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المؤلفون: Jian Zhang, Shi Pan, Guoshu Jian, Wei Suen, Yinli Li, Xiaoqiu Wang, Shifs Wu
المصدر: Ultramicroscopy. 104:1-7
مصطلحات موضوعية: Photon, business.industry, Chemistry, Phase-contrast imaging, Physics::Optics, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials, law.invention, Optics, Normalized frequency (fiber optics), law, Microscopy, Scanning tunneling microscope, business, Instrumentation, Refractive index, Tip position, Quantum tunnelling
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::612a46fe171977ceb85a11ae82a028e9Test
https://doi.org/10.1016/j.ultramic.2005.01.001Test -
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المؤلفون: Sheau-shi Pan, Hsien-Chi Yeh, Wei-Tou Ni
المصدر: Control Engineering Practice. 13:559-566
مصطلحات موضوعية: Physics, Positioning system, business.industry, Applied Mathematics, Laser, Computer Science Applications, law.invention, Metrology, Scanning probe microscopy, Interferometry, Optics, Control and Systems Engineering, law, Control system, Digital control, Electrical and Electronic Engineering, Scanning tunneling microscope, business
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::f61edcf20d569cadea2cb4d439f0852aTest
https://doi.org/10.1016/j.conengprac.2004.04.019Test -
3
المصدر: SPIE Proceedings.
مصطلحات موضوعية: Microscope, Materials science, Optical fiber, Cantilever, business.industry, Bent molecular geometry, Physics::Optics, Near and far field, Isotropic etching, law.invention, Optics, law, Fiber, Scanning tunneling microscope, business
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::31890659718308f934a66e14a395358aTest
https://doi.org/10.1117/12.576244Test -
4
المؤلفون: Guoshu Jian, Fei Bai, Shifa Wu, Shi Pan
المصدر: SPIE Proceedings.
مصطلحات موضوعية: Physics, Scanning Hall probe microscope, Optical fiber, Microscope, business.industry, Physics::Optics, Near and far field, Scanning capacitance microscopy, law.invention, Scanning probe microscopy, Optics, Optical microscope, law, Scanning tunneling microscope, business
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::e391d3e6fca29eb4743125fa5042806eTest
https://doi.org/10.1117/12.576464Test -
5
المؤلفون: Yinli Li, Wei Sun, Shi Pan, Jian Zhang, Shifa Wu, Kai Xu, Yuqi Huang
المصدر: SPIE Proceedings.
مصطلحات موضوعية: Physics, Photon, business.industry, Near-field optics, Photography, Phase (waves), Sample (graphics), law.invention, Optics, law, Computer vision, Near-field scanning optical microscope, Artificial intelligence, Scanning tunneling microscope, business, Refractive index
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::13c44ae47c7c79b6e67d5255a904cbecTest
https://doi.org/10.1117/12.481728Test -
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المؤلفون: Xiaoqiu Wang, Jingzhi Wang, Guoshu Jian, Shi Pan, Shifa Wu
المصدر: SPIE Proceedings.
مصطلحات موضوعية: Physics, Photon, business.industry, Near-field optics, Finite-difference time-domain method, Physics::Optics, law.invention, Moment (mathematics), Optics, Fdtd algorithm, Incident wave, law, Perturbation theory (quantum mechanics), Scanning tunneling microscope, business
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::c5b063bad71105233124a56afad505bbTest
https://doi.org/10.1117/12.481727Test -
7
المؤلفون: Guoshu Jian, Jisong Wang, Shifa Wu, Shi Pan
المصدر: SPIE Proceedings.
مصطلحات موضوعية: Diffraction, Microscope, business.industry, Scanning electron microscope, Chemistry, Scattering, Waveguide (optics), law.invention, Optics, Optical microscope, law, Scanning tunneling microscope, business, Refractive index
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::a8ae86f14a64ad3e8cb0a1f854699d61Test
https://doi.org/10.1117/12.445731Test -
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المؤلفون: Shifa Wu, Guoshu Jian, Shi Pan
المصدر: SPIE Proceedings.
مصطلحات موضوعية: Physics, Diffraction, Microscope, Photon, Computer simulation, business.industry, Near and far field, law.invention, Optics, Optical microscope, law, Computer Science::Computer Vision and Pattern Recognition, Computer vision, Artificial intelligence, Scanning tunneling microscope, business, Refractive index
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::97c699edd0717932608920b2b9259378Test
https://doi.org/10.1117/12.326839Test