المؤلفون: Gomony, Manil Dev, De Putter, Floran, Gebregiorgis, Anteneh, Paulin, Gianna, Mei, Linyan, Jain, Vikram, Hamdioui, Said, Sanchez, Victor, Grosser, Tobias, Geilen, Marc, Verhelst, Marian, Zenke, Friedemann, Gurkaynak, Frank, De Bruin, Barry, Stuijk, Sander, Davidson, Simon, De, Sayandip, Ghogho, Mounir, Jimborean, Alexandra, Eissa, Sherif, Benini, Luca, Soudris, Dimitrios, Bishnoi, Rajendra, Ainsworth, Sam, Corradi, Federico, Karrakchou, Ouassim, Güneysu, Tim, Corporaal, Henk

المساهمون: Gomony, Manil Dev, De Putter, Floran, Gebregiorgis, Anteneh, Paulin, Gianna, Mei, Linyan, Jain, Vikram, Hamdioui, Said, Sanchez, Victor, Grosser, Tobia, Geilen, Marc, Verhelst, Marian, Zenke, Friedemann, Gurkaynak, Frank, De Bruin, Barry, Stuijk, Sander, Davidson, Simon, De, Sayandip, Ghogho, Mounir, Jimborean, Alexandra, Eissa, Sherif, Benini, Luca, Soudris, Dimitrio, Bishnoi, Rajendra, Ainsworth, Sam, Corradi, Federico, Karrakchou, Ouassim, Güneysu, Tim, Corporaal, Henk

مصطلحات موضوعية: Technological innovation, Program processors, Scalability, Time to market, Throughput, Hardware, Energy efficiency

وصف الملف: ELETTRONICO

العلاقة: ispartofbook:2023 Design, Automation & Test in Europe Conference & Exhibition (DATE); 2023 Design, Automation & Test in Europe Conference & Exhibition (DATE); firstpage:1; lastpage:6; numberofpages:6; https://hdl.handle.net/11585/957119Test

الإتاحة: https://doi.org/10.23919/DATE56975.2023.10136926Test
https://hdl.handle.net/11585/957119Test

المؤلفون: Gomony, Manil Dev, de Putter, Floran, Gebregiorgis, Anteneh, Paulin, Gianna, Mei, Linyan, Jain, Vikram, Hamdioui, Said, Sanchez, Victor, Grosser, Tobias, Geilen, Marc, Verhelst, Marian, Zenke, Friedemann, Gurkaynak, Frank, de Bruin, Barry, Stuijk, Sander, Davidson, Simon, De, Sayandip, Ghogho, Mounir, Jimborean, Alexandra, Eissa, Sherif, Benini, Luca, Soudris, Dimitrios, Bishnoi, Rajendra, Ainsworth, Sam, Corradi, Federico, Karrakchou, Ouassim, Güneysu, Tim, Corporaal, Henk

المساهمون: Electronic Systems, Center for Wireless Technology Eindhoven, Cyber-Physical Systems Center Eindhoven, Model-Based Design Lab, CompSOC Lab- Predictable & Composable Embedded Systems, EAISI Foundational, EAISI Health, EAISI High Tech Systems, Center for Care & Cure Technology Eindhoven, Efficient Stream Processing Lab, EAISI, Neuromorphic Edge Computing Systems Lab

المصدر: 2023 Design, Automation & Test in Europe Conference & Exhibition (DATE), 1-6
STARTPAGE=1;ENDPAGE=6;TITLE=2023 Design, Automation & Test in Europe Conference & Exhibition (DATE)

مصطلحات موضوعية: Hardware, Energy efficiency, Scalability, SDG 7 - Affordable and Clean Energy, Technological innovation, Program processors, Time to market, Throughput

الوصول الحر: https://explore.openaire.eu/search/publication?articleId=narcis______::505ce8e07a823d26fc13359854c0e2fcTest
https://research.tue.nl/nl/publications/a4857e5a-95ba-4411-9395-d10a2c22962aTest

المؤلفون: Yu, Jintao, Nane, Razvan, Ashraf, Imran, Taouil, Mottaqiallah, Hamdioui, Said, Corporaal, Henk, Bertels, Koen

المصدر: Yu , J , Nane , R , Ashraf , I , Taouil , M , Hamdioui , S , Corporaal , H & Bertels , K 2020 , ' Skeleton-based synthesis flow for computation-in-memory architectures ' , IEEE Transactions on Emerging Topics in Computing , vol. 8 , no. 2 , 8076720 , pp. 545-558 . https://doi.org/10.1109/TETC.2017.2760927Test

مصطلحات موضوعية: Adders, Algorithm design and analysis, algorithmic skeleton, Common Information Model (computing), Hardware, Memristor, Memristors, Routing, Skeleton, SystemC

العلاقة: https://research.tue.nl/en/publications/e142b6de-7401-41e0-a0a5-24dbdb9c8384Test

الإتاحة: https://doi.org/10.1109/TETC.2017.2760927Test
https://research.tue.nl/en/publications/e142b6de-7401-41e0-a0a5-24dbdb9c8384Test
http://www.scopus.com/inward/record.url?scp=85032450099&partnerID=8YFLogxKTest

المؤلفون: Aljuffri, Abdullah, Zwalua, Marc, Reinbrecht, Cezar Rodolfo Wedig, Hamdioui, Said, Taouil, Mottaqiallah

المصدر: IEEE Transactions on Very Large Scale Integration (VLSI) Systems; Nov2021, Vol. 29 Issue 11, p1930-1942, 13p

مصطلحات موضوعية: PUBLIC key cryptography, THERMAL noise, STATISTICAL correlation, THERMAL analysis, DEEP learning

المؤلفون: Cortez, Mafalda¹ mafalda.m.cortez@gmail.com, Roelofs, Gijs¹, Hamdioui, Said¹, Natale, Giorgio² DiNatale@lirmm.fr

المصدر: Journal of Electronic Testing. Oct2014, Vol. 30 Issue 5, p581-594. 14p.

مصطلحات موضوعية: *VERY large scale circuit integration, *ELECTROPHYSIOLOGY, *HARDWARE, *STANDARDIZATION, *COST control

المؤلفون: Aljuffri, Abdullah (author)

المساهمون: Taouil, Mottaqiallah (mentor), Hamdioui, Said (mentor), Ege, Baris (graduation committee), van Leuken, Rene (graduation committee), Delft University of Technology (degree granting institution)

مصطلحات موضوعية: Hardware, Security, Deep Learning, Side Channel

العلاقة: http://resolver.tudelft.nl/uuid:c0dddd21-bdc1-4641-bd5d-4abdbd7fe35fTest

الإتاحة: http://resolver.tudelft.nl/uuid:c0dddd21-bdc1-4641-bd5d-4abdbd7fe35fTest