-
1مؤتمر
المؤلفون: Sitek, Jakub, McAlesee, Clifford, Conran, Ben, Pasternak, Iwona, Czerniak-Losiewicz, Karolina, Zdrojek, Mariusz, Teo, Ken, Strupinski, Wlodek
العلاقة: info:eu-repo/grantAgreement/EC/H2020/824962/; https://zenodo.org/communities/car2tera-h2020Test; https://zenodo.org/record/3475140Test; https://doi.org/10.5281/zenodo.3475140Test; oai:zenodo.org:3475140
الإتاحة: https://doi.org/10.5281/zenodo.3475140Test
https://doi.org/10.5281/zenodo.3475139Test
https://zenodo.org/record/3475140Test -
2دورية أكاديمية
المؤلفون: Mackenzie, David M A, Kalhauge, Kristoffer Gram, Whelan, Patrick Rebsdorf, Østergaard, Frederik W, Pasternak, Iwona, Strupinski, Wlodek, Bøggild, Peter, Jepsen, Peter Uhd, Petersen, Dirch Hjorth
المصدر: Mackenzie , D M A , Kalhauge , K G , Whelan , P R , Østergaard , F W , Pasternak , I , Strupinski , W , Bøggild , P , Jepsen , P U & Petersen , D H 2020 , ' Wafer-scale graphene quality assessment using micro four-point probe mapping ' , Nanotechnology , vol. 31 , no. 22 , 225709 . https://doi.org/10.1088/1361-6528/ab7677Test
مصطلحات موضوعية: Graphene, SiC, Conductance, Micro four-point probes, Terahertz spectroscopy, Metrology, Mapping
وصف الملف: application/pdf
الإتاحة: https://doi.org/10.1088/1361-6528/ab7677Test
https://orbit.dtu.dk/en/publications/2e9239c4-c643-4c1f-b48e-76ebef91e072Test
https://backend.orbit.dtu.dk/ws/files/208916220/Mackenzie_2020_Nanotechnology_31_225709.pdfTest -
3دورية أكاديمية
المؤلفون: Bueno, Rebeca A., Palacio, Irene, Munuera, C., Aballe, Lucía, Foerster, M., Strupinski, Wlodek, García-Hernández, M., Martín-Gago, José A., López, María Francisca
المساهمون: European Commission, Ministerio de Economía y Competitividad (España)
العلاقة: #PLACEHOLDER_PARENT_METADATA_VALUE#; info:eu-repo/grantAgreement/EC/H2020/785219; info:eu-repo/grantAgreement/MINECO/Plan Estatal de Investigación Científica y Técnica y de Innovación 2013-2016/MAT2017-85089-C2-1-R; info:eu-repo/grantAgreement/MINECO/Plan Estatal de Investigación Científica y Técnica y de Innovación 2013-2016/MAT2014-52405-C2-2-R; info:eu-repo/grantAgreement/MINECO/Plan Estatal de Investigación Científica y Técnica y de Innovación 2013-2016/RYC-2014-16626; Postprint; https://doi.org/10.1016/j.apsusc.2018.09.262Test; Sí; Applied Surface Science 466: 51-58 (2019); http://hdl.handle.net/10261/170738Test; http://dx.doi.org/10.13039/501100003329Test; http://dx.doi.org/10.13039/501100000780Test
الإتاحة: https://doi.org/10.1016/j.apsusc.2018.09.262Test
https://doi.org/10.13039/501100003329Test
https://doi.org/10.13039/501100000780Test
http://hdl.handle.net/10261/170738Test -
4
المؤلفون: Sitek, Jakub, McAlesee, Clifford, Conran, Ben, Pasternak, Iwona, Czerniak-Losiewicz, Karolina, Zdrojek, Mariusz, Teo, Ken, Strupinski, Wlodek
مصطلحات موضوعية: SiC, sapphire, graphene, 7. Clean energy
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::7a8e110d7f0a611640a4ed0b1213cd1fTest
-
5
المؤلفون: Sitek, Jakub, McAlesee, Clifford, Conran, Ben, Pasternak, Iwona, Czerniak-Losiewicz, Karolina, Zdrojek, Mariusz, Teo, Ken, Strupinski, Wlodek
مصطلحات موضوعية: SiC, sapphire, graphene, 7. Clean energy
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::6d2758ef8ab73a7ce9666ecdf73db4d7Test
