دورية أكاديمية

Performance enhancement of Al/La2O3/ZrO2/4H–SiC MOS device with LaON as interfacial passivation layer

التفاصيل البيبلوغرافية
العنوان: Performance enhancement of Al/La2O3/ZrO2/4H–SiC MOS device with LaON as interfacial passivation layer
المؤلفون: Barhate, Viral N., Agrawal, Khushabu S., Patil, Vilas S., Patil, Sumit R., Mahajan, Ashok M.
المساهمون: Council of Scientific and Industrial Research (CSIR), New Delhi, University Grant Commission (UGC), New Delhi, Special Assistance Programme for Departmental Research Support, Organic Photovoltaic Laboratory, School of Physical Sciences, KBC North Maharashtra University, Jalgaon
المصدر: Materials Science in Semiconductor Processing ; volume 117, page 105161 ; ISSN 1369-8001
بيانات النشر: Elsevier BV
سنة النشر: 2020
المجموعة: ScienceDirect (Elsevier - Open Access Articles via Crossref)
مصطلحات موضوعية: Mechanical Engineering, Mechanics of Materials, Condensed Matter Physics, General Materials Science
نوع الوثيقة: article in journal/newspaper
اللغة: English
DOI: 10.1016/j.mssp.2020.105161
الإتاحة: https://doi.org/10.1016/j.mssp.2020.105161Test
https://api.elsevier.com/content/article/PII:S1369800120300846?httpAccept=text/xmlTest
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حقوق: https://www.elsevier.com/tdm/userlicense/1.0Test/
رقم الانضمام: edsbas.B333AB7D
قاعدة البيانات: BASE