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المؤلفون: B. Bryant, Floris Kalff, A. M. J. den Haan, M.A. van Spronsen, J. M. de Voogd, A. F. Otte, Tjerk H. Oosterkamp, Irene M. N. Groot, O. Ostojic, M. J. Rost
المصدر: Ultramicroscopy
Ultramicroscopy, 181, 61-69. Elsevier
Ultramicroscopy, 181, 61-69
Ultramicroscopy, 181
Ultramicroscopy, 181, pp. 61-69مصطلحات موضوعية: Coarse approach, Scanning Hall probe microscope, Microscope, Computer science, Sample (material), Nanotechnology, Correlated Electron Systems / High Field Magnet Laboratory (HFML), 02 engineering and technology, 01 natural sciences, Capacitance, law.invention, Scanning probe microscopy, Optics, Optical microscope, law, 0103 physical sciences, 010306 general physics, GeneralLiterature_REFERENCE(e.g.,dictionaries,encyclopedias,glossaries), Instrumentation, Stepping motor, business.industry, 021001 nanoscience & nanotechnology, Atomic and Molecular Physics, and Optics, Scanning probe microscope, Electronic, Optical and Magnetic Materials, Scanning tunneling microscope, Nano-positioning, 0210 nano-technology, business, Focus (optics), Capacitance measurements
وصف الملف: application/pdf
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c158eb8541836f5fd321fcb2c206e4b9Test
https://doi.org/10.1016/j.ultramic.2017.05.009Test -
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المؤلفون: Geert Wortel, E. C. M. Disseldorp, Tjerk H. Oosterkamp, M. B. S. Hesselberth, W. M. van Spengen, F. C. Tabak, Joost W. M. Frenken, Allard J. Katan
المصدر: Ultramicroscopy. 110:599-604
مصطلحات موضوعية: Scanning Hall probe microscope, Microscope, Materials science, business.industry, Scanning capacitance microscopy, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials, law.invention, Scanning probe microscopy, Optics, law, Scanning ion-conductance microscopy, Scanning tunneling microscope, Magnetic force microscope, business, Instrumentation, Vibrational analysis with scanning probe microscopy
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::dc3bf3a35414dbb6e3050eb525aeae43Test
https://doi.org/10.1016/j.ultramic.2010.02.018Test -
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المؤلفون: Disseldorp, E.C.M., Tabak, F.C., Wortel, G.H., Katan, A.J., Hesselberth, M.B.S., Oosterkamp, T.H., Frenken, J.W.M., Spengen, W.M. van
المصدر: Review of Scientific Instruments, 81(4), 043702
Review of Scientific Instrumentsمصطلحات موضوعية: Scanning Hall probe microscope, Atomic de Broglie microscope, Materials science, Time Factors, business.industry, Finite Element Analysis, Atomic force acoustic microscopy, Scanning capacitance microscopy, Equipment Design, Micro-Electrical-Mechanical Systems, Microscopy, Scanning Probe, Microscopy, Atomic Force, Feedback, Scanning probe microscopy, Motion, Optics, Scanning voltage microscopy, Microscopy, Scanning Tunneling, Microscopy, Microscopy, Electron, Scanning, Computer Simulation, business, Instrumentation, Non-contact atomic force microscopy
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::1f1275ca03c1a84ca6efa495c9abaf3dTest
https://pubmed.ncbi.nlm.nih.gov/21133506Test