المؤلفون: de Voogd, J.M., van Spronsen, M.A., Kalff, F.E., Bryant, B., Ostojić, O., den Haan, A.M.J., Groot, I.M.N., Oosterkamp, T.H., Otte, A.F., Rost, M.J.

المصدر: Ultramicroscopy ; volume 181, page 61-69 ; ISSN 0304-3991

مصطلحات موضوعية: Instrumentation, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials

الإتاحة: https://doi.org/10.1016/j.ultramic.2017.05.009Test
https://api.elsevier.com/content/article/PII:S0304399117300554?httpAccept=text/xmlTest
https://api.elsevier.com/content/article/PII:S0304399117300554?httpAccept=text/plainTest

المؤلفون: van Es, M.H., Tang, J., Preiner, J., Hinterdorfer, P., Oosterkamp, T.H.

المساهمون: EU-STREP, European Fund for Regional Development, Foundation for Fundamental Research on Matter (FOM), Netherlands Organisation for Scientific Research (NWO)

المصدر: Ultramicroscopy ; volume 140, page 32-36 ; ISSN 0304-3991

مصطلحات موضوعية: Instrumentation, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials

الإتاحة: https://doi.org/10.1016/j.ultramic.2014.02.005Test
https://api.elsevier.com/content/article/PII:S0304399114000436?httpAccept=text/xmlTest
https://api.elsevier.com/content/article/PII:S0304399114000436?httpAccept=text/plainTest

المؤلفون: den Haan, A. M. J., Wijts, G. H. C. J., Galli, F., Usenko, O., van Baarle, G. J. C., van der Zalm, D. J., Oosterkamp, T. H.

المصدر: Review of Scientific Instruments ; volume 85, issue 3 ; ISSN 0034-6748 1089-7623

مصطلحات موضوعية: Instrumentation

الإتاحة: https://doi.org/10.1063/1.4868684Test

المؤلفون: B. Bryant, Floris Kalff, A. M. J. den Haan, M.A. van Spronsen, J. M. de Voogd, A. F. Otte, Tjerk H. Oosterkamp, Irene M. N. Groot, O. Ostojic, M. J. Rost

المصدر: Ultramicroscopy
Ultramicroscopy, 181, 61-69. Elsevier
Ultramicroscopy, 181, 61-69
Ultramicroscopy, 181
Ultramicroscopy, 181, pp. 61-69

مصطلحات موضوعية: Coarse approach, Scanning Hall probe microscope, Microscope, Computer science, Sample (material), Nanotechnology, Correlated Electron Systems / High Field Magnet Laboratory (HFML), 02 engineering and technology, 01 natural sciences, Capacitance, law.invention, Scanning probe microscopy, Optics, Optical microscope, law, 0103 physical sciences, 010306 general physics, GeneralLiterature_REFERENCE(e.g.,dictionaries,encyclopedias,glossaries), Instrumentation, Stepping motor, business.industry, 021001 nanoscience & nanotechnology, Atomic and Molecular Physics, and Optics, Scanning probe microscope, Electronic, Optical and Magnetic Materials, Scanning tunneling microscope, Nano-positioning, 0210 nano-technology, business, Focus (optics), Capacitance measurements

وصف الملف: application/pdf

الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c158eb8541836f5fd321fcb2c206e4b9Test
https://doi.org/10.1016/j.ultramic.2017.05.009Test

المؤلفون: F. M. Buters, Dirk Bouwmeester, Harmen van der Meer, Gert Koning, Kier Heeck, Martin de Wit, H. J. Eerkens, Gesa Welker, Tjerk H. Oosterkamp

المصدر: Review of Scientific Instruments, 90, 015112

مصطلحات موضوعية: 010302 applied physics, Cryostat, Physics - Instrumentation and Detectors, Cantilever, Materials science, Condensed Matter - Mesoscale and Nanoscale Physics, business.industry, Bandwidth (signal processing), FOS: Physical sciences, Applied Physics (physics.app-ph), Instrumentation and Detectors (physics.ins-det), Physics - Applied Physics, 01 natural sciences, 010305 fluids & plasmas, Vibration, Resonator, Vibration isolation, Thermal conductivity, Mesoscale and Nanoscale Physics (cond-mat.mes-hall), 0103 physical sciences, Optoelectronics, Dilution refrigerator, business, Instrumentation

وصف الملف: application/pdf

الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::3fee096908ae83f42929a5928e1405fdTest
https://hdl.handle.net/1887/69913Test

المؤلفون: Verbiest, G. J., van der Zalm, D. J., Oosterkamp, T. H., Rost, M. J.

المساهمون: Performed under and financed by the NIMIC consortium under project 4.4, T.H. Oosterkamp acknowledges support from an ERC Starting Grant

المصدر: Review of Scientific Instruments ; volume 86, issue 3 ; ISSN 0034-6748 1089-7623

مصطلحات موضوعية: Instrumentation

الإتاحة: https://doi.org/10.1063/1.4915895Test

المؤلفون: Geert Wortel, E. C. M. Disseldorp, Tjerk H. Oosterkamp, M. B. S. Hesselberth, W. M. van Spengen, F. C. Tabak, Joost W. M. Frenken, Allard J. Katan

المصدر: Ultramicroscopy. 110:599-604

مصطلحات موضوعية: Scanning Hall probe microscope, Microscope, Materials science, business.industry, Scanning capacitance microscopy, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials, law.invention, Scanning probe microscopy, Optics, law, Scanning ion-conductance microscopy, Scanning tunneling microscope, Magnetic force microscope, business, Instrumentation, Vibrational analysis with scanning probe microscopy

الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::dc3bf3a35414dbb6e3050eb525aeae43Test
https://doi.org/10.1016/j.ultramic.2010.02.018Test

المؤلفون: Tjerk H. Oosterkamp, G. Wijts, D. J. van der Zalm, O. Usenko, G.J.C. van Baarle, F. Galli, A. M. J. den Haan

المصدر: Review of Scientific Instruments, 85, 035112

مصطلحات موضوعية: Vibration, Cryostat, Scanning probe microscopy, Vibration isolation, Materials science, business.industry, Magnetic resonance force microscopy, Optoelectronics, Tube (fluid conveyance), Graphite, Dilution refrigerator, business, Instrumentation

وصف الملف: application/pdf

الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::249a26f26e0af87257840b64580cb268Test
https://arxiv.org/abs/1312.6011Test

المؤلفون: Verbiest, G.J., Oosterkamp, T.H., Rost, M.J.

المساهمون: NIMIC, ERC

المصدر: Ultramicroscopy ; volume 135, page 113-120 ; ISSN 0304-3991

مصطلحات موضوعية: Instrumentation, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials

الإتاحة: https://doi.org/10.1016/j.ultramic.2013.07.008Test
https://api.elsevier.com/content/article/PII:S0304399113001940?httpAccept=text/xmlTest
https://api.elsevier.com/content/article/PII:S0304399113001940?httpAccept=text/plainTest

المؤلفون: Tjerk H. Oosterkamp, G.J. Verbiest, M. J. Rost

المصدر: Ultramicroscopy. 135

مصطلحات موضوعية: Physics, Heterodyne, Cantilever, business.industry, Phase (waves), Atomic force acoustic microscopy, Acoustic microscopy, Signal, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials, Optics, Amplitude, business, Instrumentation, Non-contact atomic force microscopy

الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f9e68a49ab21fefa978000de43f244baTest
https://pubmed.ncbi.nlm.nih.gov/23995285Test