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1
المؤلفون: Jian Zhang, Shi Pan, Yinli Li, Peng Fei Li, Shifa Wu
المصدر: Optics Communications. 258:275-279
مصطلحات موضوعية: Scanning Hall probe microscope, Materials science, business.industry, Near and far field, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials, law.invention, Scanning probe microscopy, Optics, Reflection (mathematics), Signal-to-noise ratio, Sampling (signal processing), Optical microscope, law, Near-field scanning optical microscope, Electrical and Electronic Engineering, Physical and Theoretical Chemistry, business
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::ad29ca536e05ae8449feee6166d7a13aTest
https://doi.org/10.1016/j.optcom.2005.07.066Test -
2
المؤلفون: Sheau-shi Pan, Hsien-Chi Yeh, Wei-Tou Ni
المصدر: Control Engineering Practice. 13:559-566
مصطلحات موضوعية: Physics, Positioning system, business.industry, Applied Mathematics, Laser, Computer Science Applications, law.invention, Metrology, Scanning probe microscopy, Interferometry, Optics, Control and Systems Engineering, law, Control system, Digital control, Electrical and Electronic Engineering, Scanning tunneling microscope, business
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::f61edcf20d569cadea2cb4d439f0852aTest
https://doi.org/10.1016/j.conengprac.2004.04.019Test -
3
المؤلفون: Yi Zhang, Shi Pan, Anhong Ning, Wei Sun, Lingfeng Song
المصدر: SPIE Proceedings.
مصطلحات موضوعية: Scanning Hall probe microscope, Microscope, Chemistry, business.industry, Scanning electron microscope, Analytical chemistry, Scanning capacitance microscopy, law.invention, Scanning probe microscopy, Optics, law, Scanning ion-conductance microscopy, Electron microscope, Biological imaging, business
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::b05c84697c384795ed8c92ed6f833f59Test
https://doi.org/10.1117/12.570294Test -
4
المؤلفون: Guoshu Jian, Fei Bai, Shifa Wu, Shi Pan
المصدر: SPIE Proceedings.
مصطلحات موضوعية: Physics, Scanning Hall probe microscope, Optical fiber, Microscope, business.industry, Physics::Optics, Near and far field, Scanning capacitance microscopy, law.invention, Scanning probe microscopy, Optics, Optical microscope, law, Scanning tunneling microscope, business
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::e391d3e6fca29eb4743125fa5042806eTest
https://doi.org/10.1117/12.576464Test -
5
المؤلفون: Sheau-shi Pan, Gwo-Sheng Peng, Wei-Tou Ni, Hsien-Chi Yeh
المصدر: Proceedings of 20th Biennial Conference on Precision Electromagnetic Measurements.
مصطلحات موضوعية: Materials science, Silicon, Kilogram, business.industry, chemistry.chemical_element, Picometre, Motion control, Laser, Metrology, law.invention, symbols.namesake, Scanning probe microscopy, Optics, chemistry, law, Avogadro constant, symbols, business
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::160450c28aff0fe8a3256f96999da9a5Test
https://doi.org/10.1109/cpem.1996.547172Test