المؤلفون: Silva, J. P. B., Istrate, M. C., Hellenbrand, M., Jan, A., Becker, M. T., Symonowicz, J., Figueiras, F. G., Lenzi, V., Hill, M. O., Ghica, C., Romanyuk, K. N., Gomes, M. J. M., Martino, G. D., Marques, L., MacManus-Driscoll, J. L.

المصدر: Applied Materials Today

مصطلحات موضوعية: FERROELECTRICITY, ION-BEAM SPUTTERING, ORTHORHOMBIC PHASE ZRO2 FILMS, PIEZOELECTRICITY, CRYSTALLOGRAPHY, DENSITY FUNCTIONAL THEORY, FERROELECTRIC FILMS, HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY, ION BEAMS, POLARIZATION, SCANNING ELECTRON MICROSCOPY, SCANNING PROBE MICROSCOPY, SPUTTERING, STRONTIUM TITANATES, THICK FILMS, THIN FILMS, TITANIUM COMPOUNDS, ZIRCONIA, ION-BEAM-SPUTTERING, NEW APPROACHES, O PHASE, ORTHORHOMBIC PHASE, ORTHORHOMBIC PHASE ZRO2 FILM, PHASE PURE, PIEZOELECTRIC COEFFICIENT, REMNANT POLARIZATIONS, THIN-FILMS, ZRO 2 FILMS

وصف الملف: application/pdf

العلاقة: Silva, JPB, Istrate, MC, Hellenbrand, M, Jan, A, Becker, MT, Symonowicz, J, Figueiras, FG, Lenzi, V, Hill, MO, Ghica, C, Romanyuk, KN, Gomes, MJM, Martino, GD, Marques, L & MacManus-Driscoll, JL 2023, 'Ferroelectricity and negative piezoelectric coefficient in orthorhombic phase pure ZrO2 thin films', Applied Materials Today, Том. 30, 101708. https://doi.org/10.1016/j.apmt.2022.101708Test; Silva, J. P. B., Istrate, M. C., Hellenbrand, M., Jan, A., Becker, M. T., Symonowicz, J., Figueiras, F. G., Lenzi, V., Hill, M. O., Ghica, C., Romanyuk, K. N., Gomes, M. J. M., Martino, G. D., Marques, L., & MacManus-Driscoll, J. L. (2023). Ferroelectricity and negative piezoelectric coefficient in orthorhombic phase pure ZrO2 thin films. Applied Materials Today, 30, [101708]. https://doi.org/10.1016/j.apmt.2022.101708Test; Final; All Open Access, Hybrid Gold, Green; https://www.scopus.com/inward/record.uri?eid=2-s2.0-85144067583&doi=10.1016%2fj.apmt.2022.101708&partnerID=40&md5=f30c1a5db42a00f1cff339b7db4ccc05Test; https://doi.org/10.1016/j.apmt.2022.101708Test; http://elar.urfu.ru/handle/10995/130370Test; 85144067583; 000976443200001

الإتاحة: https://doi.org/10.1016/j.apmt.2022.101708Test
http://elar.urfu.ru/handle/10995/130370Test

المؤلفون: Lenzi, Veniero, Cavaleiro, Albano, Fernandes, Filipe, Marques, L.

مصطلحات موضوعية: Ab initio, Diffusion, Grain boundary, Molecular dynamics, Thin films, TiN(Ag) nanocomposite coatings, Ciências Naturais::Ciências Físicas, Science & Technology

وصف الملف: application/pdf

العلاقة: info:eu-repo/grantAgreement/FCT/5665-PICT/UTAP-EXPL%2FNTec%2F0107%2F2017/PT; info:eu-repo/grantAgreement/FCT/6817 - DCRRNI ID/UIDB%2F04650%2F2020/PT; info:eu-repo/grantAgreement/FCT/6817 - DCRRNI ID/UIDB%2F00285%2F2020/PT; https://www.sciencedirect.com/science/article/pii/S016943322100814XTest; Lenzi, V., Cavaleiro, A., Fernandes, F., & Marques, L. (2021). Diffusion of silver in titanium nitride: Insights from density functional theory and molecular dynamics. Applied Surface Science, 556, 149738. doi: https://doi.org/10.1016/j.apsusc.2021.149738Test; https://hdl.handle.net/1822/78429Test

الإتاحة: https://doi.org/10.1016/j.apsusc.2021.149738Test
https://hdl.handle.net/1822/78429Test

المؤلفون: Borges, Joel Nuno Pinto, Barradas, Nuno P., Alves, Eduardo, Martin, Nicolas, Beaufort, Marie France, Camelio, Sophie, Eyidi, Dominique, Girardeau, Thierry, Paumier, Fabien, Rivière, J. P., Vaz, F., Marques, L.

المساهمون: Universidade do Minho

مصطلحات موضوعية: Reactive DC magnetron sputtering, Thin films, AlOxNy, Target potential, Deposition rate, Composition, Structure, Grain size, Morphology, Percolating network, XPS, TEM, Electrical and optical properties, Reflectance, Refractive index, Extinction coefficient, Electrical resistivity, Temperature coefficient of resistance (TCR), Broadband absorption

وصف الملف: application/pdf

العلاقة: http://www.benthamscience.com/ebooks/9781608051564/index.htmTest

الإتاحة: http://hdl.handle.net/1822/23980Test

المؤلفون: Lima, P., Araújo, M., Mathew, M. T., Rocha, L. A., Pinto, A. M. P., Chappé, J. M., Ramos, Marta M. D., Marques, L., Pierson, J. F., Vaz, F.

