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1دورية أكاديمية
المؤلفون: Agnolin, Marco, Di Vita, Davide, Borghi, Giacomo, Carminati, Marco, Camera, Franco, Wieland, Oliver, Million, Bénédicte, Giaz, Agnese, Mihai, Constantin, Turturica, Andrei, Costache, Cristian, Borcea, Ruxandra, Söderström, Pär-Anders, Ban, Rebeca Sara, Fiorini, Carlo
المساهمون: Istituto Nazionale di Fisica Nucleare (INFN) under the GAMMA experiment and Politecnico di Milan, Romanian Ministry of Research, Innovation and Digitalization
المصدر: IEEE Transactions on Nuclear Science ; volume 70, issue 10, page 2337-2343 ; ISSN 0018-9499 1558-1578
مصطلحات موضوعية: Electrical and Electronic Engineering, Nuclear Energy and Engineering, Nuclear and High Energy Physics
الإتاحة: https://doi.org/10.1109/tns.2023.3312424Test
http://xplorestaging.ieee.org/ielx7/23/10287667/10243063.pdf?arnumber=10243063Test -
2دورية أكاديمية
المؤلفون: Cozzi, Giulia, Busca, Paolo, Carminati, Marco, Fiorini, Carlo, Montagnani, Giovanni L., Acerbi, Fabio, Gola, Alberto, Paternoster, Giovanni, Piemonte, Claudio, Regazzoni, Veronica, Blasi, Nives, Camera, Franco, Million, Benedicte
المساهمون: Cozzi, Giulia, Busca, Paolo, Carminati, Marco, Fiorini, Carlo, Montagnani, Giovanni L., Acerbi, Fabio, Gola, Alberto, Paternoster, Giovanni, Piemonte, Claudio, Regazzoni, Veronica, Blasi, Nive, Camera, Franco, Million, Benedicte
مصطلحات موضوعية: Cerium-doped lanthanum bromide (LaBrâ:ce), gamma-ray spectroscopy, nuclear physic, photomultiplier tube (PMT), silicon photomultiplier (SIPM), Nuclear and High Energy Physic, Nuclear Energy and Engineering, Electrical and Electronic Engineering
العلاقة: info:eu-repo/semantics/altIdentifier/wos/WOS:000422922000020; volume:65; issue:1; firstpage:645; lastpage:655; numberofpages:11; journal:IEEE TRANSACTIONS ON NUCLEAR SCIENCE; http://hdl.handle.net/11311/1048430Test; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85039772529; http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=23Test
الإتاحة: https://doi.org/10.1109/TNS.2017.2784238Test
http://hdl.handle.net/11311/1048430Test
http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=23Test
