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المؤلفون: Disseldorp, E.C.M., Tabak, F.C., Wortel, G.H., Katan, A.J., Hesselberth, M.B.S., Oosterkamp, T.H., Frenken, J.W.M., Spengen, W.M. van
المصدر: Review of Scientific Instruments, 81(4), 043702
Review of Scientific Instrumentsمصطلحات موضوعية: Scanning Hall probe microscope, Atomic de Broglie microscope, Materials science, Time Factors, business.industry, Finite Element Analysis, Atomic force acoustic microscopy, Scanning capacitance microscopy, Equipment Design, Micro-Electrical-Mechanical Systems, Microscopy, Scanning Probe, Microscopy, Atomic Force, Feedback, Scanning probe microscopy, Motion, Optics, Scanning voltage microscopy, Microscopy, Scanning Tunneling, Microscopy, Microscopy, Electron, Scanning, Computer Simulation, business, Instrumentation, Non-contact atomic force microscopy
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::1f1275ca03c1a84ca6efa495c9abaf3dTest
https://pubmed.ncbi.nlm.nih.gov/21133506Test -
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المؤلفون: G.J. Verbiest, D. J. van der Zalm, Tjerk H. Oosterkamp, M. J. Rost
المصدر: Review of Scientific Instruments
Review of Scientific Instruments, 86, 033704مصطلحات موضوعية: Cantilever, Materials science, Microscope, business.industry, Resonance, Nanotechnology, Piezoelectricity, law.invention, law, Microscopy, Optoelectronics, Nanometre, Ultrasonic sensor, business, Instrumentation, Excitation
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c43dd4ad65804f7d9b1ac4e97e0e9d3fTest
https://doi.org/10.1063/1.4915895Test