التفاصيل البيبلوغرافية
| العنوان: |
STRONG DEGRADATION OF PHYSICAL PROPERTIES AND FORMATION OF A DEAD LAYER IN FERROELECTRIC FILMS DUE TO INTERFACIAL DISLOCATIONS. |
| المؤلفون: |
MISIRLIOGLU, I. B.1, VASILIEV, A. L.1, AINDOW, M.1, ALPAY, S. P.1 p.alpay@ims.uconn.edu |
| المصدر: |
Integrated Ferroelectrics. 2005, Vol. 71 Issue 1, p67-80. 14p. |
| مصطلحات موضوعية: |
*FERROELECTRIC thin films, *THIN films, *SOLID state electronics, *SOLIDS, *ELECTRIC resistors, *ELECTRONIC equipment |
| مستخلص: |
Dislocations are the most common type of secondary defects and are unavoidaly present in all crystalline materials. They have een oserved in ferroelectric materials as in many other materials systems. Experiments have shown that they may have a significant impact on the degradation of the electrical properties and may change phase transition characteristics in epitaxial ferroelectric thin films. In this study, we provide a general overview of experimental oservations comined with a preliminary thermodynamic analysis. [ABSTRACT FROM AUTHOR] |
| قاعدة البيانات: |
Academic Search Index |
