التفاصيل البيبلوغرافية
| العنوان: |
Investigation of the electrical and the dielectric properties of various LB films |
| المؤلفون: |
Zhang, L, Zhu, M, Liu, ZX, Shen, JC, Bai, YB, Li, TJ, Wei, C, Song, WX |
| سنة النشر: |
1995 |
| المجموعة: |
Research Center for Eco-Environmental Sciences: RCEES OpenIR (Chinese Academy of Sciences) / 中国科学院生态环境研究中心机构知识库 |
| مصطلحات موضوعية: |
Lb Films, Mis And Mim Structure, Electrical And Dielectric Properties, Chemistry |
| الوصف: |
The electrical and dielectric properties of metal-insulator-semiconductor(MIS) and metal-insulator-metal(MIM) structures of various LB films were investigated. High frequency capacitance-voltage(C-V) measurements of the MIS structures of the LB films showed the accumulation, depletion and inversion regions. The dielectric constants of various LB films were calculated. Contrast with other LB films, the microgel star-shaped amphiphile(MSA) LB film showed a potential application in electronic devices due to its higher thermal and mechanical stabilities. The breakdown voltage of the MIM structure of the MSA containing only a single monolayer is over 200 V. |
| نوع الوثيقة: |
report |
| اللغة: |
unknown |
| العلاقة: |
CHEMICAL JOURNAL OF CHINESE UNIVERSITIES-CHINESE; Zhang, L,Zhu, M,Liu, ZX,et al. Investigation of the electrical and the dielectric properties of various LB films[J]. CHEMICAL JOURNAL OF CHINESE UNIVERSITIES-CHINESE,1995,16(11):167-171.; http://ir.rcees.ac.cn/handle/311016/24442Test |
| الإتاحة: |
http://ir.rcees.ac.cn/handle/311016/24442Test |
| حقوق: |
cn.org.cspace.api.content.CopyrightPolicy@ea5d2d |
| رقم الانضمام: |
edsbas.6028B2A |
| قاعدة البيانات: |
BASE |
