial electrochemistry, chemistry, Chemical engineering, engineering, ToF-SIMS, 0210 nano-technology

وصف الملف: application/pdf

الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c6e7cf97c561be3bd1d52111f146b367Test
https://doi.org/10.3390/electrochem2040035Test