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1

دورية أكاديمية

Abnormal Two-Stage Degradation on P-Type Low-Temperature Polycrystalline-Silicon Thin-Film Transistor Under Hot Carrier Conditions.

المؤلفون: Tu, Hong-Yi, Chang, Ting-Chang, Tsao, Yu-Ching, Tai, Mao-Chou, Zheng, Yu-Zhe, Tu, Yu-Fa, Kuo, Chuan-Wei, Wu, Chia-Chuan, Tsai, Yu-Lin, Tsai, Tsung-Ming, Lin, Chih-Chih, Chien, Ya-Ting

المصدر: IEEE Electron Device Letters; May2022, Vol. 43 Issue 5, p721-724, 4p

مصطلحات موضوعية: ELECTRON impact ionization, TRANSISTORS, HOT carriers, THIN film transistors, ELECTRON traps, THRESHOLD voltage

2

دورية أكاديمية

An Analytical Method for Parameter Extraction in Oxide Semiconductor Field-Effect Transistors.

المؤلفون: Chien, Yu-Chieh, Londono-Ramirez, Horacio, Kuo, Chuan-Wei, Tsao, Yu-Ching, Nag, Manoj, Chang, Ting-Chang, Ang, Kah-Wee

المصدر: IEEE Transactions on Electron Devices; Jun2021, Vol. 68 Issue 6, p2717-2722, 6p

مصطلحات موضوعية: METAL oxide semiconductor field-effect transistors, FIELD-effect transistors, SEMICONDUCTORS, THRESHOLD voltage, SEMICONDUCTOR devices, LENGTH measurement

3

دورية أكاديمية

Dynamic switching-induced back-carrier-injection in a-InGaZnO thin film transistors.

المؤلفون: Tai, Mao-Chou (AUTHOR), Tsao, Yu-Ching (AUTHOR), Wang, Yu-Xuan (AUTHOR), Lin, Chih-Chih (AUTHOR), Tsai, Yu-Lin (AUTHOR), Tu, Hong-Yi (AUTHOR), Huang, Bo-Shen (AUTHOR), Chang, Ting-Chang (AUTHOR) tcchang3708@gmail.com

المصدر: Journal of Physics D: Applied Physics. 1/14/2021, Vol. 54 Issue 2, p1-8. 8p.

مصطلحات موضوعية: *THRESHOLD voltage, *ALTERNATING currents, *THIN film transistors, *TRANSISTORS

4

دورية أكاديمية

Interface Defect Shielding of Electron Trapping in a-InGaZnO Thin Film Transistors.

المؤلفون: Lin, Chih-Chih, Tai, Mao-Chou, Chang, Ting-Chang, Tsao, Yu-Ching, Wang, Yu-Xuan, Tsai, Yu-Lin, Tu, Hong-Yi, Lu, I-Nien, Tsai, Tsung-Ming, Huang, Jen-Wei

المصدر: IEEE Transactions on Electron Devices; Sep2020, Vol. 67 Issue 9, p3645-3649, 5p

مصطلحات موضوعية: ELECTRON traps, THIN film transistors

5

دورية أكاديمية

Formation of Hump Effect Due to Top-Gate Bias Stress in Organic Thin-Film Transistors.

المؤلفون: Chen, Hong-Chih, Tsao, Yu-Ching, Chu, An-Kuo, Huang, Hui-Chun, Lai, Wei-Chih, Chen, Guan-Fu, Huang, Shin-Ping, Chang, Ting-Chang, Chen, Po-Hsun, Chen, Jian-Jie, Kuo, Chuan-Wei, Zhou, Kuan-Ju, Hung, Yang-Hao

المصدر: IEEE Electron Device Letters; Dec2019, Vol. 40 Issue 12, p1941-1944, 4p

مصطلحات موضوعية: TRANSISTORS, THRESHOLD voltage, ELECTRON traps, ELECTRIC fields, THIN film transistors, MANUFACTURING processes, QUANTUM gates

6

دورية أكاديمية

Abnormal Back Channel Leakage Under Large Drain Voltage in Short Channel Organic Thin-Film Transistors.

