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1دورية أكاديمية
المؤلفون: Enrique Maset, Pedro Martín-Holgado, Yolanda Morilla, David Gilabert, Esteban Sanchis-Kilders, Pedro J. Martínez
المصدر: Applied Sciences, Vol 12, Iss 22, p 11578 (2022)
مصطلحات موضوعية: high-electron-mobility transistor (HEMT), gallium nitride (GaN), radiation hardness, assurance testing, radiation effects, total ionising dose (TID), Technology, Engineering (General). Civil engineering (General), TA1-2040, Biology (General), QH301-705.5, Physics, QC1-999, Chemistry, QD1-999
وصف الملف: electronic resource
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2دورية أكاديمية
المؤلفون: Daniel Prelipcean, Giuseppe Lerner, Ivan Slipukhin, David Lucsanyi, Hampus Sandberg, James Storey, Pedro Martin-Holgado, Amor Romero-Maestre, Yolanda Morilla García, Rubén García Alía
المصدر: Applied Sciences, Vol 14, Iss 2, p 624 (2024)
مصطلحات موضوعية: Timepix3, radiation monitor, Radiation to Electronics (R2E), FLUKA, silicon pixel detector, saturation effect, Technology, Engineering (General). Civil engineering (General), TA1-2040, Biology (General), QH301-705.5, Physics, QC1-999, Chemistry, QD1-999
العلاقة: https://www.mdpi.com/2076-3417/14/2/624Test; https://doaj.org/toc/2076-3417Test; https://doaj.org/article/9a85dec2a5034f3198af660c606f6952Test
الإتاحة: https://doi.org/10.3390/app14020624Test
https://doaj.org/article/9a85dec2a5034f3198af660c606f6952Test