مصطلحات موضوعية: Tribocorrosion, Thin films, Structural characterization, Materials degradation, Engenharia e Tecnologia::Engenharia dos Materiais, Science & Technology

وصف الملف: application/pdf

العلاقة: https://hdl.handle.net/1822/34510Test

الإتاحة: https://doi.org/10.1016/j.triboint.2013.06.003Test
https://hdl.handle.net/1822/34510Test

المؤلفون: Marques, L., Fernandes, Ana C., Vaz, F., Ramos, Marta M. D.

مصطلحات موضوعية: Density functional theory (DFT), Titanium oxycarbid, Structure, Elastic constants, Thin films, titanium oxycarbide, Science & Technology

وصف الملف: application/pdf

العلاقة: "Plasma processes and polymers". ISSN 1612-8850. 4 (May 2007) S195-S199.; http://hdl.handle.net/1822/6355Test

الإتاحة: https://doi.org/10.1002/ppap.200730610Test
http://hdl.handle.net/1822/6355Test

المؤلفون: Carvalho, P., Borges, Joel Nuno Pinto, Rodrigues, M. S., Barradas, N. P., Alves, E., Espinós, J. P., González-Elipe, A. R., Cunha, L., Marques, L., Vasilevskiy, Mikhail, Vaz, F.

مصطلحات موضوعية: Magnetron sputtering, Thin Films, Zirconium oxynitride, Electronic structure, Optical properties, Ciências Naturais::Ciências Físicas, Engenharia e Tecnologia::Engenharia dos Materiais, Science & Technology

وصف الملف: application/pdf

العلاقة: info:eu-repo/grantAgreement/FCT/COMPETE/132974/PT; http://www.sciencedirect.com/science/article/pii/S0169433215022230Test; Carvalho, P., Borges, J., Rodrigues, M. S., Barradas, N. P., Alves, E., Espinós, J. P., . . . Vaz, F. (2015). Optical properties of zirconium oxynitride films: The effect of composition, electronic and crystalline structures. Applied Surface Science, 358, 660-669. doi:10.1016/j.apsusc.2015.09.129; https://hdl.handle.net/1822/39816Test

الإتاحة: https://doi.org/10.1016/j.apsusc.2015.09.129Test
https://hdl.handle.net/1822/39816Test

المؤلفون: Borges, Joel Nuno Pinto, Macedo, Francisco, Couto, F. M., Rodrigues, M.S., Lopes, Cláudia Jesus Ribeiro, Pedrosa, P., Polcar, T., Marques, L., Vaz, F.

مصطلحات موضوعية: Sputtering, Thin Films, Nitrides, Oxides, Microstructure, Thermal properties, Ciências Naturais::Ciências Físicas, Science & Technology

وصف الملف: application/pdf

العلاقة: info:eu-repo/grantAgreement/FCT/COMPETE/132974/PT; info:eu-repo/grantAgreement/FCT/COMPETE/132998/PT; http://www.sciencedirect.com/science/article/pii/S0254058415302741Test#; Borges, J., Macedo, F., Couto, F. M., Rodrigues, M. S., Lopes, C., Pedrosa, P., . . . Vaz, F. (2015). The influence of nitrogen and oxygen additions on the thermal characteristics of aluminium-based thin films. Materials Chemistry and Physics, 163, 569-580. doi:10.1016/j.matchemphys.2015.08.015; https://hdl.handle.net/1822/39819Test

الإتاحة: https://doi.org/10.1016/j.matchemphys.2015.08.015Test
https://hdl.handle.net/1822/39819Test

المؤلفون: Marques, L. G. A., Cavalcante, L. S., Simoes, A. Z., Pontes, F. M., Santos-Junior, L. S., Santos, M. R. M. C., Rosa, I. L. V., Varela, José Arana, Longo, Elson

المساهمون: Universidade Estadual Paulista (UNESP)

مصطلحات موضوعية: dielectric properties, BZT, thin films, temperature dependence

وصف الملف: 293-297

العلاقة: Materials Chemistry and Physics; 2.210; 0,615; http://dx.doi.org/10.1016/j.matchemphys.2007.04.065Test; Materials Chemistry and Physics. Lausanne: Elsevier B.V. Sa, v. 105, n. 2-3, p. 293-297, 2007.; http://hdl.handle.net/11449/25390Test; WOS:000250278300029

الإتاحة: https://doi.org/10.1016/j.matchemphys.2007.04.065Test
http://hdl.handle.net/11449/25390Test

المؤلفون: Borges, Joel Nuno Pinto, Fonseca, C., Barradas, Nuno P., Alves, Eduardo, Girardeau, Thierry, Paumier, Fabien, Vaz, F., Marques, L.

المساهمون: Universidade do Minho

مصطلحات موضوعية: Thin films, AlOxNy, Optical stability, Corrosion, EIS, AlO N x y, Science & Technology

وصف الملف: application/pdf

العلاقة: 0013-4686; http://www.sciencedirect.com/science/article/pii/S0013468613009249Test

الإتاحة: http://hdl.handle.net/1822/24545Test

المؤلفون: Lima, P., Araújo, M., Mathew, M. T., Rocha, L. A., Pinto, A. M., Chappé, J. M., Ramos, M. D., Marques, L., Pierson, J. F., Vaz, F.

المساهمون: Universidade Estadual Paulista (UNESP)

مصطلحات موضوعية: Materials degradation, Structural characterization, Thin films, Tribocorrosion

العلاقة: Tribology International; Tribology International.; http://hdl.handle.net/11449/75986Test; http://acervodigital.unesp.br/handle/11449/75986Test; WOS:000328237200002; 2-s2.0-84880027909; http://dx.doi.org/10.1016/j.triboint.2013.06.003Test

الإتاحة: https://doi.org/10.1016/j.triboint.2013.06.003Test
http://acervodigital.unesp.br/handle/11449/75986Test
http://hdl.handle.net/11449/75986Test