المؤلفون: Chen, Guan-Fu, Lin, Sung-Chun, Yu, Ming-Chang, Chuang, Yao-Chih, Zhang, Shengdong, Chen, Hong-Chih, Chang, Ting-Chang, Huang, Shin-Ping, Zhou, Kuan-Ju, Chen, Jian-Jie, Kuo, Chuan-Wei, Su, Wan-Ching, Tsao, Yu-Ching

المصدر: IEEE Electron Device Letters; Nov2019, Vol. 40 Issue 11, p1752-1755, 4p

مصطلحات موضوعية: ORGANIC semiconductors, TRANSISTORS, VOLTAGE control, ELECTRIC potential, LEAKAGE, VOLTAGE-gated ion channels, THIN film transistors, THRESHOLD voltage

7

دورية أكاديمية

Abnormal ${C}$ – ${V}$ Hump Effect Induced by Hot Carriers in Gate Length-Dependent p-Type LTPS TFTs.

المؤلفون: Huang, Shin-Ping, Shih, Yao-Kai, Chung, Yu-Hua, Chen, Wei-Han, Wang, Terry Tai-Jui, Zhang, Sheng-Dong, Chang, Ting-Chang, Chen, Po-Hsun, Tsao, Yu-Ching, Chen, Hong-Chih, Zheng, Yu-Zhe, Chu, Ann-Kuo, Shih, Yu-Shan, Wang, Yu-Xuan, Wu, Chia-Chuan

المصدر: IEEE Transactions on Electron Devices; Nov2019, Vol. 66 Issue 11, p4764-4767, 4p

مصطلحات موضوعية: HOT carriers, ELECTRON tunneling, ELECTRON traps, THIN film transistors, THRESHOLD voltage, PRESSURE swing adsorption process

8

دورية أكاديمية

Impact of Dehydrogenation Annealing Process Temperature on Reliability of Polycrystalline Silicon Thin Film Transistors.

المؤلفون: Huang, Shin-Ping, Chen, Po-Hsun, Chen, Hong-Chih, Zheng, Yu-Zhe, Chu, Ann-Kuo, Tsao, Yu-Ching, Shih, Yu-Shan, Wang, Yu-Xuan, Wu, Chia-Chuan, Lai, Wei-Chih, Chang, Ting-Chang

المصدر: IEEE Electron Device Letters; 10/1/2019, Vol. 40 Issue 10, p1638-1641, 4p

مصطلحات موضوعية: POLYCRYSTALLINE silicon, SILICON films, DEHYDROGENATION, ANNEALING of metals, THIN film transistors, RELIABILITY in engineering, DENSITY of states

9

دورية أكاديمية

A Novel Heat Dissipation Structure for Inhibiting Hydrogen Diffusion in Top-Gate a-InGaZnO TFTs.

المؤلفون: Chen, Hong-Chih, Chen, Guan-Fu, Chen, Po-Hsun, Huang, Shin-Ping, Chen, Jian-Jie, Zhou, Kuan-Ju, Kuo, Chuan-Wei, Tsao, Yu-Ching, Chu, An-Kuo, Huang, Hui-Chun, Lai, Wei-Chih, Chang, Ting-Chang

المصدر: IEEE Electron Device Letters; Sep2019, Vol. 40 Issue 9, p1447-1450, 4p

مصطلحات موضوعية: THRESHOLD voltage, DIFFUSION, HOT carriers, HYDROGEN, HEAT, TRANSISTORS

10

دورية أكاديمية

Abnormal Unsaturated Output Characteristics In a-InGaZnO TFTs With Light Shielding Layer.

المؤلفون: Chen, Hong-Chih, Zhou, Kuan-Ju, Chen, Po-Hsun, Chen, Guan-Fu, Huang, Shin-Ping, Chen, Jian-Jie, Kuo, Chuan-Wei, Tsao, Yu-Ching, Tai, Mao-Chou, Chu, An-Kuo, Lai, Wei-Chih, Chang, Ting-Chang

المصدر: IEEE Electron Device Letters; Aug2019, Vol. 40 Issue 8, p1281-1284, 4p

مصطلحات موضوعية: THRESHOLD voltage, COMPUTER-aided design, THIN film transistors, COMPUTER engineering

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