-
1
المؤلفون: Jerzy Tyszer, Janusz Rajski, Nilanjan Mukherjee, Sudhakar M. Reddy, Yingdi Liu
المصدر: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 39:1699-1710
مصطلحات موضوعية: Functional safety, business.industry, Computer science, Reliability (computer networking), Automotive industry, Advanced driver assistance systems, 02 engineering and technology, Integrated circuit, Fault (power engineering), Computer Graphics and Computer-Aided Design, 020202 computer hardware & architecture, Reliability engineering, law.invention, Built-in self-test, law, 0202 electrical engineering, electronic engineering, information engineering, Electrical and Electronic Engineering, business, Software
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::17456d633e4abd0865bc0a4619665361Test
https://doi.org/10.1109/tcad.2019.2925353Test -
2
المؤلفون: Karthik Raman, Sudhakar M, Raghunathan Rengaswamy
المصدر: Scientific Reports
Scientific Reports, Vol 12, Iss 1, Pp 1-12 (2022)مصطلحات موضوعية: Mutation rate, Science, Nonsense mutation, Genomics, Computational biology, Biology, medicine.disease_cause, Article, law.invention, law, Neoplasms, Machine learning, Cancer genomics, medicine, Humans, Genes, Tumor Suppressor, Tumour-suppressor proteins, Gene, Oncogene Proteins, Multidisciplinary, Tumor Suppressor Proteins, Oncogenes, Mutation, Mutation (genetic algorithm), Medicine, Suppressor, Identification (biology), Carcinogenesis, human activities
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::02eeefe6e57cc64fd9e3453d7b31f970Test
https://doi.org/10.1038/s41598-021-04015-yTest -
3
المصدر: ACM Transactions on Design Automation of Electronic Systems. 24:1-19
مصطلحات موضوعية: Computer science, Page layout, 0211 other engineering and technologies, Hardware_PERFORMANCEANDRELIABILITY, 02 engineering and technology, Chip, computer.software_genre, Computer Graphics and Computer-Aided Design, 020202 computer hardware & architecture, Computer Science Applications, Design for manufacturability, law.invention, Reliability engineering, Microprocessor, law, Hardware_INTEGRATEDCIRCUITS, 0202 electrical engineering, electronic engineering, information engineering, Benchmark (computing), OpenSPARC, Electrical and Electronic Engineering, computer, AND gate, Hardware_LOGICDESIGN, 021106 design practice & management, Electronic circuit
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::8265fcc055d5ea7d34007866f26fcac1Test
https://doi.org/10.1145/3325066Test -
4
المؤلفون: Cheng-Hung Wu, Kuen-Jong Lee, Sheng-Lin Lin, Sudhakar M. Reddy
المصدر: IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 26:2254-2267
مصطلحات موضوعية: 021110 strategic, defence & security studies, Computer science, Transistor, 0211 other engineering and technologies, Hardware_PERFORMANCEANDRELIABILITY, 02 engineering and technology, Maintenance engineering, 020202 computer hardware & architecture, Reliability engineering, law.invention, Hardware and Architecture, law, Logic gate, 0202 electrical engineering, electronic engineering, information engineering, Redundancy (engineering), Electrical and Electronic Engineering, human activities, Software, AND gate, Electronic circuit
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::083cca6a70bd2cf8f4930afd9e39953aTest
https://doi.org/10.1109/tvlsi.2018.2856527Test -
5
المصدر: DATE
مصطلحات موضوعية: 010302 applied physics, Computer science, Context (language use), Hardware_PERFORMANCEANDRELIABILITY, 02 engineering and technology, Fault (power engineering), 01 natural sciences, 020202 computer hardware & architecture, law.invention, Design for manufacturability, Reliability engineering, Microprocessor, law, Logic gate, 0103 physical sciences, 0202 electrical engineering, electronic engineering, information engineering, Benchmark (computing), Physical design, AND gate, Hardware_LOGICDESIGN, Electronic circuit
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::2eb85868e228144dfa8013dff20afcf3Test
https://doi.org/10.23919/date.2019.8715037Test -
6
المؤلفون: Nilanjan Mukherjee, Yingdi Liu, Jerzy Tyszer, Sudhakar M. Reddy, Janusz Rajski
المصدر: ITC
مصطلحات موضوعية: Functional safety, Scheme (programming language), business.industry, Computer science, media_common.quotation_subject, Reliability (computer networking), Automotive industry, Advanced driver assistance systems, 02 engineering and technology, Integrated circuit, 020202 computer hardware & architecture, law.invention, Computer engineering, law, Compression (functional analysis), 0202 electrical engineering, electronic engineering, information engineering, Quality (business), business, computer, media_common, computer.programming_language
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::d4deba4a8e58ac7f706469e2980718f5Test
https://doi.org/10.1109/test.2018.8624872Test -
7
المؤلفون: Saqib Khursheed, Daniele Rossi, Sudhakar M. Reddy, Vasileios Tenentes
المصدر: European Test Symposium
ETSمصطلحات موضوعية: Novel technique, Power gating, Computer science, Hardware_PERFORMANCEANDRELIABILITY, 02 engineering and technology, Integrated circuit, 020202 computer hardware & architecture, law.invention, law, Very High Confidence, Hardware_INTEGRATEDCIRCUITS, 0202 electrical engineering, electronic engineering, information engineering, Electronic engineering, Power network, Sleep (system call), Hardware_LOGICDESIGN, Degradation (telecommunications), Electronic circuit
وصف الملف: application/pdf
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a49aa73a2ea1bc53e6e1d60208d227cdTest
-
8
المؤلفون: Bernd Becker, Dominik Erb, Adit D. Singh, Jan Burchard, Sudhakar M. Reddy
المصدر: VTS
مصطلحات موضوعية: 010302 applied physics, Very-large-scale integration, Hazard (logic), Engineering, business.industry, Transistor, Hardware_PERFORMANCEANDRELIABILITY, 02 engineering and technology, Fault (power engineering), 01 natural sciences, 020202 computer hardware & architecture, law.invention, Reliability engineering, CMOS, law, Logic gate, Embedded system, 0103 physical sciences, Fault coverage, 0202 electrical engineering, electronic engineering, information engineering, business, Hardware_LOGICDESIGN, Electronic circuit
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::f7654fd000169765d852391a1684dda2Test
https://doi.org/10.1109/vts.2017.7928943Test -
9
المؤلفون: Xijiang Lin, Sudhakar M. Reddy
المصدر: ITC
مصطلحات موضوعية: Engineering, Bridging (networking), AND-OR-Invert, Pass transistor logic, business.industry, Transistor, Hardware_PERFORMANCEANDRELIABILITY, Cell function, law.invention, Stuck-at fault, CMOS, law, Logic gate, Hardware_INTEGRATEDCIRCUITS, Electronic engineering, business, Algorithm, Hardware_LOGICDESIGN
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::d7c5900436515f6534848d3c69da7c04Test
https://doi.org/10.1109/test.2015.7342382Test -
10
المؤلفون: Sudhakar M. Reddy, Irith Pomeranz
المصدر: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 28:426-432
مصطلحات موضوعية: geography, Engineering, geography.geographical_feature_category, Sequential logic, business.industry, Unit of time, Transistor, Real-time computing, Hardware_PERFORMANCEANDRELIABILITY, Fault (geology), Span (engineering), Computer Graphics and Computer-Aided Design, Fault detection and isolation, law.invention, law, Line (geometry), Electrical and Electronic Engineering, Fault model, business, Algorithm, Software
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::cfa796e1c89d567c6d488c657a540441Test
https://doi.org/10.1109/tcad.2009.2013281Test