المؤلفون: Kuen-Jong Lee, Sudhakar M. Reddy, Chong-Siao Ye, Shi-Xuan Zheng, Janusz Rajski, Wu-Tung Cheng, Justyna Zawada, Mark Kassab, Chen Wang, Fong-Jyun Tsai

المصدر: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 41:2323-2336

مصطلحات موضوعية: Computer science, Small number, Range (statistics), Test compression, Electrical and Electronic Engineering, Automatic test pattern generation, Computer Graphics and Computer-Aided Design, Software, Simulation, Test (assessment), Volume (compression), Communication channel, Test data

الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::d61f50163eaa92a209e113e0c99da404Test
https://doi.org/10.1109/tcad.2021.3099100Test

المؤلفون: Ye, Chong-Siao, Zheng, Shi-Xuan, Tsai, Fong-Jyun, Wang, Chen, Lee, Kuen-Jong, Cheng, Wu-Tung, Reddy, Sudhakar M., Zawada, Justyna, Kassab, Mark, Rajski, Janusz

المصدر: IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems; Jul2022, Vol. 41 Issue 7, p2323-2336, 14p

مصطلحات موضوعية: SYSTEMS on a chip, INDUSTRIAL costs, DISCRETE Fourier transforms, INDUSTRIAL design

المؤلفون: Gaurav Veda, Cheng-Hung Wu, Sudhakar M. Reddy, Yu Huang, Chun-Cheng Hu, Kuen-Jong Lee, Chong-Siao Ye, Wu-Tung Cheng

المصدر: ATS

مصطلحات موضوعية: Set (abstract data type), Computer engineering, Computer science, business.industry, Deep learning, Code coverage, Experimental data, Test compression, Artificial intelligence, business, Power budget, Test data, Volume (compression)

الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::d88e3d9827bdae550671a653dcfccf0fTest
https://doi.org/10.1109/ats47505.2019.000-9Test

المؤلفون: Janusz Rajski, Derek Feltham, Nilanjan Mukherjee, Elham Moghaddam, Sudhakar M. Reddy, Justyna Zawada, Yingdi Liu, Cesar Acero, Marek Patyra, Jerzy Tyszer

المصدر: IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 25:2949-2961

مصطلحات موضوعية: Engineering, business.industry, Design for testing, 020208 electrical & electronic engineering, Test compression, 02 engineering and technology, Automatic test pattern generation, 020202 computer hardware & architecture, Test (assessment), Hardware and Architecture, Logic gate, Fault coverage, 0202 electrical engineering, electronic engineering, information engineering, Electrical and Electronic Engineering, business, Algorithm, Software, Test data, Volume (compression)

الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::5a3ec1a96f4889637c66871d58d387c0Test
https://doi.org/10.1109/tvlsi.2017.2717844Test

المؤلفون: Mark Kassab, Chen Wang, Amit Kumar, Sudhakar M. Reddy, Jerzy Tyszer, Elham Moghaddam, Janusz Rajski, Nilanjan Mukherjee

المصدر: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 34:1847-1859

مصطلحات موضوعية: Engineering, business.industry, Real-time computing, Test compression, Automatic test pattern generation, Residual, Fault (power engineering), Computer Graphics and Computer-Aided Design, Encoding (memory), Compression ratio, System on a chip, Electrical and Electronic Engineering, Cube, business, Algorithm, Software

الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::51d76a540ba75184e22d50f007fdae35Test
https://doi.org/10.1109/tcad.2015.2432133Test

المؤلفون: Sudhakar M. Reddy, Zhuo Zhang

المصدر: it - Information Technology. 56:150-156

مصطلحات موضوعية: Very-large-scale integration, Boundary scan, General Computer Science, Computer science, Test set, Scan chain, Benchmark (computing), Test compression, Algorithm, Electronic circuit, Test (assessment)

الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::c7bf8758671de3c4683bb4715dbf87eeTest
https://doi.org/10.1515/itit-2013-1039Test

المؤلفون: Nilanjan Mukherjee, Sudhakar M. Reddy, Elham Moghaddam, Jerzy Tyszer, Yingdi Liu, Janusz Rajski

المصدر: ITC

مصطلحات موضوعية: Engineering, business.industry, 0211 other engineering and technologies, Process (computing), Potential candidate, Test compression, Hardware_PERFORMANCEANDRELIABILITY, 02 engineering and technology, Automatic test pattern generation, Conflict analysis, 020202 computer hardware & architecture, Test (assessment), Logic gate, Hardware_INTEGRATEDCIRCUITS, 0202 electrical engineering, electronic engineering, information engineering, business, Algorithm, Selection (genetic algorithm), Hardware_LOGICDESIGN, 021106 design practice & management

الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::b698cb79a671454e49401d6326127920Test
https://doi.org/10.1109/test.2016.7805825Test

المؤلفون: Irith Pomeranz, Sudhakar M. Reddy

المصدر: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 29:502-506

مصطلحات موضوعية: Engineering, business.industry, Real-time computing, Test compression, Automatic test pattern generation, Computer Graphics and Computer-Aided Design, Test (assessment), Stuck-at fault, Test vector, Test set, Fault coverage, Electrical and Electronic Engineering, business, Algorithm, Software, Dynamic testing

الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::565b9f3bdb30945d1332355ccb89ae57Test
https://doi.org/10.1109/tcad.2010.2041853Test

المؤلفون: Sudhakar M. Reddy, Irith Pomeranz

المصدر: ACM Transactions on Design Automation of Electronic Systems. 15:1-22

مصطلحات موضوعية: Stuck-at fault, Computer science, Fault coverage, Test compression, Electrical and Electronic Engineering, Automatic test pattern generation, Fault (power engineering), Focus (optics), Computer Graphics and Computer-Aided Design, Algorithm, Computer Science Applications, Electronic circuit, Test (assessment)

الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::0e4c8240fbf1dba1ed69395516da9663Test
https://doi.org/10.1145/1640457.1640464Test

المؤلفون: Xiaoqing Wen, Sudhakar M. Reddy, Seiji Kajihara, Kohei Miyase, Kenta Terashima

المصدر: IEICE Transactions on Information and Systems. :683-689

مصطلحات موضوعية: Sequential logic, Computer science, test vector generation, Test compression, Hardware_PERFORMANCEANDRELIABILITY, Automatic test pattern generation, Stuck-at fault, fault extraction, Artificial Intelligence, Hardware and Architecture, test vector modification, Test set, Fault coverage, defect based testing, Computer Vision and Pattern Recognition, Electrical and Electronic Engineering, Algorithm, bridging faults, Software, Test data

وصف الملف: application/pdf

الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::7a4c37eb1d1c55c3436d8c67288dd7f2Test
https://doi.org/10.1093/ietisy/e91-d.3.683Test