المؤلفون: Van den Broek, W., Reed, B.W., Béché, A., Verbeeck, J., Koch, C.T.

المصدر: Microscopy and Microanalysis ; volume 25, issue S2, page 1686-1687 ; ISSN 1431-9276 1435-8115

مصطلحات موضوعية: Instrumentation

الإتاحة: https://doi.org/10.1017/s1431927619009164Test
https://www.cambridge.org/core/services/aop-cambridge-core/content/view/S1431927619009164Test

المؤلفون: Hoyos, I.P. Lobato, Verbeeck, J., Van Aert, S.

المصدر: Microscopy and Microanalysis ; volume 23, issue S1, page 206-207 ; ISSN 1431-9276 1435-8115

مصطلحات موضوعية: Instrumentation

الإتاحة: https://doi.org/10.1017/s1431927617001714Test
https://www.cambridge.org/core/services/aop-cambridge-core/content/view/S1431927617001714Test

المؤلفون: Jannis, D., Velazco, A., Béché, A., Verbeeck, J.

المصدر: Ultramicroscopy ; volume 240, page 113568 ; ISSN 0304-3991

مصطلحات موضوعية: Instrumentation, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials

الإتاحة: https://doi.org/10.1016Test/j.ultramic.2022.113568
https://api.elsevier.com/content/article/PII:S0304399122000973?httpAccept=text/xmlTest
https://api.elsevier.com/content/article/PII:S0304399122000973?httpAccept=text/plainTest

المؤلفون: Velazco, A., Béché, A., Jannis, D., Verbeeck, J.

المصدر: Ultramicroscopy ; volume 232, page 113398 ; ISSN 0304-3991

مصطلحات موضوعية: Instrumentation, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials

الإتاحة: https://doi.org/10.1016Test/j.ultramic.2021.113398
https://api.elsevier.com/content/article/PII:S0304399121001777?httpAccept=text/xmlTest
https://api.elsevier.com/content/article/PII:S0304399121001777?httpAccept=text/plainTest

المؤلفون: Schattschneider, P., Löffler, S., Stöger-Pollach, M., Verbeeck, J.

المساهمون: the Austrian Science Fund, the European Research Council, ERC, COUNTATOMS, Integrated Infrastructure Initiative

المصدر: Ultramicroscopy ; volume 136, page 81-85 ; ISSN 0304-3991

مصطلحات موضوعية: Instrumentation, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials

الإتاحة: https://doi.org/10.1016Test/j.ultramic.2013.07.012
https://api.elsevier.com/content/article/PII:S0304399113001988?httpAccept=text/xmlTest
https://api.elsevier.com/content/article/PII:S0304399113001988?httpAccept=text/plainTest

المؤلفون: Prabhakara, V., Jannis, D., Guzzinati, G., Béché, A., Bender, H., Verbeeck, J.

المساهمون: Horizon 2020

المصدر: Ultramicroscopy ; volume 219, page 113099 ; ISSN 0304-3991

مصطلحات موضوعية: Instrumentation, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials

الإتاحة: https://doi.org/10.1016Test/j.ultramic.2020.113099
https://api.elsevier.com/content/article/PII:S0304399120302503?httpAccept=text/xmlTest
https://api.elsevier.com/content/article/PII:S0304399120302503?httpAccept=text/plainTest

المؤلفون: Fatermans, J., den Dekker, A.J., Müller-Caspary, K., Gauquelin, N., Verbeeck, J., Van Aert, S.

المساهمون: Research Foundation Flanders, European Research Council, European Union’s Horizon 2020 research and innovation programme, Flemish Government, Initiative and Network Fund of the Helmholtz Association, University of Antwerp

المصدر: Ultramicroscopy ; volume 219, page 113046 ; ISSN 0304-3991

مصطلحات موضوعية: Instrumentation, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials

الإتاحة: https://doi.org/10.1016Test/j.ultramic.2020.113046
https://api.elsevier.com/content/article/PII:S0304399119304048?httpAccept=text/xmlTest
https://api.elsevier.com/content/article/PII:S0304399119304048?httpAccept=text/plainTest

المؤلفون: Velazco, A., Nord, M., Béché, A., Verbeeck, J.

المساهمون: Flanders Research Fund, Horizon 2020

المصدر: Ultramicroscopy ; volume 215, page 113021 ; ISSN 0304-3991

مصطلحات موضوعية: Instrumentation, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials

الإتاحة: https://doi.org/10.1016Test/j.ultramic.2020.113021
https://api.elsevier.com/content/article/PII:S0304399120300334?httpAccept=text/xmlTest
https://api.elsevier.com/content/article/PII:S0304399120300334?httpAccept=text/plainTest

المؤلفون: Lubk, A., Guzzinati, G., Clark, L., Verbeeck, J.

المصدر: Microscopy and Microanalysis ; volume 19, issue S2, page 1378-1379 ; ISSN 1431-9276 1435-8115

مصطلحات موضوعية: Instrumentation

الإتاحة: https://doi.org/10.1017/s143192761300888xTest
https://www.cambridge.org/core/services/aop-cambridge-core/content/view/S143192761300888XTest

المؤلفون: Verbeeck, J., Beche, A., Clark, L., Guzzinati, G., Juchtmans, R., Lubk, A., Tian, H., Van Boxem, R., Van Tendeloo, G.

المصدر: Microscopy and Microanalysis ; volume 19, issue S2, page 1164-1165 ; ISSN 1431-9276 1435-8115

مصطلحات موضوعية: Instrumentation

الإتاحة: https://doi.org/10.1017/s1431927613007812Test
https://www.cambridge.org/core/services/aop-cambridge-core/content/view/S1431927613007812Test